The PXIe-4136 system source measure unit (SMU) delivers high power, precision, and speed and features 4-quadrant operation. It is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument. The PXIe-4136 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
Applications and Use Cases of PXIe-4136
The PXIe-4136 Precision System SMU is a PXI Express multi-channel source measure unit (SMU) designed for precision voltage/current sourcing and measurement in automated and scalable test systems. It delivers high accuracy, low noise, and parallel testing capability, making it ideal for semiconductor testing and high-throughput production environments.
1. Multi-Channel Parallel SMU Testing
PXIe-4136 supports multiple SMU channels, enabling simultaneous testing of multiple DUTs or multiple nodes within a device.
2. Semiconductor Parametric Testing
Widely used for testing ICs, wafers, and components by measuring I-V characteristics, leakage current, and electrical parameters.
3. Automated Test Equipment (ATE)
Integrated into ATE systems for synchronized multi-channel testing and increased production throughput.
4. Low-Level Precision Measurement
Capable of measuring very small currents and voltages, suitable for sensitive electronic components.
5. Multi-Rail Power Testing & Control
Supports coordinated control of multiple power rails, ideal for complex electronic systems.
6. Research & Development Applications
Used in laboratories for device characterization, circuit validation, and precision measurement.
7. Production & Quality Testing
Applied in manufacturing environments for consistent and repeatable electrical testing.
