The PXIe-4138 system source measure unit (SMU) delivers high power, precision, and speed and features 4-quadrant operation. It is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument. The PXIe-4138 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
Applications and Use Cases of PXIe-4138
The PXIe-4138 Precision System SMU is a PXI Express high-channel-density source measure unit (SMU) designed for precision voltage/current sourcing and measurement in scalable test systems. It delivers low noise, high accuracy, and parallel testing capability, making it ideal for semiconductor testing and high-throughput automated environments.
1. High-Density Parallel SMU Testing
PXIe-4138 enables multiple channels of SMU operation, allowing simultaneous testing of multiple DUTs to significantly increase throughput.
2. Semiconductor Parametric Testing
Widely used for IC, wafer, and component testing, including I-V curve measurement, leakage current analysis, and performance validation.
3. Automated Test Equipment (ATE)
Integrated into high-volume ATE systems for synchronized, multi-channel testing and fast production validation.
4. Low-Level Precision Measurement
Supports accurate measurement of very small currents and voltages, suitable for sensitive electronic components.
5. Multi-Rail Power Testing & Control
Provides coordinated control of multiple voltage rails for complex devices requiring precise power sequencing.
6. Research & Development Applications
Used in laboratories for circuit validation, device characterization, and precision measurement tasks.
7. Production & Quality Testing
Applied in manufacturing environments for repeatable, high-efficiency testing of electronic products.
