PXIe-6591

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$35,500.00

Item details

Number of Bidirectional Digital Channels: 8
Maximum Data Rate: 12.5 Gbits/s
Dynamic RAM (DRAM): 2 GB
PXI Backplane Link: PCI-Express Gen2 x 8
FPGA: Kintex-7 410T

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National Instruments PXIe-6591 PXI High-Speed Serial Instrument

PXIe, 12.5 Gbps, 8-Channel PXI High-Speed Serial Instrument

The PXIe-6591 is a high-speed serial instrumentation module from National Instruments, designed for advanced validation, compliance testing, and development of multi-gigabit serial communication systems within PXI Express platforms. It is built around a Xilinx Kintex-7 FPGA and high-speed transceiver architecture, enabling flexible, software-defined serial test and measurement capabilities.

The module is engineered for high-performance SerDes and digital communication testing, supporting deterministic timing, low-latency data handling, and fully customizable protocol development.

Key Features of PXIe-6591

The NI PXIe-6591 provides up to 8 high-speed serial lanes, supporting data rates up to approximately 12.5 Gbps per lane depending on configuration and implementation.

Core features include:

  • Up to 8 TX and 8 RX serial channels
  • FPGA-based Kintex-7 architecture
  • Multi-gigabit transceiver (MGT) design
  • Fully programmable serial protocol implementation
  • Deterministic synchronization via PXI Express backplane
  • High-speed streaming and buffered data handling

Each lane operates independently, enabling parallel testing of multiple high-speed links.

FPGA-Based Flexible Architecture

At the core of the PXIe-6591 is a Xilinx Kintex-7 FPGA, which enables deep customization of:

  • Custom serial protocol stacks
  • Encoding schemes (e.g., 8b/10b, 64b/66b)
  • Real-time signal processing
  • Error injection and detection
  • Link training and compliance testing logic
  • High-throughput buffering and streaming

This makes it a highly flexible platform for both research and production-level validation.

PXI Express Timing and Synchronization

The PXIe-6591 integrates with the PXI Express timing architecture, providing:

  • Shared system reference clock distribution
  • Trigger bus synchronization across modules
  • Deterministic multi-instrument coordination
  • Low-latency PCIe backplane communication

This allows multiple PXI modules to operate as a synchronized test system.

Software Integration

The module is supported by NI’s software ecosystem:

  • LabVIEW FPGA Module
  • NI LabVIEW
  • NI TestStand
  • NI PXI driver frameworks

This enables automated test development, FPGA-level customization, and scalable production testing workflows.

Typical Applications

The PXIe-6591 is widely used in:

  • High-speed SerDes validation
  • Semiconductor and IC testing
  • FPGA/ASIC verification
  • Optical and electrical communication system testing
  • Automotive high-speed network validation
  • Aerospace and defense communication systems
  • Custom protocol research and development

PXI System Context

The PXIe-6591 operates within a PXI Express chassis, leveraging:

  • PCI Express backplane bandwidth
  • System timing and synchronization buses
  • Multi-instrument deterministic test coordination
  • Scalable modular instrumentation architecture

It is typically deployed in advanced ATE (Automated Test Equipment) systems.

Summary

The NI PXIe-6591 is a 12.5 Gbps, 8-channel high-speed serial PXI Express module built on a Kintex-7 FPGA, designed for flexible, deterministic serial protocol testing and validation in complex measurement systems.

Part Number(s): 783638-01

Specification

Overview

Brand

National Instruments

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