PXIe-4190

The PXIe-4190 is a PXI Precision Source Measure Unit (SMU) Module from National Instruments, designed for precision voltage and current sourcing, measurement, semiconductor validation, electronic component testing, and automated PXI Express test systems. The NI PXIe-4190 combines high-accuracy sourcing and measurement capabilities in a single PXIe module, making it suitable for automated characterization and validation applications. NI lists the PXIe-4190 with part number 786834-01.

The NI PXIe-4190 is useful for engineers who need accurate sourcing and measurement functions in automated test environments. It can source voltage or current while simultaneously measuring voltage and current with high precision. This capability makes the module suitable for semiconductor testing, passive component validation, sensor characterization, low-current measurement, and electronic device analysis.

One of the main advantages of the PXIe-4190 Precision SMU Module is its ability to combine multiple instrument functions into a single PXIe module. The PXIe-4190 can operate as a precision voltage source, current source, voltmeter, ammeter, and electronic load. This reduces the need for multiple standalone instruments and helps engineers build compact automated PXI test systems with simplified cabling and synchronization.

The National Instruments PXIe-4190 provides high-resolution sourcing and measurement performance, supporting low-current measurements and precision voltage sourcing for sensitive electronic devices. Its integrated measurement architecture allows engineers to perform current-voltage (IV) characterization, leakage current testing, component validation, and precision DC measurements with repeatable results.

Another important feature of the PXIe-4190 is its PXI Express synchronization capability. Engineers can synchronize the SMU module with other PXIe instruments such as DAQ modules, oscilloscopes, switch modules, RF instruments, and digital I/O devices. This makes the module suitable for automated production testing, mixed-signal validation, and hardware-in-the-loop applications where multiple instruments must operate together with precise timing.

Technical specifications describe the PXIe-4190 as supporting precision sourcing and measurement with programmable voltage and current ranges, integrated protection features, and software-controlled operation through NI-DCPower and LabVIEW. The module is optimized for automated semiconductor characterization, component testing, and precision electronic measurement systems.

The PXIe-4190 Precision SMU Module installs into a compatible PXI Express chassis and integrates with PXI switching modules, DAQ hardware, oscilloscopes, RF instruments, and automated validation systems. Engineers can create modular, software-defined test platforms for semiconductor validation, precision DC testing, battery simulation, and component analysis.

The PXIe-4190 is suitable for applications such as semiconductor device characterization, IV curve tracing, leakage current testing, sensor validation, passive component testing, automated production testing, low-current measurement, and precision electronic validation. Its high-accuracy sourcing and measurement architecture make it especially useful for engineers working with sensitive or low-power electronic devices.

Overall, the NI PXIe-4190 Precision Source Measure Unit Module is a high-accuracy PXI Express measurement solution for automated electronic testing and validation. With its precision sourcing capability, integrated voltage and current measurement, software-controlled operation, and PXI Express synchronization support, the PXIe-4190 is well suited for semiconductor testing, component characterization, and automated PXI Express measurement systems.