PXIe-4137

The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 480 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.

Applications and Use Cases of PXIe-4137

The PXIe-4137 Precision System SMU is a PXI Express high-channel-density source measure unit (SMU) предназначен для прецизионное питание / измерение напряжения/тока в scalable automated test systems. Оно предлагает low noise, high accuracy, and parallel test capability, что делает его пригодным для semiconductor testing and high-throughput production environments.

1. High-Density Parallel SMU Testing
PXIe-4137 supports multiple SMU channels, enabling simultaneous testing of multiple devices or multiple nodes within a device, improving efficiency.

2. Параметрическое тестирование полупроводников
Widely used for testing ICs, wafers, and components by measuring I-V characteristics, leakage currents, and electrical parameters.

3. Автоматизированное испытательное оборудование (АИО)
Integrated into large-scale ATE systems for synchronized multi-channel testing and high-volume production validation.

4. Прецизионное измерение на низком уровне
Capable of measuring very small currents and voltages, suitable for sensitive electronic components.

5. Многоканальное тестирование и управление питанием
Supports coordinated control and sequencing of multiple power rails in complex electronic systems.

6. Приложения для исследований и разработок
Used in laboratories for device characterization, circuit validation, and precision measurement.

7. Производство и контроль качества
Applied in manufacturing environments for repeatable and high-efficiency testing of electronic products.