{"id":725,"count":32,"description":"
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NI PXI and PXIe Switch Modules<\/h2>\r\n\r\n
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NI PXI switches provide software-controlled signal routing between measurement instruments, stimulus sources, loads and devices under test. They allow one instrument to service many test points, connect multiple instruments to different DUT terminals and automate routing operations that would otherwise require manual rewiring.<\/p>\r\n\r\n

PXI switch modules include multiplexers, matrices, independent relays, external relay drivers and RF switches. Selecting the correct module requires more than comparing channel count. Engineers must define the required topology and verify voltage, current, switching power, bandwidth, path resistance, isolation, relay life, connectors and software compatibility.<\/p>\r\n <\/div>\r\n\r\n

What Does a PXI Switch Do?<\/h3>\r\n\r\n

A PXI switch normally does not generate or measure the signal. It establishes the electrical path so another instrument can perform the required measurement or stimulus function. For example, a multiplexer can connect one digital multimeter to many test points, while a matrix can dynamically connect several instruments to multiple DUT terminals.<\/p>\r\n\r\n

Because the switch becomes part of the signal path, its resistance, leakage, thermal offset, bandwidth, insertion loss and isolation can affect measurement accuracy. Switching hardware should therefore be selected together with the connected instruments, cables, terminal blocks and test fixture.<\/p>\r\n\r\n

Main Types of PXI Switch Modules<\/h3>\r\n\r\n
\r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n
Switch Type<\/th>\r\n Routing Architecture<\/th>\r\n Best Fit<\/th>\r\n Important Specifications<\/th>\r\n <\/tr>\r\n <\/thead>\r\n
Multiplexer<\/td>\r\n Connects one or several common paths to many selectable channels<\/td>\r\n Scanning many DUT points with one DMM, DAQ device or source<\/td>\r\n Channel count, wire mode, voltage, current, resistance and scan rate<\/td>\r\n <\/tr>\r\n
Matrix<\/td>\r\n Provides configurable row-to-column connections<\/td>\r\n Flexible routing between multiple instruments and DUT nodes<\/td>\r\n Rows, columns, crosspoints, simultaneous routes, resistance and isolation<\/td>\r\n <\/tr>\r\n
Independent Relay<\/td>\r\n Provides separately controlled SPST, SPDT or other relay contacts<\/td>\r\n Power interruption, load control, fault insertion and fixture automation<\/td>\r\n Contact configuration, voltage, current, power and relay life<\/td>\r\n <\/tr>\r\n
Relay Driver<\/td>\r\n Controls external relays rather than routing signals through onboard contacts<\/td>\r\n Custom fixtures, external relay banks, solenoids and inductive loads<\/td>\r\n Output quantity, drive voltage, drive current, protection and external supply<\/td>\r\n <\/tr>\r\n
RF Multiplexer<\/td>\r\n Routes controlled-impedance high-frequency paths<\/td>\r\n RF instrument sharing, multi-DUT testing and antenna or port selection<\/td>\r\n Frequency range, impedance, insertion loss, isolation, VSWR and RF power<\/td>\r\n <\/tr>\r\n
Transfer and Fault-Insertion Switch<\/td>\r\n Selects alternate paths or deliberately opens, shorts or redirects signals<\/td>\r\n ECU, avionics, communications and hardware-in-the-loop validation<\/td>\r\n Topology, fault states, simultaneous connections and electrical ratings<\/td>\r\n <\/tr>\r\n <\/tbody>\r\n <\/table>\r\n <\/div>\r\n\r\n

Multiplexer vs Matrix Switching<\/h3>\r\n\r\n
\r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n \r\n
Selection Factor<\/th>\r\n Multiplexer<\/th>\r\n Matrix<\/th>\r\n <\/tr>\r\n <\/thead>\r\n
Basic Architecture<\/td>\r\n One or several common connections routed to many channels<\/td>\r\n Multiple rows connected to multiple columns through crosspoints<\/td>\r\n <\/tr>\r\n
\u0422\u0438\u043f\u0438\u0447\u043d\u043e\u0435 \u0438\u0441\u043f\u043e\u043b\u044c\u0437\u043e\u0432\u0430\u043d\u0438\u0435<\/td>\r\n One instrument sequentially measures many DUT points<\/td>\r\n Several instruments require flexible access to multiple DUT nodes<\/td>\r\n <\/tr>\r\n
Routing Flexibility<\/td>\r\n Optimized for defined one-to-many paths<\/td>\r\n Supports more flexible instrument-to-DUT connection patterns<\/td>\r\n <\/tr>\r\n
Channel Efficiency<\/td>\r\n Generally efficient for scanning applications<\/td>\r\n Depends on the required number of rows, columns and simultaneous routes<\/td>\r\n <\/tr>\r\n
System Complexity<\/td>\r\n Relatively straightforward wiring and programming<\/td>\r\n Requires careful route planning and prevention of conflicting connections<\/td>\r\n <\/tr>\r\n
Common Application<\/td>\r\n DMM channel expansion and multipoint data acquisition<\/td>\r\n Semiconductor characterization and multi-instrument automated test<\/td>\r\n <\/tr>\r\n <\/tbody>\r\n <\/table>\r\n <\/div>\r\n\r\n

If one DMM must sequentially measure 32 DUT points, a multiplexer is usually the more direct architecture. If several instruments must dynamically connect to many terminals, a matrix provides greater routing flexibility.<\/p>\r\n\r\n

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Define the complete connection map before selecting a switch. Two modules with similar channel counts may have incompatible topologies and cannot necessarily replace one another.<\/p>\r\n <\/div>\r\n\r\n

How to Select a PXI Switch Module<\/h3>\r\n\r\n

1. Define the Required Routing Topology<\/h4>\r\n\r\n

Begin by identifying every instrument, source, load and DUT connection. Determine which paths must be connected, which connections must exist simultaneously and whether shared returns or differential pairs are permitted.<\/p>\r\n\r\n

This determines whether the system needs a multiplexer, matrix, independent relay, relay driver, RF switch or fault-insertion architecture. For a matrix, specify the number of rows, columns and crosspoints. For a multiplexer, specify the number of common paths, channels, banks and required wire mode.<\/p>\r\n\r\n

2. Select the Correct Wire Mode<\/h4>\r\n\r\n

One-wire switching provides high channel density but normally uses a shared return. Two-wire switching routes both signal conductors and is common for differential or floating measurements. Four-wire switching routes separate source and sense connections for precision resistance measurement.<\/p>\r\n\r\n

Changing wire mode normally changes the available channel count. Confirm the required measurement method before comparing module channel specifications.<\/p>\r\n\r\n

3. Confirm Voltage, Current and Switching Power<\/h4>\r\n\r\n

Maximum voltage and maximum current ratings should not be treated as simultaneously available under every condition. Relays also have switching-power limits that depend on the signal type and load.<\/p>\r\n\r\n

Check both normal operating levels and possible transient or fault conditions. Battery systems, power supplies, motors, solenoids, capacitive loads and inductive loads can place additional stress on relay contacts.<\/p>\r\n\r\n

4. Distinguish Switching and Carry Ratings<\/h4>\r\n\r\n

A relay may be able to carry a certain current after closing but may not be able to safely make or break that same current. Switching ratings describe the energized conditions under which the contacts can change state, while carry ratings describe the current that can flow through an established path.<\/p>\r\n\r\n

Review voltage, current and power ratings for the exact AC, DC or RF signal being routed.<\/p>\r\n\r\n

5. Determine Hot or Cold Switching<\/h4>\r\n\r\n

Cold switching changes relay state while little or no voltage and current are present across the contacts. Hot switching opens or closes an energized circuit and generally places more electrical stress on the relay.<\/p>\r\n\r\n

When possible, disable the source or load before changing relay state. This can reduce contact wear and extend electrical relay life. The applicable switching sequence should be included in the test-system design rather than left entirely to operator practice.<\/p>\r\n\r\n

6. Review Low-Level Measurement Performance<\/h4>\r\n\r\n

For precision resistance, low-current, low-voltage or semiconductor measurements, consider path resistance, resistance stability, leakage current, thermal EMF and insulation resistance. These characteristics can contribute directly to measurement uncertainty.<\/p>\r\n\r\n

Very low resistance measurements may require four-wire routing. Sensitive current measurements may require low-leakage switching, guarded connections and careful fixture insulation. A high-voltage switch is not automatically suitable for low-level precision measurement.<\/p>\r\n\r\n

7. Match Bandwidth to the Routed Signal<\/h4>\r\n\r\n

A switch must pass the frequency content of the signal without unacceptable attenuation or distortion. Fast digital edges and transient waveforms can require substantially more bandwidth than their repetition rate suggests.<\/p>\r\n\r\n

For RF paths, verify characteristic impedance, insertion loss, isolation, return loss or VSWR, connector type and RF power handling. Include cables, adapters and fixtures when calculating the complete RF path budget.<\/p>\r\n\r\n

8. Evaluate Relay Technology and Lifetime<\/h4>\r\n\r\n

Electromechanical and reed relays provide galvanic isolation but are mechanical wear components. Solid-state switching can provide faster operation and very long cycle life, but its leakage, on-resistance and signal behavior differ from mechanical contacts.<\/p>\r\n\r\n

Estimate the expected relay operations from DUT volume, number of tests per unit and planned equipment life. Electrical relay life can be much shorter than mechanical life when contacts switch energized loads.<\/p>\r\n\r\n

9. Calculate Switching and Measurement Throughput<\/h4>\r\n\r\n

Total test time includes relay actuation, relay settling, signal-path settling, instrument configuration, measurement integration and software overhead. A faster relay does not necessarily improve throughput when the connected instrument or DUT requires a longer settling period.<\/p>\r\n\r\n

Supported hardware triggering can coordinate the switch with a DMM or other instrument and reduce the timing variation associated with software-controlled scanning.<\/p>\r\n\r\n

10. Confirm Connectors, Cables and Terminal Blocks<\/h4>\r\n\r\n

Many PXI switches require dedicated terminal blocks, connector blocks or cable assemblies. Some terminal blocks also determine the available topology. Verify the complete signal path from the module to the instrument and DUT before ordering.<\/p>\r\n\r\n

Check connector type, pinout, wire gauge, insulation, shielding, cable length and electrical ratings. For RF switching, confirm impedance and every connector transition.<\/p>\r\n\r\n

Representative NI PXI Switch Modules<\/h3>\r\n\r\n
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\u041c\u043e\u0434\u0435\u043b\u044c<\/th>\r\n Unique Category<\/th>\r\n Key Differentiator<\/th>\r\n Best Fit<\/th>\r\n <\/tr>\r\n <\/thead>\r\n
PXI-2527<\/a><\/td>\r\n High-Voltage Multiplexer<\/td>\r\n Configurable 64\u00d71 one-wire, 32\u00d71 two-wire or 16\u00d71 four-wire topology with ratings up to 300 V and 2 A<\/td>\r\n DMM channel expansion, high-voltage scanning and two- or four-wire measurements<\/td>\r\n <\/tr>\r\n
PXI-2529<\/a><\/td>\r\n Configurable Low-Offset Matrix<\/td>\r\n 128-crosspoint, two-wire matrix configurable as 4\u00d732 or 8\u00d716 through the selected terminal block<\/td>\r\n Precision low-level routing, functional test and flexible instrument-to-DUT connections<\/td>\r\n <\/tr>\r\n
PXI-2532B<\/a><\/td>\r\n High-Density Reed Matrix<\/td>\r\n 512 reed-relay crosspoints with configurable matrix dimensions and up to 30 MHz switch bandwidth<\/td>\r\n High-density automated signal routing and semiconductor test systems<\/td>\r\n <\/tr>\r\n
PXI-2567<\/a><\/td>\r\n External Relay Driver<\/td>\r\n 64 control channels for driving external relays, relay coils, small DC motors and compatible inductive loads<\/td>\r\n Custom test fixtures and externally located high-power relay assemblies<\/td>\r\n <\/tr>\r\n
PXI-2575<\/a><\/td>\r\n High-Density Scanning Multiplexer<\/td>\r\n Up to 196\u00d71 one-wire or 98\u00d71 two-wire routing with 100 V and 1 A switching capability<\/td>\r\n Large channel-count scanning and production data acquisition<\/td>\r\n <\/tr>\r\n
PXI-2586<\/a><\/td>\r\n High-Current Power Relay<\/td>\r\n Ten independent SPST Form A relay channels rated up to 12 A and 300 V<\/td>\r\n Battery, power-supply, automotive load and control applications<\/td>\r\n <\/tr>\r\n
PXI-2593<\/a><\/td>\r\n Sub-GHz RF Multiplexer<\/td>\r\n Sixteen-channel, 50 \u03a9 RF switching from DC to 500 MHz with configurable 16\u00d71 or dual 8\u00d71 operation<\/td>\r\n Communications, video, RF production and shared-instrument routing<\/td>\r\n <\/tr>\r\n
PXIe-2738<\/a><\/td>\r\n Health-Monitored PXIe Matrix<\/td>\r\n Fixed 8\u00d732 two-wire matrix with 256 crosspoints, fast scanning and supported relay-health diagnostics<\/td>\r\n Long-life production systems requiring dense matrix routing and preventive maintenance<\/td>\r\n <\/tr>\r\n
PXIe-2747<\/a><\/td>\r\n 2.7 GHz RF Multiplexer<\/td>\r\n Two independent 8\u00d71, 50 \u03a9 RF multiplexer banks operating up to 2.7 GHz<\/td>\r\n Multi-DUT RF test, analyzer sharing and automated wireless-device validation<\/td>\r\n <\/tr>\r\n <\/tbody>\r\n <\/table>\r\n <\/div>\r\n\r\n

This table represents major switch architectures rather than every NI legacy or specialized model. Verify the complete part number, topology, electrical limits, accessory requirements and driver support before approving a module.<\/p>\r\n\r\n

Integrating PXI Switches with Measurement Instruments<\/h3>\r\n\r\n

Digital Multimeter Scanning<\/h4>\r\n\r\n

A multiplexer can expand one PXI digital multimeter<\/a> across many DUT channels. The test sequence connects a channel, allows the path to settle, performs the measurement and then advances to the next channel.<\/p>\r\n\r\n

For resistance measurement, confirm whether two-wire or four-wire switching is required. Relay and lead resistance become part of a two-wire measurement.<\/p>\r\n\r\n

DAQ Channel Expansion<\/h4>\r\n\r\n

Switch modules can route multiple low-rate signals into compatible PXI data acquisition modules<\/a>. Confirm that the relay scan rate, signal settling and DAQ acquisition sequence support the required overall channel-update rate.<\/p>\r\n\r\n

SMU and Semiconductor Test<\/h4>\r\n\r\n

Matrix switching can connect several PXI power supplies and SMUs<\/a> to multiple device terminals. Sensitive semiconductor measurements may require special attention to leakage, thermal EMF, guarding, settling and safe discharge before routes change.<\/p>\r\n\r\n

RF Signal Routing<\/h4>\r\n\r\n

RF switches are often paired with PXI RF and wireless instruments<\/a>. The complete path\u2014including the switch, coaxial cables, adapters and fixture\u2014must meet the required frequency, impedance, insertion-loss, isolation and power specifications.<\/p>\r\n\r\n

Hot Switching, Cold Switching and Relay Protection<\/h3>\r\n\r\n
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Operating Method<\/th>\r\n Relay Condition<\/th>\r\n Primary Consideration<\/th>\r\n <\/tr>\r\n <\/thead>\r\n
Cold Switching<\/td>\r\n Relay changes state with little or no voltage or current across the contacts<\/td>\r\n Generally reduces electrical contact wear when supported by the test sequence<\/td>\r\n <\/tr>\r\n
Hot Switching<\/td>\r\n Relay makes or breaks an energized circuit<\/td>\r\n Must remain within switching voltage, current and power ratings<\/td>\r\n <\/tr>\r\n
Carry Only<\/td>\r\n Relay closes before the load is applied and opens after the load is removed<\/td>\r\n Carry ratings still cannot exceed the module, accessory or cable limits<\/td>\r\n <\/tr>\r\n
Inductive Switching<\/td>\r\n Relay controls a motor, solenoid, transformer or relay coil<\/td>\r\n May require suitable transient suppression to control flyback voltage<\/td>\r\n <\/tr>\r\n
Capacitive Switching<\/td>\r\n Relay connects a discharged capacitor or capacitive load<\/td>\r\n Inrush current may exceed the normal steady-state current<\/td>\r\n <\/tr>\r\n <\/tbody>\r\n <\/table>\r\n <\/div>\r\n\r\n

Never assume that a relay\u2019s maximum voltage and maximum current can be switched together. Use the module specifications and load characteristics to determine the allowable operating point.<\/p>\r\n\r\n

Relay Life and Preventive Maintenance<\/h3>\r\n\r\n

Relay-based switch modules are wear components in high-cycle automated systems. Actual service life depends on relay technology, switched voltage, current, power, signal type, switching frequency and environmental conditions.<\/p>\r\n\r\n

Estimate expected relay operations using:<\/p>\r\n\r\n

Expected relay operations = DUT quantity \u00d7 tests per DUT \u00d7 relay operations per test.<\/strong><\/p>\r\n\r\n

Onboard relay-count tracking and supported health-monitoring tools can help plan maintenance. Relay counts indicate usage but do not replace electrical verification of critical signal paths. Production systems may require resistance checks, self-tests or fixture-level validation at defined intervals.<\/p>\r\n\r\n

Software Control and Switch Management<\/h3>\r\n\r\n

NI PXI switches are commonly controlled with the NI-SWITCH instrument driver. Applications can select a topology, connect and disconnect channels, configure scan lists, use hardware triggers and read supported relay-count information.<\/p>\r\n\r\n

NI Switch Executive provides graphical route configuration, channel aliases, route groups and virtual-device management for larger switching systems. It can simplify application maintenance when several modules operate as one logical routing network.<\/p>\r\n\r\n

Switching can be integrated into LabVIEW, TestStand and compatible programming environments. Verify the supported operating system, NI-SWITCH version, Switch Executive version and application API before replacing legacy hardware.<\/p>\r\n\r\n

PXI and PXIe Compatibility<\/h3>\r\n\r\n

Conventional PXI switch modules use a PCI-based backplane connection, while PXI Express switch modules use the PXIe architecture. Some traditional PXI modules use hybrid-compatible connectors and can be installed in suitable PXIe hybrid slots.<\/p>\r\n\r\n

A physical fit does not guarantee complete compatibility. Check:<\/p>\r\n\r\n