NI PXIe-4139 Precision PXI Express SMU Module
The NI PXIe-4139 is a high-precision PXI Express Source Measure Unit (SMU) designed for semiconductor testing, electronic device characterization, power validation, and automated measurement applications. Developed by National Instruments, the PXIe-4139 combines precision voltage sourcing, current sourcing, voltage measurement, and current measurement capabilities in a compact PXI Express module.
The PXIe-4139 provides engineers with accurate and flexible SMU functionality for testing semiconductor devices, power components, sensors, and electronic circuits. With high-resolution measurements, low-noise performance, and advanced software support, it is suitable for demanding research and production test environments.
Supporting NI-DCPower drivers, LabVIEW integration, and PXI Express communication, the PXIe-4139 enables scalable automated test systems for precision electrical measurements.
Key Features of NI PXIe-4139
Precision Source Measure Unit Capability
The PXIe-4139 integrates source and measurement functions into a single PXI Express instrument.
- Voltage sourcing
- Current sourcing
- Voltage measurement
- Current measurement
- Precision electrical characterization
High-Accuracy Electrical Measurement
The PXIe-4139 provides accurate and repeatable measurements for sensitive electronic devices.
- Low-noise measurement
- High-resolution acquisition
- Stable DC measurement
- Device characterization capability
DC and Pulsed Testing Capability
The PXIe-4139 supports flexible testing modes for different semiconductor and electronic applications.
- DC source measurement
- Pulsed output testing
- Transient device testing
- Power characterization
PXI Express High-Speed Integration
The PXIe-4139 uses PXI Express architecture for fast communication and synchronization with other PXI instruments.
- High-speed PCI Express communication
- Synchronized multi-instrument testing
- Modular system integration
- Automated test deployment
NI Software Support
The PXIe-4139 integrates with NI software platforms for precision measurement development.
- NI-DCPower driver
- LabVIEW support
- NI TestStand integration
- Automated measurement programming
Applications of NI PXIe-4139
Semiconductor Device Testing
The PXIe-4139 provides precision electrical measurement capability for semiconductor characterization.
- IC testing
- Device characterization
- Wafer-level measurement
- Production semiconductor testing
Power Electronics Testing
The PXIe-4139 supports validation of power components and electronic circuits.
- Power device analysis
- DC power testing
- Component validation
- Electrical performance evaluation
Automated Test Equipment (ATE)
The PXIe-4139 can be integrated into automated test systems requiring precision source and measurement functions.
- Production testing
- Functional verification
- Electronic testing
- Research test platforms
Electronic Component Characterization
The PXIe-4139 enables engineers to analyze electrical characteristics of various electronic components.
- Sensor testing
- LED testing
- Battery research
- Material characterization
Software Support
The NI PXIe-4139 supports National Instruments software tools for SMU programming and automated test development.
- NI-DCPower
- LabVIEW
- NI TestStand
- Measurement Studio
Technical Specifications of PXIe-4139
| Feature | Description |
|---|---|
| Product Type | PXI Express Source Measure Unit (SMU) |
| Platform | PXI Express |
| Functions | Source Voltage, Source Current, Measure Voltage, Measure Current |
| Measurement Type | Precision DC and Pulsed Measurement |
| Software | NI-DCPower, LabVIEW |
| Applications | Semiconductor testing, power validation, device characterization |
Comparison with Similar PXI Express SMU Modules
| Model | Main Difference | Best Application |
|---|---|---|
|
NI PXIe-4139 | Precision PXI Express SMU module designed for accurate source and measurement applications. | Semiconductor and precision device testing |
|
NI PXIe-4141 | Multi-channel SMU module for scalable automated semiconductor testing. | Multi-device test systems |
|
NI PXIe-4143 | High-performance SMU optimized for precision electrical measurements. | Advanced semiconductor characterization |
|
NI PXIe-4154 | High-speed power supply and measurement module for dynamic testing. | Power electronics testing |
Recommended Related Products
The following products are commonly used with the PXIe-4139 to build complete semiconductor and automated test systems.
|
NI PXIe-4141 | Multi-channel PXI Express SMU module for semiconductor production testing. |
|
NI PXIe-4143 | Precision SMU module for advanced electronic device characterization. |
|
NI PXIe-4154 | PXI Express power supply and measurement module for power validation. |
|
NI PXIe-5162 | High-speed PXI Express digitizer for electronic signal analysis. |
|
NI PXIe-1085 | High-performance PXI Express chassis for modular semiconductor test systems. |
Why Choose NI PXIe-4139
- High-precision PXI Express SMU capability
- Accurate voltage and current sourcing
- Low-noise electrical measurement
- Supports NI-DCPower and LabVIEW
- Ideal for semiconductor and power testing
- Suitable for automated production test systems
Conclusion
The NI PXIe-4139 Precision PXI Express SMU Module provides a powerful and flexible solution for engineers requiring accurate source and measurement capabilities in automated test environments.
With precision electrical measurement, PXI Express performance, and NI software integration, the PXIe-4139 is an excellent choice for semiconductor testing, electronic characterization, power validation, and advanced research applications.
