The PXIe-4163 is a high-density, high-precision source measure unit designed for semiconductor production and mixed-signal IC testing. It integrates 24 identical four-quadrant SMU channels into a single-slot PXI Express module.
Each channel can source and measure voltages from -24 V to +24 V and currents up to ±50 mA when installed in a chassis with sufficient slot cooling. Integrated four-wire remote sensing, hardware sequencing and NI SourceAdapt technology help improve measurement accuracy, test speed and stability across different load conditions.
Key Features of the PXIe-4163
- 24 identical precision SMU channels
- Four-quadrant source and measurement operation
- ±24 V voltage range per channel
- Up to ±50 mA current per channel
- Current ranges from ±10 µA to ±50 mA
- Current sensitivity of 100 pA or 10 pA
- Up to 1.2 W source power per channel
- Up to 0.6 W sink power per channel
- Four-wire remote sensing on every channel
- NI SourceAdapt transient-response control
- Maximum continuous host measurement rate of 100 kS/s per channel
- Maximum source update rate of 100 kS/s on one channel
- Up to 40 kS/s source updates on all channels simultaneously
- Hardware sequencing and PXI triggering
- Single-slot 3U PXI Express form factor
PXIe-4163 Technical Specifications
| Product Model | PXIe-4163 |
|---|---|
| Product Type | Precision PXI Source Measure Unit |
| Number of SMU Channels | 24 |
| Operating Quadrants | Four-quadrant source and sink operation |
| Voltage Range | -24 V to +24 V |
| Current Range | -50 mA to +50 mA with ≥58 W slot cooling |
| Current Range with 38 W Slot Cooling | -30 mA to +30 mA |
| Available Current Ranges | 10 µA, 100 µA, 1 mA, 10 mA and 30/50 mA |
| Current Sensitivity | 100 pA or 10 pA, depending on configuration |
| Voltage Resolution and Noise | 200 µV on the 24 V range |
| Voltage Accuracy | ±(0.05% of reading + 5 mV) |
| Best Current Resolution and Noise | 100 pA for the standard 10 µA range specification |
| Maximum Source Power | 1.2 W per channel |
| Maximum Sink Power | 0.6 W per channel |
| Maximum Module Output Current | 480 mA total |
| Maximum Continuous Measurement Rate | 100,000 samples/s per channel to host |
| Maximum Single-Channel Update Rate | 100,000 updates/s |
| All-Channel Update Rate | 40,000 updates/s per channel |
| Remote Sense | Four-wire remote sensing on every channel |
| Maximum Remote-Sense Lead Drop | 1 V per lead |
| Functional Isolation to Ground | 60 VDC |
| Typical Settling Time | Less than 500 µs |
| Typical Transient Response | Less than 100 µs |
| Transient Response Control | NI SourceAdapt |
| Front Connector | Custom 62-position female D-SUB |
| Form Factor | 3U, single-slot PXI Express module |
| Dimensions | 2.0 cm × 13.0 cm × 21.6 cm |
| Weight | 394 g (13.9 oz) |
| Recommended Calibration Interval | 1 year |
| Operating Temperature | 0°C to 55°C with suitable ≥58 W slot cooling |
PXIe-4163 Part Numbers and Configurations
| Part Number | Channels | Voltage Range | Current Sensitivity | Description |
|---|---|---|---|---|
| 784483-01 | 24 | ±24 V | 100 pA | PXIe-4163 24-channel precision SMU |
| 784483-02 | 24 | ±24 V | 10 pA | PXIe-4163 enhanced-sensitivity precision SMU |
Both configurations provide 24 four-quadrant SMU channels and ±24 V operation. Part number 784483-02 provides greater current sensitivity for applications involving lower leakage or standby currents.
24 High-Density SMU Channels
The PXIe-4163 integrates 24 independent SMU channels into one PXI Express slot. This channel density allows engineers to build semiconductor test systems with hundreds of source and measurement channels while minimizing chassis space.
Each channel can be independently programmed for voltage or current sourcing, compliance limits, measurement ranges, remote sensing and transient response.
Four-Quadrant Source and Measure Operation
Each channel can source or sink positive and negative voltage and current. Four-quadrant operation allows the module to function as a programmable voltage source, current source or limited electronic load within its power envelope.
This capability is useful for testing IC pins, power rails, protection circuits and mixed-signal devices that may both consume and return small amounts of power.
±24 V Voltage Range
All 24 channels support voltages from -24 V to +24 V. The bipolar range is suitable for powering positive and negative device rails, applying parametric test voltages and measuring current-voltage characteristics.
The voltage specification applies within the per-channel and total module power limits. Engineers should evaluate the complete voltage-current operating envelope rather than selecting the module from maximum voltage and current values alone.
Multiple Current Measurement Ranges
The PXIe-4163 provides 10 µA, 100 µA, 1 mA, 10 mA and 30 mA or 50 mA current ranges. Selecting the smallest range that safely covers the expected current improves measurement resolution and accuracy.
With sufficient chassis cooling, the maximum current range is ±50 mA. In compatible chassis providing 38 W of slot cooling, the maximum current range is limited to ±30 mA.
100 pA and 10 pA Configurations
Part number 784483-01 provides current sensitivity down to 100 pA. Part number 784483-02 offers improved 10 pA sensitivity for applications requiring lower-current measurements.
The enhanced-sensitivity version is suitable for leakage testing, standby-current measurements and semiconductor devices where small current differences can determine pass or fail results.
Source and Sink Power
With at least 58 W of chassis slot cooling, each channel can source up to 1.2 W and sink up to 0.6 W. Total output current across the module is limited to 480 mA.
Because the module contains 24 channels, not every channel can necessarily operate at its maximum voltage, current and power simultaneously. The test sequence must remain within the per-channel and module-level limits.
Four-Wire Remote Sensing
Every PXIe-4163 channel includes four-wire remote sensing. Separate sense conductors measure voltage directly at the device under test and compensate for voltage drop in cables, connectors, switches and test fixtures.
The remote-sense circuitry supports up to 1 V of lead drop per conductor. Sense wires should be connected close to the DUT terminals and routed carefully to reduce noise pickup.
NI SourceAdapt Technology
NI SourceAdapt provides a programmable digital control loop for adjusting each channel’s transient response. Engineers can select predefined response modes or tune control-loop parameters for the connected load.
This capability helps reduce overshoot, oscillation and settling time when testing capacitive, inductive or dynamically changing semiconductor loads.
High-Speed Measurement and Updates
The PXIe-4163 can continuously transfer measurements to the host at up to 100 kS/s per channel. A single channel can also receive source updates at up to 100 kS/s.
When all 24 channels are updated simultaneously, the maximum source update rate is 40 kS/s per channel. Actual rates depend on aperture time, source delay, sequencing and load-dependent settling.
Hardware Sequencing and Triggering
Hardware-timed sequences allow the PXIe-4163 to change source levels and acquire measurements without requiring a separate software command for every test step.
Start, source, sequence-advance and measurement triggers can be routed through PXI trigger lines. This enables deterministic synchronization with digital pattern instruments, switches and other semiconductor test hardware.
Typical Applications
- Mixed-signal IC production testing
- Semiconductor parametric testing
- Power management IC testing
- Analog and mixed-signal device characterization
- Leakage-current measurement
- Standby-current testing
- Multirail IC power sequencing
- Opens and shorts testing
- MEMS device testing
- High-channel-count automated validation
Software Compatibility
The PXIe-4163 is controlled using the NI-DCPower instrument driver. NI-DCPower provides functions for configuring source modes, voltage and current levels, measurement ranges, compliance limits, remote sense, SourceAdapt, triggering and sequencing.
InstrumentStudio can be used for interactive configuration and measurements. Automated test applications can be developed with LabVIEW, LabWindows/CVI, supported .NET environments and NI TestStand.
Included Accessories
- PXIe-4163 source measure unit
- PXIe-4163 breakout board
- PXIe-4163 Current and Open-Sense Protection Accessory
- Safety, environmental and regulatory documentation
Application-specific cables, load boards, switching systems and test fixtures may need to be ordered or designed separately.
Chassis Cooling Requirements
The PXIe-4163 requires a chassis with at least 38 W of cooling capacity per slot. For the full ±50 mA range and maximum 1.2 W source power per channel, NI recommends a chassis providing at least 58 W of slot cooling.
| Slot Cooling Capacity | Maximum Current Range | Maximum Source Power per Channel | Maximum Module Output Power |
|---|---|---|---|
| At least 58 W | ±50 mA | 1.2 W | 28.8 W |
| 38 W | ±30 mA | 0.7 W | 11.5 W |
When using a 38 W chassis slot, configure the chassis fan speed as required by the NI specifications. Always verify both the slot cooling capacity and supported ambient temperature range.
PXIe-4163 Connection Guidance
- Power off the chassis before installing or removing the module.
- Use a chassis with at least 38 W of slot cooling.
- Use the supplied breakout and protection accessories.
- Verify the pinout before connecting a custom load board.
- Set safe voltage and current compliance limits before enabling outputs.
- Connect remote-sense leads directly to the DUT terminals.
- Keep low-current measurement wiring clean and properly shielded.
- Perform self-calibration after the required warm-up period.
PXIe-4163 Troubleshooting
The 50 mA range is unavailable
Verify that the installed chassis provides at least 58 W of cooling capacity for the selected slot. Chassis with 38 W slot cooling limit the maximum current range to 30 mA.
A channel enters compliance unexpectedly
Check the programmed current or voltage limit, DUT condition, cable resistance and load-board wiring. Confirm that remote-sense leads are connected correctly.
Low-current measurements are unstable
Select the smallest suitable current range, increase the aperture time and inspect the fixture for contamination or leakage. Shield sensitive wiring and allow the module to complete its warm-up period.
The output oscillates with the connected DUT
Adjust the SourceAdapt transient-response setting. A slower or customized response may improve stability with capacitive or inductive loads.
Remote-sense errors occur
Verify that each sense lead is connected to the correct channel and polarity. Use the supplied open-sense protection accessory and check for broken or disconnected sense wiring.
All channels cannot operate at maximum current
The PXIe-4163 has module-level current and power limits. Reduce the simultaneous output levels or modify the test sequence so that fewer channels operate at high power at the same time.
PXIe-4163 Compared with Related SMUs
| Model | Channels | Voltage Range | Maximum DC Current | Recommended Use |
|---|---|---|---|---|
| PXIe-4163 | 24 | ±24 V | ±50 mA | High-density mixed-signal IC production test |
| PXIe-4162 | 12 | ±24 V | Higher current per channel | Multichannel testing with increased channel power |
| PXIe-4143 | 4 | ±24 V | ±150 mA | Higher-current precision semiconductor testing |
| PXIe-4141 | 4 | ±10 V | ±100 mA | Lower-voltage precision source and measurement |
Recommended Related Products
- NI PXIe-4162 Multichannel Source Measure Unit – Suitable when fewer channels with higher current capability are required.
- NI PXIe-4143 Precision Source Measure Unit – Provides four ±24 V channels with up to ±150 mA per channel.
- NI PXIe-4141 Precision Source Measure Unit – A four-channel ±10 V option for lower-voltage device testing.
- NI PXIe-6571 Digital Pattern Instrument – Can be combined with the PXIe-4163 for mixed-signal semiconductor production testing.
How to Select the Correct PXI SMU
Choose the PXIe-4163 when the application needs a large number of precision SMU channels in minimal chassis space. It is particularly suitable for mixed-signal ICs with many power, analog and parametric test pins.
Select part number 784483-02 when 10 pA current sensitivity is required. Choose 784483-01 when 100 pA sensitivity meets the test requirement. A lower-density SMU may be preferable when each channel requires substantially more current or power.
Why Choose the PXIe-4163?
- Integrates 24 precision SMU channels into one slot
- Supports bipolar four-quadrant operation
- Provides current sensitivity down to 10 pA
- Includes remote sensing on every channel
- Supports high-speed hardware sequencing
- Optimizes load response with SourceAdapt
- Reduces chassis space in high-channel-count systems
- Designed for semiconductor production environments
Frequently Asked Questions
What is the PXIe-4163 used for?
The PXIe-4163 is used for high-channel-count precision sourcing and measurement in semiconductor production and mixed-signal IC testing.
How many SMU channels does it provide?
The module provides 24 independently programmable SMU channels.
What is the voltage range?
Every channel supports sourcing and measurement from -24 V to +24 V.
What is the maximum current?
Each channel supports up to ±50 mA in a chassis providing at least 58 W of slot cooling. The maximum is ±30 mA with 38 W slot cooling.
What is the difference between the two part numbers?
Part number 784483-01 provides 100 pA current sensitivity, while 784483-02 provides enhanced 10 pA sensitivity.
Does the PXIe-4163 support current sinking?
Yes. Its four-quadrant architecture allows each channel to source or sink voltage and current within the specified operating envelope.
Does every channel support remote sensing?
Yes. Each channel includes integrated four-wire remote sensing for compensating voltage drop in the test connection.
Which software controls the module?
The PXIe-4163 uses NI-DCPower and can be operated with InstrumentStudio or programmed using supported LabVIEW, LabWindows/CVI, .NET and TestStand environments.
What is the recommended calibration interval?
NI specifies a recommended external calibration interval of one year.
Request a Quote for the PXIe-4163
Contact us for current availability, lead time and project pricing for the PXIe-4163 24-Channel Precision PXI Source Measure Unit. We can also help verify the correct sensitivity option, PXI chassis cooling, breakout board, cables and related semiconductor test instruments.
