PXIe-4138

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$8,055.00

NI PXIe-4138, ±60 V, ±3 A DC, 20 W DC, 1 pA System PXI Source Measure Unit

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National Instruments PXIe-4138 ±60 V ±3 A 20 W Precision System SMU

PXIe-4138 ±60 V ±3 A 20 W Precision System SMU

Земля PXIe-4138 is a single-channel precision PXI Express system source measure unit designed for semiconductor characterization, board-level testing, production testing and automated power measurements. It combines programmable voltage and current sourcing with precision voltage and current measurement.

The PXIe-4138 supports four-quadrant operation, a ±60 V voltage range, a ±3 A DC current range and as much as 20 W of DC sourcing power. It can also sink up to 12 W, allowing the instrument to operate as both a programmable source and an electronic load within its specified operating boundaries.

With 1 pA current sensitivity, high-speed sampling, hardware-timed sequencing and DMA data streaming, the PXIe-4138 can perform both precision DC measurements and dynamic waveform acquisition.

Key Features of the PXIe-4138

  • Single-channel precision system SMU
  • ±60 V voltage source and measurement range
  • ±3 A DC current source and measurement range
  • 20 W maximum DC sourcing power
  • 12 W maximum DC sinking power
  • Four-quadrant source and sink operation
  • 1 pA current sensitivity
  • Four-wire remote sensing
  • High-speed voltage and current measurements
  • Hardware-timed sequence engine
  • DMA waveform and measurement streaming
  • Programmable voltage and current compliance
  • PXI trigger and synchronization support
  • NI-DCPower software support
  • Suitable for semiconductor and board-level testing

PXIe-4138 Technical Specifications

Product ModelPXIe-4138
Part Number782856-01
Product TypePXI Express system source measure unit
Number of SMU ChannelsOne
Operating QuadrantsFour-quadrant operation
Voltage Range−60 V to +60 V
DC Current Range−3 A to +3 A
Maximum DC Source Power20 W
Maximum DC Sink Power12 W
Current Sensitivity1 pA
Remote SenseFour-wire sensing
SequencingHardware-timed source and measure sequencing
Data TransferDMA waveform and measurement streaming
SourceAdaptNot supported
ЗапускPXI hardware trigger support
Шинный интерфейсPXI Express
Software DriverNI-DCPower
Supported PlatformPXI
Operating Temperature0°C to 55°C

PXIe-4138 Part Number and Software

ItemPart NumberОписание
PXIe-4138782856-01±60 V, ±3 A DC, 20 W precision PXI Express system SMU
LabVIEW Professional784584-35LabVIEW Professional Development System subscription license for Windows
InstrumentStudio Professional789987-35Interactive instrument configuration and automated measurement software

The PXIe-4138 requires compatible force and sense connections between the module and the device under test. Select the cable, connector assembly or custom fixture according to the maximum voltage, current, power and measurement sensitivity required by the application.

LabVIEW and InstrumentStudio are optional software products. The PXIe-4138 hardware is controlled through the NI-DCPower instrument driver.

What Is a System Source Measure Unit?

A source measure unit combines a programmable power source, precision voltage meter and precision current meter in one instrument. It can source voltage while measuring current or source current while measuring voltage.

A system SMU provides a wider operating range and higher power capability than many high-density SMUs. It is intended for applications that need precision low-current measurements and higher-current device operation from the same channel.

The PXIe-4138 can replace several conventional instruments in an automated test rack, reducing cabling and simplifying synchronization.

Single-Channel System SMU Architecture

The PXIe-4138 provides one high-performance SMU channel. Unlike a multichannel SMU optimized primarily for pin density, the PXIe-4138 focuses its voltage, current and power resources on a single DUT connection.

This architecture is suitable for testing devices requiring a wider voltage range, higher current or greater power than a high-density SMU channel can provide.

Multiple PXIe-4138 modules can be installed in one chassis when the test system requires several synchronized system SMU channels.

±60 V Voltage Range

The PXIe-4138 can source and measure voltage from −60 V to +60 V. This bipolar range supports forward-bias, reverse-bias and bidirectional device characterization.

Applications include testing power semiconductors, LEDs, optical devices, analog circuits, protection devices, integrated circuits and circuit-board power rails.

The maximum voltage cannot necessarily be combined with the maximum current because channel operation is limited by the 20 W source and 12 W sink power envelopes.

±3 A DC Current Range

The PXIe-4138 supports DC current from −3 A to +3 A. The channel can source current into a device or sink current returned by the device.

The ±3 A rating applies only within the specified current-voltage operating area. For example, a 3 A operating point is available only at a voltage that keeps the total output power within the applicable limit.

Use suitably rated cables, connectors and fixture contacts when operating near the maximum current. Contact resistance can generate voltage drop and heat.

20 W DC Source Power

The PXIe-4138 can source up to 20 W of DC power. This allows the instrument to power many integrated circuits, circuit boards, LEDs and discrete semiconductor devices directly.

Available current decreases as the programmed voltage increases because the product of voltage and current must remain within the supported operating envelope.

Consult the official quadrant diagrams when choosing voltage and current settings near the maximum power limit.

12 W DC Sink Power

The channel can absorb up to 12 W of DC power while operating as an electronic load. Sinking capability is useful for discharging devices, loading regulator outputs and testing circuits that return energy to the source.

The 12 W sinking limit is lower than the 20 W sourcing limit. Applications must therefore evaluate source and sink operating points separately.

When the DUT contains substantial stored energy, provide external protection and confirm that the total discharged energy remains safe for the SMU and fixture.

Four-Quadrant Operation

Four-quadrant operation allows the PXIe-4138 to source or sink current at positive or negative voltages. This gives the channel the functionality of a bipolar power source and electronic load.

QuadrantVoltageCurrentOperation
Quadrant IPositivePositiveSources power at positive voltage
Quadrant IIPositiveNegativeSinks current at positive voltage
Quadrant IIINegativeNegativeSources power at negative voltage
Quadrant IVNegativePositiveSinks current at negative voltage

This capability supports bipolar voltage sweeps, reverse-bias measurements, active discharge sequences and devices that both consume and return current.

1 pA Current Sensitivity

The PXIe-4138 provides current sensitivity down to 1 pA while supporting current as high as 3 A. This wide dynamic range enables the same instrument to perform leakage measurements and higher-current functional testing.

Achieving useful picoampere-level measurements requires proper cabling and fixture construction. Contamination, humidity, cable leakage and insufficient settling time can introduce errors much larger than the current being measured.

Use clean low-leakage connections, shielding and suitable measurement apertures for sensitive current tests.

Four-Wire Remote Sensing

Four-wire remote sensing uses separate force and sense connections. The force leads carry current, while the sense leads measure voltage directly at the DUT terminals.

This arrangement compensates for voltage drop in the cables, connectors, switching relays and fixture contacts. Remote sensing is particularly important when sourcing several amperes through a test fixture.

Connect the sense leads as close as practical to the device under test. Open, reversed or incorrectly routed sense connections can cause inaccurate or unstable output behavior.

Voltage and Current Compliance

When the PXIe-4138 operates as a voltage source, a programmable current limit protects the DUT from excessive current. When it operates as a current source, a voltage limit prevents the channel from exceeding the selected voltage boundary.

If the load attempts to exceed the programmed limit, the channel enters compliance and the requested source value may no longer be maintained.

Compliance status should be saved with the measurement result because a measurement taken in compliance may not represent the intended DUT operating point.

High-Speed Sampling

The PXIe-4138 supports high-speed voltage and current acquisition for capturing transient device behavior. It can measure startup current, pulsed loads, regulator settling and changes between device operating states.

Higher measurement speed normally requires a shorter aperture and may increase measurement noise. Precision DC measurements generally use a longer aperture and additional settling time.

Select the measurement timing according to whether the test prioritizes speed, noise performance or absolute accuracy.

DMA Measurement Streaming

The PXIe-4138 supports direct memory access transfers between the SMU and host computer. DMA allows large waveform and measurement records to be streamed with less software-command overhead.

This capability is useful for acquiring long current or voltage waveforms at high sample rates. The PXI controller, system memory and storage destination must be capable of processing the incoming data continuously.

Use appropriately sized software buffers and monitor overflow conditions during long-duration acquisitions.

Hardware-Timed Sequence Engine

The onboard sequence engine can execute a list of source configurations and measurements without requiring the host computer to issue a separate command for every point.

A sequence can contain voltage levels, current levels, compliance settings, source delays and measurement operations. Hardware timing improves repeatability and reduces the overhead of I-V sweeps and production tests.

The source delay should allow the DUT and SMU output to settle before each measurement is acquired.

Synchronization with Other SMUs

Hardware triggers allow several PXIe-4138 modules to start source or measurement operations according to a defined timing relationship. This supports devices that require multiple synchronized power rails or bias signals.

The module can also coordinate with PXI digitizers, switches, digital instruments and waveform generators. Use chassis trigger resources instead of relying only on software timing when repeatability is important.

SourceAdapt Compatibility

The PXIe-4138 does not provide SourceAdapt transient-response customization. Its source response uses the operating behavior defined by the module hardware and NI-DCPower configuration.

If an application specifically requires programmable transient-response shaping for unusual capacitive or inductive loads, consider a newer compatible SMU that includes SourceAdapt technology.

Fixture inductance, load capacitance, cable length and source delay should still be evaluated when connecting dynamic loads to the PXIe-4138.

I-V Characterization

The PXIe-4138 can sweep voltage while measuring current or sweep current while measuring voltage. The resulting data can be used to create an I-V curve for the device under test.

Its ±60 V range, ±3 A capability and 1 pA sensitivity support characterization across a wide operating range. Suitable devices include diodes, LEDs, transistors, sensors and power-management circuits.

Program an appropriate compliance limit before starting the sweep to protect the device from excessive voltage, current or power.

Power Semiconductor Testing

The PXIe-4138 can characterize lower-power transistors, diodes and protection devices within its 20 W source and 12 W sink envelopes. It can measure forward voltage, reverse leakage and current-voltage characteristics.

Higher-power semiconductors may require an external power amplifier, dedicated high-power SMU or pulsed-power instrument. The complete test must remain within the PXIe-4138 safe operating area.

Power-Management IC Testing

Power-management integrated circuits require accurate supply, load and leakage measurements. The PXIe-4138 can power a PMIC input, load an output or measure current consumption during different device modes.

Its fast acquisition and DMA streaming capabilities can capture startup current and changes between sleep, standby and active operation.

LED and Optical Device Testing

The PXIe-4138 can source current to an LED, laser diode or optical component while measuring forward voltage. It can also sweep voltage or current to characterize device efficiency and turn-on behavior.

Optical devices can be sensitive to overcurrent and temperature. Use conservative compliance limits and provide suitable thermal control during automated sweeps.

Board-Level Power Testing

The PXIe-4138 can provide programmable power to circuit-board rails while measuring current consumption. This helps detect short circuits, abnormal standby current and power-sequence problems.

Remote sensing compensates for voltage drop in fixture wiring, while hardware sequencing can reproduce power-up and power-down profiles.

Battery and Energy-Storage Testing

Four-quadrant operation allows the module to perform controlled source and sink steps for low-power batteries, cells and energy-storage devices within its voltage, current, power and energy limitations.

It can charge at a controlled current, discharge while measuring voltage and capture transient behavior. It is not a replacement for a high-energy battery cycler when the DUT exceeds the SMU operating envelope.

Semiconductor Production Testing

Hardware sequencing reduces communication overhead and helps improve throughput in semiconductor production applications. Several PXIe-4138 modules can be synchronized when multiple high-performance SMU channels are required.

Production systems should monitor contact resistance, fixture leakage, compliance status and calibration condition to maintain consistent measurements.

Typical PXIe-4138 Applications

  • Характеризация полупроводниковых приборов
  • Integrated-circuit testing
  • Power-management IC testing
  • RFIC power measurements
  • Board-level functional testing
  • I-V curve generation
  • Leakage-current measurement
  • LED and laser-diode testing
  • Optical transceiver validation
  • Battery charge and discharge testing
  • Power-rail characterization
  • Automated production testing
  • Reliability and life testing
  • Research laboratory automation

NI-DCPower Software Support

The PXIe-4138 is controlled through the NI-DCPower instrument driver. NI-DCPower provides functions for configuring source modes, ranges, compliance limits, measurements, triggers and hardware sequences.

The driver supports LabVIEW, LabWindows/CVI, C/C++, .NET and other compatible programming environments.

Install an NI-DCPower version that supports the controller operating system and the PXIe-4138 hardware revision.

InstrumentStudio Integration

InstrumentStudio provides an interactive interface for configuring the PXIe-4138, sourcing voltage or current and viewing measurement results without first developing a complete test program.

Engineers can use it to verify the DUT connection, select ranges and test compliance settings. The validated setup can then be reproduced in an automated NI-DCPower application.

LabVIEW Integration

LabVIEW can control PXIe-4138 source and measurement operations, execute hardware sequences and coordinate the SMU with other PXI instruments.

Applications can display current and voltage waveforms, generate I-V graphs, record measurement results and respond to compliance or error conditions.

PXI Express Chassis Integration

The PXIe-4138 installs in a compatible PXI Express chassis. It can operate alongside oscilloscopes, digital multimeters, switching modules, waveform generators and digital instruments.

Verify slot compatibility, chassis power and cooling before installation. High-power source and sink operation requires unobstructed airflow through the chassis.

PXIe-4138 Test-Fixture Design

Use conductors and fixture contacts rated for the maximum 3 A current. Force-lead resistance can create significant voltage drop and heat if the wiring is undersized.

Route the sense connections directly to the DUT terminals. Keep low-current measurement paths clean and separated from noisy digital, switching and high-current signals.

Switching relays must be rated for the maximum voltage, current and power used by the test sequence.

PXIe-4138 Troubleshooting

The PXIe-4138 is not detected

Confirm that the module is fully installed in a compatible PXI Express slot. Check chassis power, controller communication and NI-DCPower installation, then run a self-test in NI Measurement & Automation Explorer.

The output voltage is lower than programmed

Check whether the channel has entered current compliance or exceeded the applicable power boundary. Measure the load and verify the programmed current limit.

The output current is lower than expected

Check voltage compliance, the programmed current range and the 20 W source-power limit. Inspect the cable and fixture for excessive resistance.

The DUT voltage is inaccurate

Enable four-wire remote sensing and connect the sense leads close to the DUT. Check the force leads, connectors, relays and fixture contacts for voltage drop.

The current measurement is noisy

Select an appropriate current range, increase the measurement aperture and improve grounding and shielding. Check whether the DUT itself produces a changing current waveform.

Picoampere measurements are too high

Disconnect the DUT and measure fixture leakage. Clean the connectors and fixture surfaces, reduce humidity effects and allow adequate settling time after changing ranges or voltage levels.

The SMU enters compliance during a sweep

The DUT is requesting more current or voltage than the programmed limit permits. Review the expected I-V curve before increasing compliance to avoid damaging the DUT.

The module reports an overtemperature condition

Disable the output and allow the module to cool. Check chassis airflow, ambient temperature and the duration of high-power source or sink operation.

Streaming stops during a long acquisition

Review software-buffer sizes, controller memory, data-processing time and storage throughput. The receiving application must continuously consume data fast enough to prevent an overflow.

The load causes output oscillation

Reduce cable length, inspect fixture inductance and review DUT capacitance. Because the PXIe-4138 does not provide SourceAdapt, the fixture and source-delay configuration may need adjustment.

PXIe-4138 Comparison with Related PXI SMUs

МодельPrimary ConfigurationBest Suited For
PXIe-4138±60 V, ±3 A DC, 20 W source, 1 pA sensitivityHigh-power, high-speed system SMU applications
PXIe-4139Newer high-precision system SMU architectureApplications requiring improved low-current performance and SourceAdapt
PXIe-4136Single-channel system SMURelated semiconductor and board-level characterization
PXIe-4145Four channels, ±6 V, ±500 mAHigh-pin-count, low-voltage semiconductor testing
PXIe-4163High-density multichannel SMUApplications requiring a larger number of lower-power SMU channels

PXIe-4138 vs PXIe-4139

The PXIe-4138 and PXIe-4139 are single-channel system SMUs designed for wide-range semiconductor and electronic testing. The PXIe-4139 uses a newer architecture with enhanced low-current performance and SourceAdapt transient-response control.

Choose the PXIe-4138 when maintaining an existing validated system or when its ±60 V, ±3 A, 20 W and 1 pA capabilities satisfy the application. Consider the PXIe-4139 when lower-current performance or adjustable source response is required.

PXIe-4138 vs PXIe-4145

The PXIe-4138 provides one channel with a wider voltage range, higher current and greater power. The PXIe-4145 provides four lower-voltage SMU channels in one module.

Select the PXIe-4138 for higher-power device characterization. Select the PXIe-4145 when the DUT requires several synchronized low-voltage power or measurement pins.

PXIe-4138 vs High-Density SMUs

The PXIe-4138 focuses on wide voltage, high current and precision from one channel. High-density SMUs provide more channels but generally offer lower current and power per pin.

A semiconductor test system can combine a PXIe-4138 for the main supply rail with high-density SMU modules for lower-power bias, leakage and control pins.

Recommended Related Products

Selecting the Right PXI SMU

Choose the PXIe-4138 when an application requires one precision SMU channel with voltage up to ±60 V, current up to ±3 A, four-quadrant operation and 1 pA current sensitivity.

Before ordering, review the required voltage, current and source or sink power at every test point. Confirm that the complete operating profile remains within both the 20 W sourcing envelope and the 12 W sinking envelope.

Consider the PXIe-4139 when adjustable transient response or improved low-current capability is required. Choose a multichannel SMU when DUT pin count is more important than maximum capability per channel.

Why Choose the PXIe-4138?

  • Combines sourcing and measurement in one PXI module
  • Supports voltage from −60 V to +60 V
  • Supports DC current from −3 A to +3 A
  • Provides up to 20 W of sourcing power
  • Provides up to 12 W of sinking power
  • Supports four-quadrant operation
  • Provides 1 pA current sensitivity
  • Supports four-wire remote sensing
  • Provides hardware-timed sequencing
  • Supports DMA measurement streaming
  • Integrates with NI-DCPower, LabVIEW and InstrumentStudio

Frequently Asked Questions

What is the PXIe-4138?

The PXIe-4138 is a single-channel, four-quadrant PXI Express system SMU for sourcing and measuring voltage and current in automated electronic tests.

What is the PXIe-4138 part number?

The standard NI part number for the PXIe-4138 is 782856-01.

What is its voltage range?

The PXIe-4138 can source and measure voltage from −60 V to +60 V.

What is the maximum DC current?

The DC current range is −3 A to +3 A, subject to the applicable voltage and power operating envelope.

What is the maximum sourcing power?

The module can source as much as 20 W of DC power.

What is the maximum sinking power?

The module can absorb as much as 12 W of DC power within its specified four-quadrant operating area.

What is the current sensitivity?

The specified current sensitivity is 1 pA.

Does the PXIe-4138 support four-quadrant operation?

Yes. It can source or sink current at positive or negative voltage.

Does it support remote sensing?

Yes. Four-wire remote sensing compensates for voltage drop in the force cables and test fixture.

Does the PXIe-4138 include SourceAdapt?

No. The PXIe-4138 does not support SourceAdapt transient-response customization. Consider a compatible newer system SMU if this feature is required.

Can it stream waveform measurements?

Yes. The module supports DMA transfers for streaming large waveform and measurement records between the SMU and host computer.

Which driver controls the PXIe-4138?

The PXIe-4138 is controlled through the NI-DCPower instrument driver.

Can the PXIe-4138 function as an electronic load?

Yes. Its four-quadrant architecture allows it to sink current and absorb up to 12 W within the specified operating limits.

Request a Quote for the PXIe-4138

Contact us for current availability, lead time and project pricing for the PXIe-4138 ±60 V ±3 A 20 W Precision System SMU. We can also help identify compatible cables, test-fixture accessories, PXI Express chassis and related source measure units for your automated test system.

Part Number(s): 782856-01

Specifications

Current Sensitivity: 1 pA
Включает вспомогательную мощность: –
Количество каналов SMU: 1
Диапазон напряжения: от -60 В до 60 В
SourceAdapt: Нет
Max DC Sink Power: 12 W
Max DC Source Power: 20 W
Диапазон постоянного тока: от -3 А до 3 А
Диапазон импульсного тока: –
Шинный соединитель: PXI Express

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