PXIe-S5090

The PXIe-S5090 is a PXI Express Vector Network Analyzer (VNA) from National Instruments, designed for RF component testing, impedance analysis, S-parameter measurement, antenna validation, filter characterization, and automated production test applications. The module provides a 2-port VNA architecture with a frequency range from 300 kHz to 9 GHz, enabling accurate RF measurements within modular PXI Express systems.

The NI PXIe-S5090 is suitable for engineers working in RF design validation, wireless communications, aerospace, defense, semiconductor testing, and high-frequency component manufacturing. It measures amplitude, phase, impedance, and S-parameters of RF devices while supporting both frequency-domain and time-domain analysis. The module is optimized for automated RF testing environments requiring compact PXI integration and high-speed measurements.

One of the main advantages of the PXIe-S5090 Vector Network Analyzer is its combination of wide frequency coverage, high dynamic range, and fast sweep speeds. The VNA supports automated precision calibration, full vector analysis, segmented sweeps, logarithmic and linear frequency sweeps, power sweeps, marker math, and limit testing. These capabilities make it suitable for RF production testing and laboratory characterization applications.

The National Instruments PXIe-S5090 supports time-domain and gating conversion, allowing engineers to isolate reflections, analyze cable faults, and characterize RF components more accurately. The module also supports frequency offset mode, vector mixer calibration measurements, and reference plane extension functions, enabling advanced RF measurement workflows.

Another important feature of the PXIe-S5090 is its compact PXI Express architecture. The module fits into a single NI PXI chassis slot while processing measurement data on the host controller or PC. This architecture improves flexibility, simplifies upgrades, and eliminates onboard storage concerns in secure testing environments. The PXIe-S5090 was co-developed by Copper Mountain Technologies and NI, combining RF VNA expertise with PXI modular instrumentation.

Technical specifications describe the PXIe-S5090 as supporting up to 500,001 measurement points, dynamic range up to 138 dB (typical), and output power adjustment from -45 dBm to +13 dBm. The analyzer also supports up to 16 logical channels with up to 16 traces per channel, enabling complex RF measurement configurations.

The PXIe-S5090 VNA Module integrates with LabVIEW, IVI drivers, IVI.NET, and PXI automation systems. Engineers can combine the analyzer with RF signal generators, switch matrices, timing modules, FPGA hardware, and DAQ instruments to build modular RF validation platforms for wireless communications, radar systems, aerospace testing, and automated manufacturing.

The PXIe-S5090 is suitable for applications such as antenna testing, filter characterization, cable testing, RF component validation, impedance analysis, wireless communication research, radar system development, aerospace RF measurements, and automated production testing. Its compact PXI architecture and laboratory-grade VNA performance make it especially useful for automated RF measurement systems.

Overall, the NI PXIe-S5090 PXI Vector Network Analyzer is a high-performance RF measurement solution for PXI Express systems. With its 300 kHz to 9 GHz frequency range, 2-port VNA architecture, 138 dB dynamic range, time-domain analysis, and integration with LabVIEW and PXI automation platforms, the PXIe-S5090 is well suited for RF research, design validation, and automated production test applications.