PXIe-6124

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$8,395.00

PXIe-6124, 16-bit, 4 MS/s Simultaneous Sampling Multifunction DAQ

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National Instruments PXIe-6124 Simultaneous Sampling Multifunction DAQ Module for High-Speed PXI Express Systems

Product Introduction

The NI PXIe-6124 is a high-speed simultaneous-sampling multifunction data acquisition (DAQ) module designed for PXI Express automated test, dynamic signal acquisition, transient recording, and precision measurement applications. As part of the National Instruments S Series DAQ family, the PXIe-6124 provides dedicated analog-to-digital converters for each input channel, ensuring accurate phase alignment and time-correlated measurements.

Featuring four simultaneous analog input channels with sampling rates up to 4 MS/s per channel, 16-bit resolution, digital I/O, and advanced timing resources, the PXIe-6124 is ideal for high-speed waveform capture, power electronics testing, aerospace validation, and industrial automation.

Product Overview

The PXIe-6124 is engineered for engineers and researchers requiring simultaneous acquisition of multiple high-speed analog signals. Unlike multiplexed DAQ devices, every analog input channel includes its own ADC, eliminating channel-to-channel delay and providing highly accurate phase measurements.

Built on the PXI Express architecture, the PXIe-6124 offers high-bandwidth communication, deterministic synchronization, and seamless integration with other PXI instruments. Combined with NI-DAQmx and LabVIEW software, it enables rapid development of scalable automated test and measurement systems.

Key Features

High-Speed Simultaneous Analog Input

The PXIe-6124 provides dedicated simultaneous sampling for accurate multi-channel acquisition.

  • 4 simultaneous analog input channels
  • 16-bit resolution
  • Up to 4 MS/s per channel
  • Dedicated ADC per channel

Advantage: Eliminates channel skew while maintaining accurate timing relationships between multiple signals.

Excellent Signal Accuracy

Designed for precision waveform measurement and transient signal analysis.

  • High dynamic range
  • Low-noise analog front end
  • Excellent signal fidelity
  • Accurate phase measurements

Advantage: Produces reliable measurement results for demanding engineering and research applications.

Integrated Digital I/O and Timing

The PXIe-6124 includes digital control resources for synchronized measurement systems.

  • Programmable digital I/O
  • Hardware timing engine
  • Advanced triggering
  • Counter/timer support

Advantage: Supports synchronized acquisition, event triggering, and digital device control within a single module.

Advanced PXI Express Synchronization

Built for deterministic operation in modular PXI Express systems.

  • PXI trigger bus
  • Reference clock synchronization
  • Multi-device timing
  • Deterministic acquisition

Advantage: Enables accurate synchronization across multiple measurement instruments.

Optimized for Automated Test Systems

The PXIe-6124 integrates seamlessly into modular automated test platforms.

  • Compact PXI Express module
  • NI-DAQmx compatible
  • LabVIEW integration
  • Scalable architecture

Advantage: Reduces development time while improving system flexibility and maintainability.

Technical Specifications

ParameterDescription
Product TypePXI Express Simultaneous Sampling DAQ Module
DAQ FamilyNI S Series
Analog Input Channels4 Simultaneous Channels
Resolution16-bit
Maximum Sample Rate4 MS/s per Channel
Sampling MethodSimultaneous Sampling
Digital I/OProgrammable Digital I/O
Counter/TimerIntegrated Timing Resources
Bus InterfacePXI Express
DriverNI-DAQmx

Software Ecosystem

The PXIe-6124 integrates with National Instruments software tools for measurement, automation, and system development.

  • LabVIEW – Graphical programming for measurement and automation.
  • NI-DAQmx – Hardware configuration and synchronized acquisition.
  • NI MAX – Device management, calibration, and diagnostics.
  • TestStand – Automated production test sequencing.
  • FlexLogger – Configuration-based data logging without programming.

Industries

  • Aerospace and Defense
  • Automotive Electronics
  • Power Electronics
  • Industrial Automation
  • Semiconductor Test
  • Research Laboratories

Applications

Power Electronics Testing

Acquire multiple voltage and current signals simultaneously during inverter, motor drive, and power converter testing.

  • Inverter validation
  • Motor drive testing
  • Power quality analysis
  • Switching waveform capture

Transient Signal Acquisition

Capture high-speed transient events with precise timing.

  • Pulse analysis
  • Transient recording
  • Switching events
  • Fault analysis

Automated Test Equipment (ATE)

Supports synchronized measurements in automated production and validation systems.

  • Functional testing
  • Production verification
  • Electronic validation
  • Quality control

Scientific Research

Provides accurate simultaneous sampling for laboratory experiments and engineering development.

  • Signal analysis
  • Physics research
  • Sensor evaluation
  • Prototype validation

Comparison with Similar Products

ModelMain DifferenceBest Application
PXIe-6124 4 simultaneous analog inputs operating at up to 4 MS/s per channel. High-speed synchronized acquisition
PXI-6123 PXI version with similar simultaneous sampling architecture. Legacy PXI systems
PXI-6132 Higher channel count for simultaneous analog acquisition. Multi-channel dynamic measurement
PXIe-6356 X Series multifunction DAQ with integrated analog output and digital I/O. General-purpose multifunction testing

Recommended Related Products

NI PXIe-1095 18-slot high-performance PXI Express chassis.
NI PXIe-1092 Compact PXI Express chassis for modular systems.
NI PXIe-8842 Embedded controller for PXI Express systems.
NI SHC68-68-EPM Shielded VHDCI cable for high-speed signal connections.
NI SCB-68A 68-pin shielded terminal block for signal wiring.

Why Choose PXIe-6124?

  • 4 dedicated simultaneous-sampling analog input channels
  • 16-bit measurement accuracy
  • Up to 4 MS/s sampling rate per channel
  • High-speed PXI Express interface
  • Integrated digital I/O and timing resources
  • Advanced synchronization across PXI systems
  • Compatible with NI-DAQmx, LabVIEW, and TestStand
  • Ideal for transient recording, power electronics, and automated testing

Frequently Asked Questions

What is the PXIe-6124 used for?

The PXIe-6124 is designed for high-speed simultaneous analog signal acquisition, transient recording, automated testing, and precision engineering measurements.

What software supports the PXIe-6124?

The PXIe-6124 supports NI-DAQmx, LabVIEW, NI MAX, TestStand, FlexLogger, and programming environments including C/C++, .NET, and Python.

What is the difference between the PXIe-6124 and PXIe-6356?

The PXIe-6124 focuses on high-speed simultaneous analog acquisition with dedicated ADCs, while the PXIe-6356 is an X Series multifunction DAQ module that combines simultaneous analog acquisition with analog output and expanded digital I/O for more general-purpose measurement applications.

Conclusion

The NI PXIe-6124 Simultaneous Sampling DAQ Module delivers outstanding performance for engineers requiring accurate, synchronized, high-speed analog measurements. Its dedicated simultaneous-sampling architecture, advanced timing resources, and seamless integration with the NI software ecosystem make it an excellent choice for automated testing, transient analysis, power electronics validation, and research laboratories.

Part Number(s): 780536-01

Specifications

Maximum Number of Single-Ended Analog Input Channels: 0
Analog Input Resolution: 16 bits
Maximum Sample Rate: 4 MS/s/ch
Number of Analog Output Channels: 2
Maximum Update Rate: 4 MS/s/ch
Bus Connector: PXI Express
Number of Bidirectional Digital Channels: 24
Electrical Signal Measured: Voltage
Analog Input FIFO Buffer Size: 16382 samples
Maximum Number of Differential Analog Input Channels: 4
Current Flow Direction: –
Simultaneous Sampling: Yes
Analog Input Absolute Accuracy: 3147 μV
Number of Counters/Timers: 2

Brand

National Instruments

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