{"id":744,"count":19,"description":"
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NI PXI Programmable Power Supplies and SMUs<\/h2>\r\n\r\n
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NI PXI Programmable Power Supplies and Source Measure Units provide software-controlled DC power, precision voltage and current sourcing, electrical measurement, current limiting and automated device characterization. They integrate DUT power and parametric measurement with PXI switching, digital, RF and waveform instruments in one synchronized test platform.<\/p>\r\n\r\n

The correct instrument depends on more than maximum voltage and current. Engineers must consider channel count, source and sink operation, DC and pulsed power, current sensitivity, compliance limits, measurement speed, remote sensing, guarding, auxiliary power, chassis cooling and DUT connection requirements.<\/p>\r\n <\/div>\r\n\r\n

Programmable Power Supply or Source Measure Unit?<\/h3>\r\n\r\n

A programmable power supply primarily delivers controlled DC power to a device under test. It is well suited to functional testing, voltage-margin testing, multiple DUT power rails, startup analysis and automated power sequencing.<\/p>\r\n\r\n

A Source Measure Unit, or SMU, combines precision voltage and current sourcing with precision voltage and current measurement. Many SMUs support four-quadrant operation, allowing them to source or sink current under positive or negative voltage conditions. This makes them more appropriate for semiconductor characterization, leakage measurement and current-voltage sweeps.<\/p>\r\n\r\n

\r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n
Selection Factor<\/th>\r\n Programmable Power Supply<\/th>\r\n Source Measure Unit<\/th>\r\n <\/tr>\r\n <\/thead>\r\n
Primary Function<\/td>\r\n Provide controlled DUT power<\/td>\r\n Source and precisely measure voltage or current<\/td>\r\n <\/tr>\r\n
Typical Operation<\/td>\r\n Program voltage with a current limit<\/td>\r\n Source voltage and measure current, or source current and measure voltage<\/td>\r\n <\/tr>\r\n
Current Measurement<\/td>\r\n Readback and power-consumption monitoring<\/td>\r\n Precision current measurement across multiple ranges<\/td>\r\n <\/tr>\r\n
Source and Sink Capability<\/td>\r\n Usually source-oriented and model dependent<\/td>\r\n Four-quadrant operation on applicable models<\/td>\r\n <\/tr>\r\n
I-V Sweeps<\/td>\r\n Not the primary application<\/td>\r\n Core capability<\/td>\r\n <\/tr>\r\n
Low-Current Measurement<\/td>\r\n Model dependent<\/td>\r\n Available down to picoampere or femtoampere-class sensitivity on selected models<\/td>\r\n <\/tr>\r\n
\u0422\u0438\u043f\u0438\u0447\u043d\u044b\u0435 \u043f\u0440\u0438\u043c\u0435\u043d\u0435\u043d\u0438\u044f<\/td>\r\n DUT power, functional test and rail sequencing<\/td>\r\n Semiconductor, component and parametric characterization<\/td>\r\n <\/tr>\r\n <\/tbody>\r\n <\/table>\r\n <\/div>\r\n\r\n
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Maximum voltage and maximum current cannot always be used simultaneously. Every power supply and SMU operates within a defined voltage-current-power envelope. Check the required DUT operating point, continuous duration and pulse conditions against the exact model specifications.<\/p>\r\n <\/div>\r\n\r\n

NI PXI Power Supply and SMU Model Comparison<\/h3>\r\n\r\n
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\u041c\u043e\u0434\u0435\u043b\u044c<\/th>\r\n Unique Category<\/th>\r\n Key Configuration<\/th>\r\n Best Fit<\/th>\r\n <\/tr>\r\n <\/thead>\r\n
\u041fXI-4110<\/a><\/td>\r\n Three-Rail Classic PXI Supply<\/td>\r\n Three outputs including 0 V to 6 V and positive and negative 20 V rails, with current capability up to 1 A<\/td>\r\n Legacy PXI systems requiring logic and bipolar analog power rails<\/td>\r\n <\/tr>\r\n
PXIe-4112<\/a><\/td>\r\n Dual-Channel High-Voltage Supply<\/td>\r\n Two isolated channels, up to 60 V and 1 A per channel, 120 W total output power<\/td>\r\n Higher-voltage functional testing and independently controlled DUT rails<\/td>\r\n <\/tr>\r\n
PXIe-4113<\/a><\/td>\r\n Dual-Channel High-Current Supply<\/td>\r\n Two isolated channels, up to 10 V and 6 A per channel, 120 W total output power<\/td>\r\n Low-voltage electronics requiring higher current<\/td>\r\n <\/tr>\r\n
PXIe-4137<\/a><\/td>\r\n 200 V Precision System SMU<\/td>\r\n One channel, \u00b1200 V, \u00b11 A DC, \u00b13 A pulsed, up to 40 W DC and 100 fA current sensitivity<\/td>\r\n High-voltage semiconductor, optoelectronic and component characterization<\/td>\r\n <\/tr>\r\n
PXIe-4139<\/a><\/td>\r\n High-Current Pulse System SMU<\/td>\r\n One channel, \u00b160 V, \u00b13 A DC, \u00b110 A pulsed, up to 40 W DC and 100 fA current sensitivity<\/td>\r\n PMIC, RFIC, LED and power-device characterization<\/td>\r\n <\/tr>\r\n
PXIe-4140<\/a><\/td>\r\n General-Purpose 10 V Four-Channel SMU<\/td>\r\n Four channels, \u00b110 V, 100 mA, four-quadrant operation and 100 pA current sensitivity<\/td>\r\n Multi-terminal devices and moderate-precision automated measurements<\/td>\r\n <\/tr>\r\n
PXIe-4141<\/a><\/td>\r\n Precision 10 V Four-Channel SMU<\/td>\r\n Four channels, \u00b110 V, 100 mA, 10 pA sensitivity and SourceAdapt transient-response control<\/td>\r\n Low-current, multi-pin semiconductor characterization<\/td>\r\n <\/tr>\r\n
PXIe-4142<\/a><\/td>\r\n General-Purpose 24 V Four-Channel SMU<\/td>\r\n Four channels, \u00b124 V, 150 mA, 3.6 W per channel and 100 pA sensitivity<\/td>\r\n Multi-rail IC and component testing requiring wider voltage range<\/td>\r\n <\/tr>\r\n
PXIe-4143<\/a><\/td>\r\n Precision 24 V Four-Channel SMU<\/td>\r\n Four channels, \u00b124 V, 150 mA, 10 pA sensitivity and SourceAdapt<\/td>\r\n Precision multi-terminal semiconductor and sensor characterization<\/td>\r\n <\/tr>\r\n
PXIe-4144<\/a><\/td>\r\n Low-Voltage High-Current Four-Channel SMU<\/td>\r\n Four channels, \u00b16 V, 500 mA and up to 3 W source or sink power per channel<\/td>\r\n Low-voltage IC rails and devices needing more current per channel<\/td>\r\n <\/tr>\r\n
PXIe-4147<\/a><\/td>\r\n High-Current Precision Four-Channel SMU<\/td>\r\n Four channels, \u00b18 V, \u00b13 A, up to 24 W per channel, 100 fA sensitivity and SourceAdapt<\/td>\r\n High-current PMIC and semiconductor production testing<\/td>\r\n <\/tr>\r\n
PXIe-4150<\/a><\/td>\r\n 60 V 300 W PXI Power Supply<\/td>\r\n One channel, up to 60 V, 10 A and 300 W with high-speed voltage and current measurement<\/td>\r\n Higher-voltage boards, converters and electronic assemblies<\/td>\r\n <\/tr>\r\n
PXIe-4151<\/a><\/td>\r\n 25 A 300 W PXI Power Supply<\/td>\r\n One channel, up to 20 V, 25 A and 300 W with remote sensing and integrated measurement<\/td>\r\n Low-voltage, high-current DUT and PMIC power testing<\/td>\r\n <\/tr>\r\n
PXIe-4162<\/a><\/td>\r\n Guarded 12-Channel Precision SMU<\/td>\r\n Twelve identical \u00b124 V SMU channels with remote sensing, guarding and SourceAdapt<\/td>\r\n Precision mixed-signal IC and multi-site production test<\/td>\r\n <\/tr>\r\n
PXIe-4163<\/a><\/td>\r\n 24-Channel High-Density Precision SMU<\/td>\r\n Twenty-four identical \u00b124 V SMU channels with four-quadrant operation and SourceAdapt<\/td>\r\n High-pin-count ICs and systems requiring maximum SMU channel density<\/td>\r\n <\/tr>\r\n
PXIe-4190<\/a><\/td>\r\n LCR Meter with Integrated SMU<\/td>\r\n Up to 2 MHz LCR stimulus, up to \u00b140 V DC bias and femtoampere-class SMU measurement on selected configuration<\/td>\r\n Capacitance-voltage, impedance and semiconductor parametric testing<\/td>\r\n <\/tr>\r\n
RMX-4101<\/a><\/td>\r\n Compact 216 W Rack Power Supply<\/td>\r\n Single-channel 2U rack supply with configurations up to 216 W, 100 V or 10 A<\/td>\r\n Compact rack systems needing moderate programmable DC power<\/td>\r\n <\/tr>\r\n
RMX-4102<\/a><\/td>\r\n Compact 432 W Rack Power Supply<\/td>\r\n Single-channel 2U rack supply with configurations up to 432 W, 100 V or 20 A<\/td>\r\n Higher-power rack-mounted functional test systems<\/td>\r\n <\/tr>\r\n
RMX-4123<\/a><\/td>\r\n High-Voltage 750 W Rack Power Supply<\/td>\r\n One channel, 0 V to 650 V, up to 3.5 A and 750 W in a 1U full-width enclosure<\/td>\r\n High-voltage component, insulation and power-electronics testing<\/td>\r\n <\/tr>\r\n <\/tbody>\r\n <\/table>\r\n <\/div>\r\n\r\n
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The RMX-4101, RMX-4102 and RMX-4123 are standalone or rack-mounted power supplies rather than PXI plug-in modules. The PXIe-4190 is primarily an LCR meter with integrated SMU capability. Confirm the required form factor before including these instruments in a PXI system quotation.<\/p>\r\n <\/div>\r\n\r\n

How to Select a PXI Programmable Power Supply or SMU<\/h3>\r\n\r\n

1. Define the DUT Voltage Range<\/h4>\r\n\r\n

Record the minimum and maximum voltage required for normal operation, margin testing, startup, shutdown and fault simulation. Include any negative-bias requirement. A unipolar programmable power supply cannot replace a bipolar four-quadrant SMU when both voltage polarities are required.<\/p>\r\n\r\n

Do not automatically select the highest available voltage. A lower-voltage instrument may provide greater current, better channel density or more suitable measurement ranges.<\/p>\r\n\r\n

2. Determine Continuous and Pulsed Current<\/h4>\r\n\r\n

Specify continuous current separately from short-duration peak current. Wireless transmitters, processors, PMICs, LEDs and other devices can draw brief current pulses substantially higher than their steady-state consumption.<\/p>\r\n\r\n

For pulsed operation, identify pulse amplitude, duration, repetition rate, duty cycle and acceptable voltage droop. Verify the complete pulsed operating envelope rather than relying only on a headline peak-current value.<\/p>\r\n\r\n

3. Check the Complete Power Envelope<\/h4>\r\n\r\n

Voltage, current and power limits must be evaluated together. For example, the PXIe-4150 supports up to 60 V and 10 A but has a maximum output power of 300 W, so it cannot supply 60 V at 10 A simultaneously.<\/p>\r\n\r\n

Plot demanding DUT operating points against the model\u2019s quadrant or power-envelope diagram. This is particularly important for power converters, PMICs, LEDs, active devices and loads whose current changes significantly during testing.<\/p>\r\n\r\n

4. Determine Whether the Instrument Must Sink Current<\/h4>\r\n\r\n

A conventional single-quadrant power supply normally delivers power to the DUT. Four-quadrant SMUs can source or absorb current within their specified operating envelopes.<\/p>\r\n\r\n

Controlled sinking may be required when testing active circuits, charged capacitive devices, bidirectional power stages or source-like DUTs. High-power discharge testing may require a dedicated electronic load rather than a precision SMU.<\/p>\r\n\r\n

5. Specify the Required Measurement Sensitivity<\/h4>\r\n\r\n

Maximum current does not describe the complete measurement requirement. Semiconductor test can involve amperes during active operation and picoamperes or femtoamperes during leakage measurements.<\/p>\r\n\r\n

Document the smallest current that must be measured, required accuracy, acceptable noise, measurement time and expected DUT capacitance. Selectable current ranges, aperture time, settling time and environmental leakage can all affect the usable result.<\/p>\r\n\r\n

6. Calculate the Required Channel Count<\/h4>\r\n\r\n

Count every DUT supply rail, bias terminal and independent source-measure connection. Then include the number of DUTs that will be tested simultaneously.<\/p>\r\n\r\n

A single-channel system SMU may provide the best performance for one demanding terminal. Four-, 12- or 24-channel SMUs can provide better density for high-pin-count devices and parallel semiconductor production testing.<\/p>\r\n\r\n

7. Confirm Remote Sense and Guarding<\/h4>\r\n\r\n

Remote sensing uses separate force and sense conductors to compensate for voltage drop in cables, switches and fixtures. It is particularly important in high-current applications and whenever the voltage must be controlled accurately at the DUT terminals.<\/p>\r\n\r\n

Guarding helps reduce leakage through cables, connectors and fixtures during very-low-current measurements. A precision SMU cannot deliver femtoampere-class system performance if the fixture, switching or contamination introduces substantially greater leakage.<\/p>\r\n\r\n

8. Evaluate Speed, Sequencing and Synchronization<\/h4>\r\n\r\n

Measurement speed affects production throughput and transient capture. Selected PXI power instruments can acquire voltage and current at high rates, perform hardware-timed source sequences and coordinate operations through PXI trigger lines.<\/p>\r\n\r\n

Define whether the application needs static DC readings, fast rail sequencing, I-V sweeps, startup-current capture or synchronization with digital, RF or waveform instruments.<\/p>\r\n\r\n

Four-Quadrant SMU Operation<\/h3>\r\n\r\n
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Quadrant<\/th>\r\n Voltage<\/th>\r\n Current<\/th>\r\n Instrument Behavior<\/th>\r\n <\/tr>\r\n <\/thead>\r\n
I<\/td>\r\n Positive<\/td>\r\n Positive<\/td>\r\n Sources power under positive bias<\/td>\r\n <\/tr>\r\n
II<\/td>\r\n Positive<\/td>\r\n Negative<\/td>\r\n Sinks power under positive bias<\/td>\r\n <\/tr>\r\n
III<\/td>\r\n Negative<\/td>\r\n Negative<\/td>\r\n Sources power under negative bias<\/td>\r\n <\/tr>\r\n
IV<\/td>\r\n Negative<\/td>\r\n Positive<\/td>\r\n Sinks power under negative bias<\/td>\r\n <\/tr>\r\n <\/tbody>\r\n <\/table>\r\n <\/div>\r\n\r\n

Four-quadrant capability supports positive and negative device bias, controlled sourcing and sinking, and characterization across a wider I-V region. The permitted voltage, current and power are still limited by the exact model\u2019s quadrant diagram.<\/p>\r\n\r\n

Precision I-V and Leakage Measurements<\/h3>\r\n\r\n

An SMU can source a series of voltage values and measure the resulting current, or source current and measure voltage. The resulting I-V curve can identify forward voltage, threshold behavior, resistance, breakdown behavior, leakage and other electrical characteristics.<\/p>\r\n\r\n

Common devices include:<\/p>\r\n\r\n