Product Introduction
The NI PXIe-4143 is a 4-channel precision PXI Express Source Measure Unit (SMU) designed for semiconductor characterization, high-pin-count device testing, RF integrated circuit power and measurement, electronic component validation, and automated production test.
The PXIe-4143 integrates four independently programmable SMU channels into a compact PXI Express module. Each channel provides voltage and current sourcing together with precision voltage and current measurement, allowing multiple DUT terminals or multiple devices to be tested within a single modular instrument.
Each channel provides voltage capability up to ±24 V, current capability up to ±150 mA, and maximum source or sink power up to 3.6 W. The module also provides 10 pA current sensitivity, four-quadrant operation, remote four-wire sensing, high-speed sequencing, and SourceAdapt technology.
Product Overview
The National Instruments PXIe-4143 belongs to the NI PXIe-414x family of high-channel-count precision Source Measure Units.
Its combination of four channels and ±24 V voltage capability makes it particularly useful for applications requiring several independent precision DC bias and measurement channels without occupying multiple PXI slots.
Typical applications include:
- Semiconductor characterization
- High-pin-count device testing
- Integrated circuit validation
- RF IC power and measurement
- MEMS device testing
- I-V characterization
- Open and short testing
- Sensor characterization
- Electronic component testing
- Automated production test
Key Features
Four Independent SMU Channels
The PXIe-4143 provides four independently programmable Source Measure Unit channels.
Each channel can provide electrical stimulus while simultaneously measuring the DUT response.
A typical multi-terminal configuration may be:
Channel 0 → DUT Supply
Channel 1 → DUT Bias
Channel 2 → DUT Input
Channel 3 → DUT Output or Auxiliary Bias
This multi-channel architecture reduces the number of individual instruments required for complex device characterization.
±24 V Voltage Capability
Each PXIe-4143 SMU channel provides bipolar voltage capability up to approximately ±24 V.
The relatively wide bipolar voltage range makes the PXIe-4143 suitable for devices requiring positive and negative bias conditions.
Typical applications include:
- Semiconductor devices
- Analog integrated circuits
- MEMS devices
- Sensors
- Diodes
- Transistors
- Electronic components
±150 mA Current Capability
Each PXIe-4143 channel provides current capability up to approximately ±150 mA.
This makes the module suitable for precision low-to-moderate-power semiconductor and electronic component applications.
For applications requiring substantially higher current per channel, another PXI SMU such as the PXIe-4147 may be more appropriate.
3.6 W Per Channel
The PXIe-4143 provides up to approximately 3.6 W maximum source or sink power per channel within its specified operating envelope.
Voltage, current, and power requirements should always be evaluated together when selecting an SMU.
The required DUT operating point should be verified against the PXIe-4143 I-V operating boundaries before configuring the test system.
10 pA Current Sensitivity
The PXIe-4143 provides current sensitivity down to approximately 10 pA.
This capability is useful for precision characterization applications involving relatively small DUT currents.
Typical measurements can include:
- Device leakage
- Standby current
- Bias current
- Sensor current
- Low-power device characterization
- Semiconductor parametric measurements
Four-Quadrant Operation
The PXIe-4143 supports four-quadrant operation, allowing each channel to source or sink power under positive and negative voltage and current conditions within its specified operating range.
| Quadrant | Voltage | Current | Operation |
|---|---|---|---|
| I | Positive | Positive | Source Power |
| II | Positive | Negative | Sink Power |
| III | Negative | Negative | Source Power |
| IV | Negative | Positive | Sink Power |
Four-quadrant operation provides greater flexibility than a conventional unidirectional programmable power supply.
Precision Voltage Sourcing
Each PXIe-4143 channel can operate as a programmable precision voltage source while simultaneously measuring DUT current.
A typical configuration is:
Program Voltage → Apply to DUT → Measure Current
This operating mode is commonly used for semiconductor I-V characterization.
Precision Current Sourcing
The PXIe-4143 can also operate as a programmable current source while measuring DUT voltage.
A typical configuration is:
Program Current → Apply to DUT → Measure Voltage
This mode can be useful for diode, sensor, resistive device, and electronic component characterization.
Remote Four-Wire Sensing
Each PXIe-4143 channel includes integrated remote four-wire sensing.
Four-wire sensing separates the force and sense connections, helping reduce measurement errors caused by cable, connector, fixture, and interconnect resistance.
A simplified connection is:
Force HI / Force LO → Source Voltage or Current
Sense HI / Sense LO → Measure Voltage at DUT
This capability is especially useful when precise voltage control at the DUT terminals is required.
SourceAdapt Technology
The PXIe-4143 supports NI SourceAdapt technology, which allows the transient response of the SMU to be optimized for different DUT load characteristics.
Different devices may present capacitive, inductive, or dynamically changing loads.
SourceAdapt can help optimize:
- Source stability
- Settling time
- Transient behavior
- Measurement speed
- Test repeatability
600 kS/s Maximum Sampling Rate
The PXIe-4143 provides a maximum sampling rate of approximately 600 kS/s.
The high sampling rate allows the module to capture electrical behavior that may be difficult to observe with slower conventional source-measure instruments.
This can be useful for:
- Transient current measurements
- Startup characterization
- Power-state transitions
- Dynamic DUT behavior
- High-speed automated measurements
100 kS/s Maximum Update Rate
The PXIe-4143 provides a maximum source update rate of approximately 100 kS/s.
Fast source updates allow programmed voltage or current levels to be changed rapidly during automated sweeps and test sequences.
High-Speed Sequencing
The PXIe-4143 includes a high-speed sequencing engine for automated source-measure operations.
Test sequences can contain multiple source levels, compliance conditions, measurement settings, and timing parameters.
This hardware-oriented architecture can improve test throughput by reducing software interaction between individual measurement points.
Hardware Timing and Triggering
The PXIe-4143 supports hardware-timed operation and PXI triggering.
This allows multiple PXI instruments to coordinate their stimulus and measurement operations.
For example:
PXIe-4143 → Apply DUT Bias
PXI Digital Instrument → Configure DUT
PXI RF Instrument → Apply RF Signal
PXIe-4143 → Measure DUT Current
Technical Specifications
| Parameter | Specification |
|---|---|
| Product Type | Precision PXI Source Measure Unit |
| Model | NI PXIe-4143 |
| Part Number | 782431-01 |
| Platform | PXI Express |
| Number of SMU Channels | 4 |
| Voltage Range | ±24 V |
| Maximum Current | ±150 mA |
| Maximum Power | 3.6 W Per Channel |
| Current Sensitivity | 10 pA |
| Maximum Sampling Rate | 600 kS/s |
| Maximum Update Rate | 100 kS/s |
| Operation | 4-Quadrant |
| Remote Sense | Integrated 4-Wire Sense Per Channel |
| SourceAdapt | Supported |
| Hardware Timing | Supported |
| Voltage Source | Supported |
| Current Source | Supported |
| Voltage Measurement | Supported |
| Current Measurement | Supported |
| Source and Sink | Supported |
| Module Format | 3U, 1-Slot PXI Express |
| Front Panel Connector | 25-Position D-SUB |
| Recommended Calibration Interval | 1 Year |
| Primary Applications | Semiconductor Characterization, I-V Measurement, RF IC Power and Automated Parametric Test |
What Is a PXI Source Measure Unit?
A PXI Source Measure Unit combines programmable electrical sourcing with precision voltage and current measurement in a modular PXI instrument.
An SMU can perform several functions:
- Programmable voltage source
- Programmable current source
- Precision voltmeter
- Precision ammeter
- Electronic load
This integrated architecture makes SMUs particularly useful for semiconductor characterization and automated parametric test.
PXIe-4143 for Semiconductor Characterization
Semiconductor characterization is one of the primary applications for the PXIe-4143.
The combination of four channels, bipolar voltage sourcing, precision current measurement, fast sampling, and hardware synchronization makes the module suitable for testing devices with multiple electrical terminals.
Typical DUTs can include:
- Integrated circuits
- Analog ICs
- Diodes
- Transistors
- MOSFETs
- MEMS devices
- Sensors
- RF integrated circuits
I-V Characterization
The PXIe-4143 can perform automated current-voltage characterization by applying a programmed electrical stimulus and measuring the corresponding DUT response.
A voltage sweep can be represented as:
V1 → Measure I1
V2 → Measure I2
V3 → Measure I3
V4 → Measure I4
… → Generate I-V Curve
This process can be automated across multiple SMU channels.
Voltage Sweep Measurements
When operating as a voltage source, the PXIe-4143 can automatically step through a programmed sequence of voltage levels while measuring current.
A typical test procedure includes:
- Configure the voltage range.
- Configure current compliance.
- Apply the first voltage level.
- Measure DUT current.
- Change the source voltage.
- Repeat the measurement.
- Continue through the required sweep.
- Analyze the resulting I-V data.
Current Sweep Measurements
The PXIe-4143 can also source a programmed sequence of current levels while measuring DUT voltage.
A simplified sequence is:
I1 → Measure V1
I2 → Measure V2
I3 → Measure V3
I4 → Measure V4
This mode can be useful for diodes, sensors, resistive devices, and other electronic components.
High-Pin-Count Device Testing
The four-channel architecture makes the PXIe-4143 particularly suitable for high-pin-count devices requiring multiple programmable DC connections.
Multiple PXIe-4143 modules can also be installed in a PXI chassis when additional source-measure channels are required.
This allows engineers to build scalable semiconductor test systems with many independently programmable DC channels.
MEMS Device Testing
The PXIe-4143 is suitable for precision MEMS device characterization where several DC stimulus and measurement channels may be required.
Typical applications can include:
- Device biasing
- Leakage measurements
- I-V characterization
- Open and short testing
- Multi-terminal electrical characterization
RF Integrated Circuit Testing
RF integrated circuits often require multiple programmable DC supply and bias connections while RF stimulus and measurement are performed by separate instrumentation.
A typical architecture can include:
PXIe-4143 → DUT DC Bias and Current Measurement
PXI RF Instrument → RF Generation and Analysis
PXI Digital Instrument → DUT Control
This configuration allows engineers to correlate DC power consumption with RF performance.
Powering RF Integrated Circuits
The PXIe-414x family is well suited for applications such as powering RF integrated circuits.
The PXIe-4143 can provide several independently programmable supply or bias channels while simultaneously measuring the current consumed by the RF device.
Typical devices may include:
- RF transceivers
- Low-noise amplifiers
- RF switches
- Wireless ICs
- RF front-end components
Open and Short Testing
The PXIe-4143 can be used in automated open and short test applications where programmable source-measure channels verify electrical connectivity.
Typical applications include:
- Semiconductor pin testing
- PCB connectivity verification
- Device interface validation
- Production test
- Fixture verification
Leakage Current Measurements
With current sensitivity down to approximately 10 pA, the PXIe-4143 can be used for compatible low-current and leakage measurements.
Typical applications can include:
- Semiconductor leakage characterization
- Reverse-biased device measurements
- Standby current testing
- Sensor current measurements
- Low-power electronic device validation
Actual achievable measurement performance depends on range selection, cabling, fixtures, environmental conditions, settling time, and DUT characteristics.
Transient Device Characterization
The PXIe-4143 provides a maximum sampling rate of approximately 600 kS/s, allowing it to capture relatively fast changes in DUT electrical behavior.
This capability can be useful for analyzing:
- Startup current
- Shutdown behavior
- Power-state transitions
- Dynamic bias conditions
- Transient device response
PXIe-4143 vs PXIe-4147
The PXIe-4143 and PXIe-4147 are both four-channel PXI Source Measure Units, but their electrical capabilities target different applications.
| Feature | PXIe-4143 | PXIe-4147 |
|---|---|---|
| SMU Channels | 4 | 4 |
| Maximum Voltage | ±24 V | ±8 V |
| Maximum Current | ±150 mA | ±3 A |
| Primary Strength | Higher Voltage Range | Higher Current Capability |
| Typical Application | Precision Semiconductor Characterization | High-Current Semiconductor and RF Test |
PXIe-4143 vs PXIe-4162
The PXIe-4143 and PXIe-4162 target different channel-density and electrical-range requirements.
| Feature | PXIe-4143 | PXIe-4162 |
|---|---|---|
| SMU Channels | 4 | 12 |
| PXIe-4143 Voltage Capability | ±24 V | Different Operating Architecture |
| Primary Advantage | Four-Channel Precision Source-Measure | High Channel Density |
| Typical Application | Precision Semiconductor Characterization | High-Density / Multi-Site Test |
PXIe-4143 vs Programmable Power Supply
| Feature | PXIe-4143 | Programmable Power Supply |
|---|---|---|
| Primary Function | Precision Source and Measurement | DUT Power |
| Voltage Source | Yes | Yes |
| Current Source | Yes | Model Dependent |
| Precision Current Measurement | Yes | Generally More Limited |
| 4-Quadrant Operation | Yes | Usually No |
| I-V Characterization | Primary Application | Not Primary Application |
| Typical Application | Parametric Test | General DUT Power |
PXIe-4143 with PXI Switching
PXI switching modules can route PXIe-4143 channels to multiple DUT terminals or devices.
A simplified architecture is:
PXIe-4143 → PXI Switch → Multiple DUT Test Points
For precision source-measure applications, switching hardware should be selected carefully according to:
- Maximum voltage
- Maximum current
- Leakage current
- Contact resistance
- Thermal EMF
- Isolation
- Switch topology
PXIe-4143 in a Complete PXI System
The PXIe-4143 can operate as the precision DC source-measure instrument within a complete PXI system.
A typical automated test platform may include:
- PXI Chassis
- PXI Controller
- PXIe-4143 Source Measure Unit
- PXI Modules
- PXI switching modules
- PXI digital pattern instruments
- PXI oscilloscopes and digitizers
- PXI RF instruments
- Additional PXI SMUs
This modular architecture allows DC parametric, digital, waveform, RF, and functional testing to be integrated into one automated platform.
Software and Driver Support
The PXIe-4143 is supported by the NI-DCPower instrument driver for software-controlled source and measurement applications.
Software can be used to configure:
- Source voltage
- Source current
- Voltage limits
- Current compliance
- Measurement ranges
- Source sequences
- Voltage sweeps
- Current sweeps
- Triggering
- Measurement timing
- SourceAdapt settings
PXI Chassis Integration
The PXIe-4143 uses a 3U, one-slot PXI Express module format, allowing multiple SMUs and other PXI instruments to be installed in a compatible chassis.
When configuring a system, verify:
- PXI Express slot compatibility
- Available chassis power
- Cooling capacity
- Number of required SMU channels
- Other installed instrumentation
- System synchronization requirements
SMU Selection Considerations
Before selecting the PXIe-4143, engineers should evaluate the complete DUT and measurement requirements.
Important considerations include:
- Required number of SMU channels
- Maximum source voltage
- Maximum source current
- Source and sink power requirements
- Minimum current measurement requirements
- Measurement accuracy
- Sampling rate
- Source update rate
- Transient response
- Remote sensing requirements
- Compliance requirements
- DUT connection architecture
- PXI chassis compatibility
Industries
- Semiconductor Test
- Electronic Manufacturing
- RF and Wireless Test
- Automated Test Equipment
- MEMS Development
- Sensor Development
- Consumer Electronics
- Automotive Electronics
- Aerospace and Defense
- Research and Development
Applications
Semiconductor Characterization
Four precision source-measure channels provide programmable DC bias and electrical measurement for compatible semiconductor devices.
I-V Characterization
The PXIe-4143 can perform automated voltage and current sweeps while measuring DUT response to generate I-V characteristics.
RF IC Power and Measurement
Multiple programmable SMU channels can supply RF integrated circuits while measuring their DC current consumption.
MEMS Testing
The combination of channel density, precision measurement, and programmable sourcing makes the PXIe-4143 suitable for compatible MEMS characterization.
Open and Short Testing
Programmable source-measure channels can verify electrical connectivity in semiconductor, PCB, and automated production test applications.
Leakage Current Measurement
The 10 pA current sensitivity supports compatible low-current semiconductor, sensor, and electronic component measurements.
Automated Production Test
Hardware timing, high-speed sequencing, and PXI synchronization make the PXIe-4143 suitable for repeatable automated test systems.
Recommended Related Products
| NI PXIe-4143 | 4-channel, ±24 V, ±150 mA precision PXI Source Measure Unit for semiconductor characterization and automated parametric test. |
| NI PXIe-4147 | 4-channel high-current PXI SMU for applications requiring substantially greater current per channel. |
| NI PXIe-4162 | 12-channel high-density PXI Source Measure Unit for applications requiring more independent source-measure channels. |
| NI PXIe-4151 | Single-channel precision PXI Source Measure Unit for applications requiring a different voltage, current, and power architecture. |
| NI PXI Modules | PXI and PXI Express modules for source measurement, semiconductor test, RF measurement, switching, data acquisition, and automated testing. |
Why Choose NI PXIe-4143?
- 4 independent precision SMU channels
- ±24 V voltage capability
- ±150 mA maximum current
- 3.6 W maximum power per channel
- 10 pA current sensitivity
- 600 kS/s maximum sampling rate
- 100 kS/s maximum update rate
- 4-quadrant operation
- Integrated remote four-wire sensing
- SourceAdapt technology
- Hardware timing and triggering
- High-speed sequencing
- Suitable for I-V characterization
- Suitable for semiconductor testing
- Compact one-slot PXI Express architecture
Frequently Asked Questions
What is the NI PXIe-4143?
The NI PXIe-4143 is a four-channel precision PXI Express Source Measure Unit designed for programmable voltage and current sourcing together with precision voltage and current measurement.
How many channels does the PXIe-4143 have?
The PXIe-4143 provides four independent SMU channels.
What is the voltage range of the PXIe-4143?
The PXIe-4143 provides bipolar voltage capability up to approximately ±24 V.
What is the maximum current of the PXIe-4143?
Each PXIe-4143 channel provides current capability up to approximately ±150 mA within the specified operating envelope.
What is the maximum power of the PXIe-4143?
The PXIe-4143 provides up to approximately 3.6 W per channel within its specified source and sink operating limits.
What is the current sensitivity of the PXIe-4143?
The PXIe-4143 provides current sensitivity down to approximately 10 pA.
What is the maximum sampling rate of the PXIe-4143?
The PXIe-4143 provides a maximum sampling rate of approximately 600 kS/s.
Does the PXIe-4143 support four-quadrant operation?
Yes. The PXIe-4143 supports four-quadrant source and sink operation within its specified electrical limits.
Does the PXIe-4143 support remote sensing?
Yes. Each channel includes integrated remote four-wire sensing for improved voltage accuracy at the DUT.
Does the PXIe-4143 support SourceAdapt?
Yes. SourceAdapt allows engineers to customize the transient response of the SMU for different DUT load characteristics.
Can the PXIe-4143 perform I-V characterization?
Yes. Programmable voltage/current sourcing and precision measurement make the PXIe-4143 suitable for automated I-V characterization.
Can the PXIe-4143 measure leakage current?
Yes, for compatible applications. Its 10 pA current sensitivity makes it suitable for a range of low-current measurements, although actual system performance also depends on cabling, fixtures, environmental conditions, range selection, and DUT characteristics.
Can the PXIe-4143 be used for semiconductor testing?
Yes. Semiconductor characterization, high-pin-count device testing, I-V measurement, open-short testing, and automated parametric testing are important applications for the PXIe-4143.
Can the PXIe-4143 be used for RF IC testing?
Yes. The PXIe-4143 can provide programmable DC power and bias while measuring current consumption in compatible RF integrated circuits.
What is the difference between PXIe-4143 and PXIe-4147?
Both are four-channel PXI SMUs. The PXIe-4143 provides a wider ±24 V voltage range with up to ±150 mA current, while the PXIe-4147 is optimized for substantially higher current with a lower voltage range. The appropriate model depends primarily on the DUT voltage and current requirements.
What is the difference between PXIe-4143 and PXIe-4162?
The PXIe-4143 provides four SMU channels and emphasizes precision source-measure capability across its ±24 V range, while the PXIe-4162 provides twelve channels for applications where higher channel density is a primary requirement.
What is the part number of the PXIe-4143?
The NI ordering part number for the PXIe-4143 is 782431-01.
What should I check before purchasing a PXIe-4143?
Before purchasing a PXIe-4143, verify the required voltage range, current range, source and sink power, number of SMU channels, current sensitivity, measurement accuracy, sampling speed, remote sensing requirements, DUT cabling, PXI Express chassis compatibility, software requirements, and ordering part number.
Conclusion
The NI PXIe-4143 4-Channel Precision PXI Source Measure Unit combines ±24 V voltage capability, ±150 mA current capability, 3.6 W per-channel power, 10 pA current sensitivity, 600 kS/s sampling, four-quadrant operation, remote four-wire sensing, high-speed sequencing, and SourceAdapt technology. Its combination of precision, channel density, and PXI integration makes it particularly suitable for semiconductor characterization, I-V measurements, RF IC power and measurement, MEMS testing, leakage measurements, open-short testing, and automated production test systems.
