{"id":32841,"date":"2026-05-15T13:11:35","date_gmt":"2026-05-15T05:11:35","guid":{"rendered":"https:\/\/pxisource.com\/?post_type=product&#038;p=32841"},"modified":"2026-08-27T12:50:01","modified_gmt":"2026-08-27T04:50:01","slug":"pxie-2514","status":"publish","type":"product","link":"https:\/\/pxisource.com\/ru\/product\/pxie-2514\/","title":{"rendered":"PXIe-2514"},"content":{"rendered":"<h3>Product Introduction<\/h3>\n<p>\nThe <strong>NI PXIe-2514<\/strong> is a PXI Express signal insertion switch module designed for hardware-in-the-loop (HIL) testing, fault insertion, electronic control unit (ECU) validation, automated test equipment, and other applications that require programmable manipulation of signals between a device under test and its normal operating interface.\n<\/p>\n<p>\nThe PXIe-2514 provides <strong>40 independent signal insertion channels<\/strong>. Each channel can be controlled through electromechanical relays to route, interrupt, or redirect signals as part of an automated test sequence.\n<\/p>\n<p>\nThis architecture makes the PXIe-2514 particularly useful for fault-insertion systems where engineers need to simulate conditions such as open circuits, shorts, or externally injected signals without manually changing the wiring between the DUT and the test system.\n<\/p>\n<h3>Product Overview<\/h3>\n<p>\nThe <strong>National Instruments PXIe-2514<\/strong> is designed primarily for signal insertion and fault-injection applications rather than conventional multiplexing or matrix switching.\n<\/p>\n<p>\nIn a typical HIL system, the module is installed between the device under test and the simulated or real electrical interface.\n<\/p>\n<p>\nA simplified architecture is:\n<\/p>\n<p>\n<strong>HIL Simulator \/ System Signal \u2192 PXIe-2514 \u2192 ECU or DUT<\/strong>\n<\/p>\n<p>\nDuring normal operation, the signal can pass through the switch. During a fault test, the PXIe-2514 can change the electrical path according to the programmed test sequence.\n<\/p>\n<p>\nTypical applications include:\n<\/p>\n<ul>\n<li>Hardware-in-the-loop testing<\/li>\n<li>Fault insertion<\/li>\n<li>ECU validation<\/li>\n<li>Automotive electronics testing<\/li>\n<li>Aerospace control-system testing<\/li>\n<li>Industrial controller validation<\/li>\n<li>Automated electronic test<\/li>\n<li>Safety-system validation<\/li>\n<li>Sensor and actuator interface testing<\/li>\n<\/ul>\n<h3>Key Features<\/h3>\n<h4>40 Signal Insertion Channels<\/h4>\n<p>\nThe PXIe-2514 provides <strong>40 independent signal insertion channels<\/strong>.\n<\/p>\n<p>\nThe high channel count allows one module to control many DUT signal paths within an automated test system.\n<\/p>\n<p>\nTypical signals can include:\n<\/p>\n<ul>\n<li>Sensor signals<\/li>\n<li>Control signals<\/li>\n<li>Actuator interfaces<\/li>\n<li>ECU I\/O signals<\/li>\n<li>Industrial control signals<\/li>\n<li>Low-voltage electrical interfaces<\/li>\n<\/ul>\n<h4>Signal Insertion Architecture<\/h4>\n<p>\nA signal insertion switch is designed to sit directly in the signal path between two devices.\n<\/p>\n<p>\nUnder normal operating conditions:\n<\/p>\n<p>\n<strong>Source \u2192 PXIe-2514 \u2192 DUT<\/strong>\n<\/p>\n<p>\nDuring fault simulation, the original signal path can be interrupted or redirected according to the test configuration.\n<\/p>\n<p>\nThis architecture allows faults to be introduced automatically without manually disconnecting wires.\n<\/p>\n<h4>Electromechanical Relay Technology<\/h4>\n<p>\nThe PXIe-2514 uses <strong>electromechanical relay technology<\/strong>.\n<\/p>\n<p>\nElectromechanical relays provide true physical switching of the signal path and are commonly used in fault-insertion systems because of their:\n<\/p>\n<ul>\n<li>Low contact resistance<\/li>\n<li>High isolation<\/li>\n<li>Low leakage<\/li>\n<li>Bidirectional signal capability<\/li>\n<li>Ability to switch AC and DC signals within specification<\/li>\n<li>Physical open-circuit capability<\/li>\n<\/ul>\n<h4>Fault Insertion Capability<\/h4>\n<p>\nOne of the primary applications of the PXIe-2514 is automated <strong>fault insertion<\/strong>.\n<\/p>\n<p>\nA test system can use programmable switching to simulate electrical faults and verify how the DUT responds.\n<\/p>\n<p>\nPossible test scenarios include:\n<\/p>\n<ul>\n<li>Open-circuit simulation<\/li>\n<li>Signal interruption<\/li>\n<li>Signal redirection<\/li>\n<li>Short-to-ground simulation with appropriate external connections<\/li>\n<li>Short-to-power simulation with appropriate external connections<\/li>\n<li>External fault-signal injection<\/li>\n<\/ul>\n<h4>Open-Circuit Simulation<\/h4>\n<p>\nAn open circuit is one of the most common electrical faults tested in automotive and embedded control systems.\n<\/p>\n<p>\nThe PXIe-2514 can disconnect a signal path under software control to reproduce an open-wire condition.\n<\/p>\n<p>\nFor example:\n<\/p>\n<p>\n<strong>Sensor \u2192 [OPEN] \u2192 ECU<\/strong>\n<\/p>\n<p>\nThe test system can then determine whether the ECU correctly identifies the missing or invalid signal.\n<\/p>\n<h4>Short-to-Ground Fault Testing<\/h4>\n<p>\nWhen combined with an appropriately designed external fault-insertion network, the PXIe-2514 can be used as part of a system that simulates a DUT signal being shorted to ground.\n<\/p>\n<p>\nA simplified configuration is:\n<\/p>\n<p>\n<strong>DUT Signal \u2192 PXIe-2514 \u2192 Ground Fault Path<\/strong>\n<\/p>\n<p>\nThe test system can automatically apply the fault, monitor the DUT response, and then restore normal operation.\n<\/p>\n<h4>Short-to-Power Fault Testing<\/h4>\n<p>\nThe PXIe-2514 can also be integrated into systems designed to simulate short-to-power conditions.\n<\/p>\n<p>\nA typical architecture is:\n<\/p>\n<p>\n<strong>DUT Signal \u2192 PXIe-2514 \u2192 External Fault Voltage<\/strong>\n<\/p>\n<p>\nThe external voltage source, current limiting, protection circuitry, and switch electrical ratings must all be selected according to the DUT and test requirements.\n<\/p>\n<h4>Automated Fault Sequences<\/h4>\n<p>\nBecause the module is software controlled, complex fault sequences can be automated.\n<\/p>\n<p>\nFor example:\n<\/p>\n<ol>\n<li>Operate the DUT normally.<\/li>\n<li>Open a selected signal channel.<\/li>\n<li>Monitor the DUT response.<\/li>\n<li>Restore the normal signal.<\/li>\n<li>Apply another programmed fault.<\/li>\n<li>Acquire diagnostic information.<\/li>\n<li>Compare the response against pass\/fail limits.<\/li>\n<li>Continue to the next test condition.<\/li>\n<\/ol>\n<p>\nThis is significantly faster and more repeatable than manually rewiring the DUT for every fault condition.\n<\/p>\n<h4>Independent Channel Control<\/h4>\n<p>\nThe 40 signal insertion channels can be controlled programmatically, allowing the test system to select the required signal paths for each test step.\n<\/p>\n<p>\nThis provides flexibility when testing devices with many independent sensor, actuator, and control connections.\n<\/p>\n<h4>PXI Express Platform<\/h4>\n<p>\nThe PXIe-2514 is designed for the <strong>PXI Express<\/strong> platform.\n<\/p>\n<p>\nPXI Express allows the signal insertion module to operate alongside measurement, stimulus, switching, FPGA, CAN\/LIN, power, and other instrumentation in the same modular automated test system.\n<\/p>\n<h4>NI-SWITCH Driver Support<\/h4>\n<p>\nThe PXIe-2514 can be controlled using the <strong>NI-SWITCH<\/strong> instrument driver.\n<\/p>\n<p>\nNI-SWITCH provides software functions for:\n<\/p>\n<ul>\n<li>Opening switch channels<\/li>\n<li>Closing switch channels<\/li>\n<li>Configuring routes<\/li>\n<li>Automating switching sequences<\/li>\n<li>Querying switch states<\/li>\n<li>Integrating switching with automated test software<\/li>\n<\/ul>\n<h3>Technical Specifications<\/h3>\n<table>\n<tr>\n<th>Parameter<\/th>\n<th>Specification<\/th>\n<\/tr>\n<tr>\n<td width=\"270\">Product Type<\/td>\n<td>PXI Express Signal Insertion Switch Module<\/td>\n<\/tr>\n<tr>\n<td>Model<\/td>\n<td>NI PXIe-2514<\/td>\n<\/tr>\n<tr>\n<td>Platform<\/td>\n<td>PXI Express<\/td>\n<\/tr>\n<tr>\n<td>Signal Insertion Channels<\/td>\n<td>40<\/td>\n<\/tr>\n<tr>\n<td>Switch Technology<\/td>\n<td>Electromechanical Relay<\/td>\n<\/tr>\n<tr>\n<td>Channel Control<\/td>\n<td>Independent, Software Controlled<\/td>\n<\/tr>\n<tr>\n<td>Primary Function<\/td>\n<td>Signal Insertion and Fault Injection<\/td>\n<\/tr>\n<tr>\n<td>Open-Circuit Simulation<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Fault Signal Routing<\/td>\n<td>Supported with Appropriate System Configuration<\/td>\n<\/tr>\n<tr>\n<td>Driver<\/td>\n<td>NI-SWITCH<\/td>\n<\/tr>\n<tr>\n<td>Primary Applications<\/td>\n<td>HIL Test, Fault Injection, ECU Validation and Automated Test<\/td>\n<\/tr>\n<\/table>\n<h3>What Is a Signal Insertion Switch?<\/h3>\n<p>\nA signal insertion switch is installed between the normal source of a signal and the receiving device.\n<\/p>\n<p>\nUnlike a conventional multiplexer that primarily selects one of several signals, a signal insertion switch is designed to manipulate an existing signal path.\n<\/p>\n<p>\nA simplified normal connection is:\n<\/p>\n<p>\n<strong>Sensor \u2192 Signal Insertion Switch \u2192 ECU<\/strong>\n<\/p>\n<p>\nDuring testing, the switch can modify the connection:\n<\/p>\n<p>\n<strong>Sensor \u2192 [OPEN] \u2192 ECU<\/strong>\n<\/p>\n<p>\nor route the ECU input toward an externally configured fault condition.\n<\/p>\n<h3>How Does the PXIe-2514 Work?<\/h3>\n<p>\nThe PXIe-2514 places programmable electromechanical relay contacts into multiple DUT signal paths.\n<\/p>\n<p>\nDuring normal operation, the relays maintain the required connection between the DUT and the rest of the test system.\n<\/p>\n<p>\nWhen a fault test is initiated, software changes the relay configuration to interrupt or redirect the selected signal.\n<\/p>\n<p>\nThe DUT response can then be measured using other PXI instruments.\n<\/p>\n<h3>PXIe-2514 for Hardware-in-the-Loop Testing<\/h3>\n<p>\nThe PXIe-2514 is particularly useful in <strong>hardware-in-the-loop testing<\/strong>.\n<\/p>\n<p>\nA typical HIL system may simulate the environment surrounding an ECU while the real ECU remains connected to the test platform.\n<\/p>\n<p>\nA simplified system can include:\n<\/p>\n<p>\n<strong>Real-Time Model \u2192 FPGA \/ I\/O \u2192 PXIe-2514 \u2192 ECU<\/strong>\n<\/p>\n<p>\nThe PXIe-2514 provides the switching layer required to introduce controlled electrical faults into selected ECU connections.\n<\/p>\n<h3>ECU Fault Injection Testing<\/h3>\n<p>\nElectronic control units must often respond safely to wiring and sensor failures.\n<\/p>\n<p>\nThe PXIe-2514 can help automate validation of ECU diagnostic behavior under simulated electrical fault conditions.\n<\/p>\n<p>\nTypical test conditions may include:\n<\/p>\n<ul>\n<li>Disconnected sensor<\/li>\n<li>Interrupted actuator connection<\/li>\n<li>Open harness connection<\/li>\n<li>Short-to-ground condition<\/li>\n<li>Short-to-supply condition<\/li>\n<li>Incorrect external signal<\/li>\n<li>Intermittent connection<\/li>\n<\/ul>\n<h3>Automotive Electronics Testing<\/h3>\n<p>\nAutomotive systems contain large numbers of sensors, actuators, controllers, and communication interfaces.\n<\/p>\n<p>\nThe PXIe-2514 can be incorporated into automated validation systems for:\n<\/p>\n<ul>\n<li>Engine control modules<\/li>\n<li>Transmission control modules<\/li>\n<li>Body control modules<\/li>\n<li>Battery management systems<\/li>\n<li>Electric vehicle controllers<\/li>\n<li>Motor control units<\/li>\n<li>Powertrain controllers<\/li>\n<li>Electronic steering systems<\/li>\n<li>Industrial vehicle controllers<\/li>\n<\/ul>\n<h3>Sensor Fault Simulation<\/h3>\n<p>\nThe PXIe-2514 can interrupt or redirect compatible sensor signal paths to evaluate DUT behavior when a sensor or wiring connection fails.\n<\/p>\n<p>\nFor example:\n<\/p>\n<p>\n<strong>Normal:<\/strong> Sensor \u2192 ECU\n<\/p>\n<p>\n<strong>Fault:<\/strong> Sensor \u2192 Open Circuit \u2192 ECU\n<\/p>\n<p>\nThe ECU diagnostic response can then be recorded and evaluated automatically.\n<\/p>\n<h3>Actuator Fault Simulation<\/h3>\n<p>\nFault insertion is also useful when validating actuator control circuits.\n<\/p>\n<p>\nA test system can interrupt an actuator-related signal and verify whether the controller detects the fault and responds correctly.\n<\/p>\n<p>\nApplications can include compatible:\n<\/p>\n<ul>\n<li>Solenoid circuits<\/li>\n<li>Relay control signals<\/li>\n<li>Motor-control interfaces<\/li>\n<li>Valve-control circuits<\/li>\n<li>Low-power actuator interfaces<\/li>\n<\/ul>\n<p>\nElectrical limits must always be verified before routing actuator signals through the module.\n<\/p>\n<h3>Intermittent Fault Simulation<\/h3>\n<p>\nSome electrical failures are intermittent rather than permanent.\n<\/p>\n<p>\nAutomated relay control can reproduce repeated connection and disconnection events to evaluate DUT behavior under intermittent wiring conditions.\n<\/p>\n<p>\nFor example:\n<\/p>\n<p>\n<strong>Connected \u2192 Open \u2192 Connected \u2192 Open \u2192 Connected<\/strong>\n<\/p>\n<p>\nThe sequence can be coordinated with measurement and diagnostic equipment to determine whether the DUT detects each event correctly.\n<\/p>\n<h3>Fault Injection vs Conventional Switching<\/h3>\n<table>\n<tr>\n<th>Feature<\/th>\n<th>PXIe-2514 Signal Insertion<\/th>\n<th>Conventional Multiplexer<\/th>\n<\/tr>\n<tr>\n<td>Primary Purpose<\/td>\n<td><strong>Fault Insertion \/ Signal Manipulation<\/strong><\/td>\n<td>Signal Selection<\/td>\n<\/tr>\n<tr>\n<td>Normal Signal Pass-Through<\/td>\n<td><strong>Designed for Signal Paths<\/strong><\/td>\n<td>Topology Dependent<\/td>\n<\/tr>\n<tr>\n<td>Open-Circuit Simulation<\/td>\n<td><strong>Yes<\/strong><\/td>\n<td>Not Primary Function<\/td>\n<\/tr>\n<tr>\n<td>External Fault Routing<\/td>\n<td><strong>Yes, with Appropriate System Design<\/strong><\/td>\n<td>Topology Dependent<\/td>\n<\/tr>\n<tr>\n<td>Typical Application<\/td>\n<td>HIL \/ ECU Fault Testing<\/td>\n<td>Measurement Channel Expansion<\/td>\n<\/tr>\n<\/table>\n<h3>PXIe-2514 vs Matrix Switch<\/h3>\n<p>\nA matrix switch and a signal insertion switch solve different routing problems.\n<\/p>\n<table>\n<tr>\n<th>Feature<\/th>\n<th>PXIe-2514<\/th>\n<th>Matrix Switch<\/th>\n<\/tr>\n<tr>\n<td>Architecture<\/td>\n<td><strong>Signal Insertion<\/strong><\/td>\n<td>Rows \u00d7 Columns<\/td>\n<\/tr>\n<tr>\n<td>Primary Purpose<\/td>\n<td><strong>Fault Injection<\/strong><\/td>\n<td>Flexible Instrument Routing<\/td>\n<\/tr>\n<tr>\n<td>Typical DUT<\/td>\n<td>ECU \/ Controller<\/td>\n<td>Electronic DUT \/ Semiconductor<\/td>\n<\/tr>\n<tr>\n<td>Open-Wire Simulation<\/td>\n<td><strong>Primary Application<\/strong><\/td>\n<td>Possible Depending on Topology<\/td>\n<\/tr>\n<tr>\n<td>Instrument Sharing<\/td>\n<td>Secondary<\/td>\n<td><strong>Primary Application<\/strong><\/td>\n<\/tr>\n<\/table>\n<h3>PXIe-2514 in a Complete HIL System<\/h3>\n<p>\nThe PXIe-2514 can be combined with other <a href=\"https:\/\/pxisource.com\/product-category\/ni\/pxi-systems\/pxi-modules\/\">PXI modules<\/a> to build a complete automated HIL test platform.\n<\/p>\n<p>\nA typical system may include:\n<\/p>\n<ul>\n<li><a href=\"https:\/\/pxisource.com\/product-category\/ni\/pxi-systems\/pxi-chassis\/\">PXI Chassis<\/a><\/li>\n<li><a href=\"https:\/\/pxisource.com\/product-category\/ni\/pxi-systems\/pxi-controller\/\">PXI Controller<\/a><\/li>\n<li>PXIe-2514 Signal Insertion Switch<\/li>\n<li>PXI FPGA \/ Reconfigurable I\/O Modules<\/li>\n<li>PXI Analog Input Modules<\/li>\n<li>PXI Analog Output Modules<\/li>\n<li>PXI CAN \/ LIN Interfaces<\/li>\n<li>PXI Digital I\/O Modules<\/li>\n<li>PXI Programmable Power Supplies<\/li>\n<li>PXI Source Measure Units<\/li>\n<\/ul>\n<p>\nTogether, these instruments can provide simulation, fault insertion, stimulus, measurement, communication, and automated pass\/fail analysis.\n<\/p>\n<h3>Typical HIL Test Architecture<\/h3>\n<p>\nA complete HIL test architecture may be represented as:\n<\/p>\n<p>\n<strong>Real-Time Simulation \u2192 PXI I\/O \u2192 PXIe-2514 \u2192 ECU \u2192 Measurement and Diagnostic System<\/strong>\n<\/p>\n<p>\nThe PXIe-2514 provides the programmable fault-insertion layer between the simulated environment and the ECU.\n<\/p>\n<h3>Using Multiple PXIe-2514 Modules<\/h3>\n<p>\nApplications requiring more than 40 signal insertion channels can use multiple compatible PXIe-2514 modules in a PXI Express system.\n<\/p>\n<p>\nFor example:\n<\/p>\n<table>\n<tr>\n<th>Number of Modules<\/th>\n<th>Nominal Signal Insertion Channels<\/th>\n<\/tr>\n<tr>\n<td>1<\/td>\n<td>40<\/td>\n<\/tr>\n<tr>\n<td>2<\/td>\n<td>80<\/td>\n<\/tr>\n<tr>\n<td>3<\/td>\n<td>120<\/td>\n<\/tr>\n<tr>\n<td>4<\/td>\n<td>160<\/td>\n<\/tr>\n<\/table>\n<p>\nThe actual system configuration depends on chassis capacity, wiring architecture, power requirements, software, and DUT interface design.\n<\/p>\n<h3>Software-Controlled Fault Testing<\/h3>\n<p>\nSoftware control allows fault conditions to be incorporated directly into automated test sequences.\n<\/p>\n<p>\nFor example:\n<\/p>\n<p>\n<strong>Test Step 1:<\/strong> Verify normal DUT operation.<br \/>\n<strong>Test Step 2:<\/strong> Introduce an open circuit.<br \/>\n<strong>Test Step 3:<\/strong> Verify diagnostic response.<br \/>\n<strong>Test Step 4:<\/strong> Restore the connection.<br \/>\n<strong>Test Step 5:<\/strong> Apply the next fault condition.<br \/>\n<strong>Test Step 6:<\/strong> Record pass\/fail results.\n<\/p>\n<p>\nThis provides repeatable fault testing across multiple DUTs and production or validation cycles.\n<\/p>\n<h3>NI-SWITCH Software Integration<\/h3>\n<p>\nThe PXIe-2514 can be integrated into automated test applications using <strong>NI-SWITCH<\/strong>.\n<\/p>\n<p>\nThe driver allows software to control switch states and coordinate fault insertion with other measurement operations.\n<\/p>\n<p>\nApplications can combine switching with:\n<\/p>\n<ul>\n<li>Voltage measurements<\/li>\n<li>Current measurements<\/li>\n<li>Waveform acquisition<\/li>\n<li>Digital I\/O<\/li>\n<li>CAN\/LIN communication<\/li>\n<li>Real-time simulation<\/li>\n<li>Automated diagnostic testing<\/li>\n<\/ul>\n<h3>LabVIEW Integration<\/h3>\n<p>\nLabVIEW applications can incorporate the PXIe-2514 into custom automated test and HIL software.\n<\/p>\n<p>\nA LabVIEW-based test system can:\n<\/p>\n<ul>\n<li>Configure signal routes<\/li>\n<li>Apply fault conditions<\/li>\n<li>Control test sequences<\/li>\n<li>Acquire DUT measurements<\/li>\n<li>Monitor diagnostic responses<\/li>\n<li>Record test results<\/li>\n<li>Generate pass\/fail decisions<\/li>\n<\/ul>\n<h3>TestStand Integration<\/h3>\n<p>\nThe PXIe-2514 can also be incorporated into TestStand-based automated validation systems.\n<\/p>\n<p>\nIndividual test steps can control switching conditions, apply faults, perform measurements, verify DUT behavior, and automatically record results.\n<\/p>\n<p>\nThis approach is particularly useful for standardized ECU validation and production test procedures.\n<\/p>\n<h3>Relay Life Considerations<\/h3>\n<p>\nBecause the PXIe-2514 uses electromechanical relays, relay lifetime should be considered when designing high-volume automated test systems.\n<\/p>\n<p>\nRelay life depends on factors including:\n<\/p>\n<ul>\n<li>Number of switching operations<\/li>\n<li>Signal voltage<\/li>\n<li>Signal current<\/li>\n<li>Load characteristics<\/li>\n<li>Switching frequency<\/li>\n<li>Environmental conditions<\/li>\n<\/ul>\n<p>\nHigh-current or highly reactive loads can reduce relay life compared with low-level signal switching.\n<\/p>\n<h3>Electrical Safety Considerations<\/h3>\n<p>\nBefore connecting a DUT to the PXIe-2514, engineers should verify the complete electrical specifications of the module and accessory configuration.\n<\/p>\n<p>\nImportant considerations include:\n<\/p>\n<ul>\n<li>Maximum switching voltage<\/li>\n<li>Maximum switching current<\/li>\n<li>Maximum switching power<\/li>\n<li>Maximum carry current<\/li>\n<li>Channel-to-channel voltage<\/li>\n<li>Channel-to-ground voltage<\/li>\n<li>Load type<\/li>\n<li>External fault-source voltage<\/li>\n<li>External current limiting<\/li>\n<li>Protection circuitry<\/li>\n<\/ul>\n<p>\nA fault-insertion system should never be designed by considering only one voltage or current specification independently.\n<\/p>\n<h3>How to Choose a Signal Insertion Switch<\/h3>\n<p>\nBefore selecting the PXIe-2514, evaluate:\n<\/p>\n<ul>\n<li>Required number of fault-insertion channels<\/li>\n<li>DUT signal voltage<\/li>\n<li>DUT signal current<\/li>\n<li>Required fault types<\/li>\n<li>Open-circuit requirements<\/li>\n<li>Short-to-ground requirements<\/li>\n<li>Short-to-power requirements<\/li>\n<li>External fault bus architecture<\/li>\n<li>Relay switching speed<\/li>\n<li>Relay lifetime<\/li>\n<li>PXI Express chassis compatibility<\/li>\n<li>Connector and cabling requirements<\/li>\n<li>NI-SWITCH software compatibility<\/li>\n<\/ul>\n<h3>Industries<\/h3>\n<ul>\n<li>Automotive Electronics<\/li>\n<li>Electric Vehicle Testing<\/li>\n<li>Hardware-in-the-Loop Testing<\/li>\n<li>Aerospace and Defense<\/li>\n<li>Industrial Automation<\/li>\n<li>Transportation Electronics<\/li>\n<li>Electronic Manufacturing<\/li>\n<li>Embedded Systems<\/li>\n<li>Research and Development<\/li>\n<\/ul>\n<h3>Applications<\/h3>\n<h4>Hardware-in-the-Loop Testing<\/h4>\n<p>\nThe PXIe-2514 provides programmable signal interruption and fault insertion for HIL systems used to validate real electronic controllers against simulated operating conditions.\n<\/p>\n<h4>ECU Fault Injection<\/h4>\n<p>\nThe module can help automate open-circuit and externally configured electrical fault tests on ECU sensor, actuator, and control connections.\n<\/p>\n<h4>Automotive Validation<\/h4>\n<p>\nThe PXIe-2514 can be integrated into automated validation systems for powertrain, body, battery, motor-control, and other automotive electronic controllers.\n<\/p>\n<h4>Sensor Fault Simulation<\/h4>\n<p>\nSignal paths can be interrupted or redirected to reproduce compatible sensor and wiring failures during automated testing.\n<\/p>\n<h4>Safety-System Validation<\/h4>\n<p>\nControlled fault insertion allows engineers to verify how electronic systems respond when expected electrical connections fail.\n<\/p>\n<h4>Automated Functional Testing<\/h4>\n<p>\nSoftware-controlled switching enables repeatable fault conditions to be incorporated into automated electronic test sequences.\n<\/p>\n<h3>Recommended Related Products<\/h3>\n<table>\n<tr>\n<td width=\"200\">\n<strong>NI PXIe-2514<\/strong>\n<\/td>\n<td>\n40-channel PXI Express signal insertion switch designed for automated fault injection and HIL testing.\n<\/td>\n<\/tr>\n<tr>\n<td>\n<strong>NI PXI\/PXIe Switching Modules<\/strong>\n<\/td>\n<td>\nProgrammable PXI switching solutions for signal insertion, multiplexing, matrix routing, fault injection, and automated test.\n<\/td>\n<\/tr>\n<tr>\n<td>\n<a href=\"https:\/\/pxisource.com\/product\/pxi-2529\/\"><strong>NI PXI-2529<\/strong><\/a>\n<\/td>\n<td>\n128-crosspoint 2-wire matrix switch for flexible routing between measurement instruments and DUT signals.\n<\/td>\n<\/tr>\n<tr>\n<td>\n<a href=\"https:\/\/pxisource.com\/product\/pxie-2532b\/\"><strong>NI PXIe-2532B<\/strong><\/a>\n<\/td>\n<td>\nHigh-density PXI Express matrix switch for automated test systems requiring a large number of programmable routing crosspoints.\n<\/td>\n<\/tr>\n<tr>\n<td>\n<a href=\"https:\/\/pxisource.com\/product-category\/ni\/pxi-systems\/pxi-modules\/\"><strong>NI PXI Modules<\/strong><\/a>\n<\/td>\n<td>\nPXI and PXI Express instrumentation for switching, data acquisition, FPGA processing, source measurement, RF testing, and automated validation.\n<\/td>\n<\/tr>\n<\/table>\n<h3>Why Choose NI PXIe-2514?<\/h3>\n<ul>\n<li>40 signal insertion channels<\/li>\n<li>PXI Express platform<\/li>\n<li>Electromechanical relay architecture<\/li>\n<li>Programmable signal interruption<\/li>\n<li>Open-circuit fault simulation<\/li>\n<li>External fault signal routing capability<\/li>\n<li>Independent software-controlled switching<\/li>\n<li>Designed for HIL test systems<\/li>\n<li>Suitable for ECU fault injection<\/li>\n<li>Suitable for automotive validation<\/li>\n<li>Suitable for sensor and actuator fault testing<\/li>\n<li>NI-SWITCH software support<\/li>\n<li>Integration with LabVIEW and automated test software<\/li>\n<li>Scalable using multiple modules<\/li>\n<\/ul>\n<h3>Frequently Asked Questions<\/h3>\n<h4>What is the NI PXIe-2514?<\/h4>\n<p>\nThe NI PXIe-2514 is a 40-channel PXI Express signal insertion switch module designed primarily for automated fault insertion, HIL testing, ECU validation, and electronic system testing.\n<\/p>\n<h4>How many channels does the PXIe-2514 have?<\/h4>\n<p>\nThe PXIe-2514 provides <strong>40 signal insertion channels<\/strong>.\n<\/p>\n<h4>What is a signal insertion switch?<\/h4>\n<p>\nA signal insertion switch is installed in an existing electrical signal path and allows software to maintain, interrupt, or redirect that path. It is commonly used for automated fault-injection testing.\n<\/p>\n<h4>Can the PXIe-2514 simulate an open circuit?<\/h4>\n<p>\nYes. Opening the appropriate relay path allows the PXIe-2514 to reproduce an open-circuit or disconnected-wire condition on a compatible DUT signal.\n<\/p>\n<h4>Can the PXIe-2514 simulate a short to ground?<\/h4>\n<p>\nThe PXIe-2514 can be incorporated into a properly designed fault-insertion system that routes a selected signal toward a ground fault path. The complete electrical configuration must remain within the module and system ratings.\n<\/p>\n<h4>Can the PXIe-2514 simulate a short to power?<\/h4>\n<p>\nYes, as part of an appropriately designed external fault-insertion architecture. External voltage sources, protection, current limiting, and all switch ratings must be considered.\n<\/p>\n<h4>Can the PXIe-2514 be used for HIL testing?<\/h4>\n<p>\nYes. Hardware-in-the-loop fault insertion is one of the primary applications for the PXIe-2514.\n<\/p>\n<h4>Can the PXIe-2514 be used for ECU testing?<\/h4>\n<p>\nYes. The module is particularly useful for ECU validation where automated tests must reproduce wiring, sensor, and other electrical fault conditions.\n<\/p>\n<h4>Does the PXIe-2514 use solid-state or electromechanical relays?<\/h4>\n<p>\nThe PXIe-2514 uses <strong>electromechanical relays<\/strong>.\n<\/p>\n<h4>What driver is used with the PXIe-2514?<\/h4>\n<p>\nThe PXIe-2514 is controlled using the <strong>NI-SWITCH<\/strong> driver.\n<\/p>\n<h4>Can I use multiple PXIe-2514 modules?<\/h4>\n<p>\nYes. Multiple modules can be installed in a compatible PXI Express system when more than 40 signal insertion channels are required.\n<\/p>\n<h4>Can the PXIe-2514 be used with LabVIEW?<\/h4>\n<p>\nYes. It can be incorporated into LabVIEW-based automated test and HIL applications through compatible NI driver software.\n<\/p>\n<h4>Can the PXIe-2514 be used with TestStand?<\/h4>\n<p>\nYes. Switching and fault-insertion operations can be incorporated into TestStand-based automated test sequences through the appropriate software architecture.\n<\/p>\n<h4>What is the difference between the PXIe-2514 and a matrix switch?<\/h4>\n<p>\nThe PXIe-2514 is optimized for signal insertion and fault simulation in existing DUT signal paths. A matrix switch is primarily designed to create flexible connections between multiple instrument rows and DUT columns.\n<\/p>\n<h4>Is the PXIe-2514 suitable for automotive testing?<\/h4>\n<p>\nYes. Typical applications include automotive ECU validation, HIL testing, sensor fault simulation, actuator interface testing, and electric vehicle controller validation.\n<\/p>\n<h4>What should I check before purchasing a PXIe-2514?<\/h4>\n<p>\nBefore purchasing the PXIe-2514, verify the required channel count, DUT voltage and current levels, fault types, external fault-bus requirements, switching power, relay life, connector and cabling requirements, PXI Express chassis compatibility, NI-SWITCH compatibility, and the exact NI ordering configuration.\n<\/p>\n<h3>Conclusion<\/h3>\n<p>\nThe <strong>NI PXIe-2514 40-Channel PXI Express Signal Insertion Switch Module<\/strong> provides programmable signal interruption and routing for hardware-in-the-loop testing, fault injection, ECU validation, and automated electronic test systems. Its 40 independent signal insertion channels and electromechanical relay architecture allow engineers to automate open-circuit and externally configured fault conditions while integrating the switching system with other PXI measurement, simulation, communication, and stimulus hardware.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>\u0428\u0438\u043d\u043d\u044b\u0439 \u0441\u043e\u0435\u0434\u0438\u043d\u0438\u0442\u0435\u043b\u044c: PXI Express<br \/>\nMaximum Switching Current DC: 4 A<br \/>\nMaximum Switching Voltage DC: 28 V<br \/>\n\u0422\u0438\u043f \u0440\u0435\u043b\u0435: \u041f\u043e\u043b\u0435\u0432\u043e\u0439 \u0442\u0440\u0430\u043d\u0437\u0438\u0441\u0442\u043e\u0440<br \/>\n\u041a\u043e\u043b\u0438\u0447\u0435\u0441\u0442\u0432\u043e \u043a\u0430\u043d\u0430\u043b\u043e\u0432: 7<br \/>\n\u041f\u0440\u043e\u043f\u0443\u0441\u043a\u043d\u0430\u044f \u0441\u043f\u043e\u0441\u043e\u0431\u043d\u043e\u0441\u0442\u044c \u043a\u043e\u043c\u043c\u0443\u0442\u0430\u0442\u043e\u0440\u0430: 80 \u043a\u0413\u0446<\/p>","protected":false},"featured_media":32719,"template":"","meta":{"_acf_changed":false},"product_brand":[18],"product_cat":[725],"product_tag":[],"class_list":["post-32841","product","type-product","status-publish","has-post-thumbnail","product_brand-national-instruments","product_cat-pxi-switches","first","instock","shipping-taxable","purchasable","product-type-simple"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v25.0 (Yoast SEO v28.1) - https:\/\/yoast.com\/product\/yoast-seo-premium-wordpress\/ -->\n<title>NI PXIe-2514 PXI Signal Insertion Switch Module 780587-14, In Stock | Project Pricing<\/title>\n<meta name=\"description\" content=\"NI PXIe-2514 is a 40-channel PXI Express signal insertion switch module designed for fault injection, HIL testing, ECU validation and automated test systems.\" \/>\n<meta name=\"robots\" content=\"index, follow, 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