{"id":32693,"date":"2026-05-12T09:46:38","date_gmt":"2026-05-12T01:46:38","guid":{"rendered":"https:\/\/pxisource.com\/?post_type=product&#038;p=32693"},"modified":"2026-08-25T20:18:11","modified_gmt":"2026-08-25T12:18:11","slug":"pxie-s5090","status":"publish","type":"product","link":"https:\/\/pxisource.com\/ru\/product\/pxie-s5090\/","title":{"rendered":"PXIe-S5090"},"content":{"rendered":"<h3>Product Introduction<\/h3>\n<p>\n\u0417\u0435\u043c\u043b\u044f <strong>NI PXIe-S5090<\/strong> is a 2-port PXI Express Vector Network Analyzer (VNA) designed for RF component characterization, S-parameter measurement, automated design validation, and production test applications.\n<\/p>\n<p>\nThe PXIe-S5090 provides a wide <strong>300 kHz to 9 GHz frequency range<\/strong> and a dynamic range of up to <strong>138 dB<\/strong>, enabling accurate characterization of RF and microwave devices across a broad range of applications.\n<\/p>\n<p>\nAs a 2-port vector network analyzer, the PXIe-S5090 can measure amplitude, phase, and impedance and calculate the complete set of two-port S-parameters, including <strong>S11, S21, S12, and S22<\/strong>.\n<\/p>\n<p>\nIts PXI Express architecture makes the PXIe-S5090 particularly suitable for automated RF test systems where VNA measurements must be combined with additional PXI instruments, automated switching, DUT control, and software-based test sequencing.\n<\/p>\n<h3>Product Overview<\/h3>\n<p>\n\u0417\u0435\u043c\u043b\u044f <strong>National Instruments PXIe-S5090<\/strong> is a modular Vector Network Analyzer developed for RF and microwave measurement applications requiring wide frequency coverage, high dynamic range, and automated measurement capability.\n<\/p>\n<p>\nThe instrument covers frequencies from 300 kHz to 9 GHz and provides two 50 \u03a9 test ports with 3.5 mm female RF connectors.\n<\/p>\n<p>\nUnlike scalar measurement instruments that primarily measure signal magnitude, a vector network analyzer measures both magnitude and phase. This allows the PXIe-S5090 to provide comprehensive characterization of RF devices such as filters, amplifiers, antennas, cables, attenuators, couplers, and other two-port networks.\n<\/p>\n<h3>Key Features<\/h3>\n<h4>300 kHz to 9 GHz Frequency Range<\/h4>\n<p>\nThe PXIe-S5090 provides a frequency range from <strong>300 kHz to 9 GHz<\/strong>, allowing one instrument to characterize devices across a broad RF and microwave spectrum.\n<\/p>\n<ul>\n<li>300 kHz minimum frequency<\/li>\n<li>9 GHz maximum frequency<\/li>\n<li>Broad RF and microwave coverage<\/li>\n<li>Low-frequency network measurements<\/li>\n<li>GHz-range RF component characterization<\/li>\n<li>Automated broadband testing<\/li>\n<\/ul>\n<p>\n<strong>Advantage:<\/strong> The wide frequency range allows engineers to characterize many different RF components without changing measurement platforms.\n<\/p>\n<h4>2-Port Vector Network Analyzer<\/h4>\n<p>\nThe PXIe-S5090 provides <strong>two 50 \u03a9 RF test ports<\/strong> for complete two-port network characterization.\n<\/p>\n<p>\nThe instrument can measure:\n<\/p>\n<ul>\n<li>S11 \u2013 Input reflection<\/li>\n<li>S21 \u2013 Forward transmission<\/li>\n<li>S12 \u2013 Reverse transmission<\/li>\n<li>S22 \u2013 Output reflection<\/li>\n<\/ul>\n<p>\nThese measurements provide detailed information about how an RF device reflects and transmits signals in both directions.\n<\/p>\n<h4>Complete S-Parameter Measurements<\/h4>\n<p>\nS-parameters are among the most important measurements for characterizing RF and microwave components.\n<\/p>\n<table>\n<tr>\n<th>S-Parameter<\/th>\n<th>Measurement<\/th>\n<th>\u0422\u0438\u043f\u0438\u0447\u043d\u043e\u0435 \u0438\u0441\u043f\u043e\u043b\u044c\u0437\u043e\u0432\u0430\u043d\u0438\u0435<\/th>\n<\/tr>\n<tr>\n<td>S11<\/td>\n<td>Input Reflection<\/td>\n<td>Input Return Loss \/ VSWR<\/td>\n<\/tr>\n<tr>\n<td>S21<\/td>\n<td>Forward Transmission<\/td>\n<td>Gain \/ Insertion Loss<\/td>\n<\/tr>\n<tr>\n<td>S12<\/td>\n<td>Reverse Transmission<\/td>\n<td>Reverse Isolation<\/td>\n<\/tr>\n<tr>\n<td>S22<\/td>\n<td>Output Reflection<\/td>\n<td>Output Return Loss \/ VSWR<\/td>\n<\/tr>\n<\/table>\n<p>\nThe PXIe-S5090 can measure all four parameters required for full two-port RF network characterization.\n<\/p>\n<h4>Up to 138 dB Dynamic Range<\/h4>\n<p>\nThe PXIe-S5090 provides a wide dynamic range reaching <strong>138 dB<\/strong> over a significant portion of its operating frequency range.\n<\/p>\n<p>\nWide dynamic range is particularly important when measuring RF components with high rejection or attenuation.\n<\/p>\n<ul>\n<li>Filter stopband measurements<\/li>\n<li>High-isolation component testing<\/li>\n<li>Low-level transmission measurements<\/li>\n<li>High-rejection RF characterization<\/li>\n<li>Precision production testing<\/li>\n<\/ul>\n<h4>Wide Output Power Adjustment Range<\/h4>\n<p>\nThe PXIe-S5090 provides adjustable RF output power, allowing engineers to optimize stimulus levels according to DUT requirements.\n<\/p>\n<p>\nDepending on frequency, the instrument supports output levels extending from approximately <strong>-45 dBm to as high as +13 dBm<\/strong>.\n<\/p>\n<table>\n<tr>\n<th>\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u0447\u0430\u0441\u0442\u043e\u0442<\/th>\n<th>Specified Output Power Range<\/th>\n<\/tr>\n<tr>\n<td>300 kHz to 6.5 GHz<\/td>\n<td>-45 dBm to +13 dBm<\/td>\n<\/tr>\n<tr>\n<td>6.5 GHz to 8 GHz<\/td>\n<td>-45 dBm to +10 dBm<\/td>\n<\/tr>\n<tr>\n<td>8 GHz to 9 GHz<\/td>\n<td>-45 dBm to +5 dBm<\/td>\n<\/tr>\n<\/table>\n<p>\n<strong>Advantage:<\/strong> Adjustable source power helps engineers characterize both sensitive devices and components requiring stronger RF stimulus.\n<\/p>\n<h4>1 Hz Frequency Resolution<\/h4>\n<p>\nThe PXIe-S5090 provides <strong>1 Hz frequency resolution<\/strong>, allowing precise definition of measurement frequencies and sweep points.\n<\/p>\n<ul>\n<li>1 Hz frequency resolution<\/li>\n<li>Fine frequency sweeps<\/li>\n<li>Narrowband device characterization<\/li>\n<li>Detailed resonance measurements<\/li>\n<li>Precision RF analysis<\/li>\n<\/ul>\n<h4>Up to 500,001 Measurement Points<\/h4>\n<p>\nThe PXIe-S5090 supports from <strong>2 to 500,001 measurement points<\/strong>.\n<\/p>\n<p>\nHigh point density allows engineers to characterize complex frequency responses with very fine frequency spacing.\n<\/p>\n<p>\nThis capability is particularly useful for:\n<\/p>\n<ul>\n<li>High-resolution filter characterization<\/li>\n<li>Resonance analysis<\/li>\n<li>Wideband frequency sweeps<\/li>\n<li>Detailed insertion-loss measurements<\/li>\n<li>Time-domain transformations<\/li>\n<\/ul>\n<h4>Fast Measurement Speed<\/h4>\n<p>\nThe PXIe-S5090 is designed for fast automated measurements and provides a typical minimum measurement time of approximately <strong>16 \u03bcs per point<\/strong> under applicable operating conditions.\n<\/p>\n<p>\nFast sweep performance is particularly valuable in production environments where RF measurements must be repeated across large numbers of devices.\n<\/p>\n<h4>1 Hz to 1 MHz Measurement Bandwidth<\/h4>\n<p>\nThe PXIe-S5090 provides selectable measurement bandwidths from <strong>1 Hz to 1 MHz<\/strong>.\n<\/p>\n<p>\nNarrower bandwidths can reduce measurement noise and improve dynamic range, while wider bandwidths can increase measurement speed.\n<\/p>\n<p>\nThis allows engineers to balance:\n<\/p>\n<ul>\n<li>Measurement speed<\/li>\n<li>Noise performance<\/li>\n<li>Dynamic range<\/li>\n<li>Measurement repeatability<\/li>\n<\/ul>\n<h4>50 \u03a9 RF Test Ports<\/h4>\n<p>\nBoth PXIe-S5090 RF test ports use a <strong>50 \u041e\u043c \u0441\u043e\u043f\u0440\u043e\u0442\u0438\u0432\u043b\u0435\u043d\u0438\u0435<\/strong>, matching the standard impedance used by most RF and microwave measurement systems.\n<\/p>\n<ul>\n<li>2 RF test ports<\/li>\n<li>50 \u041e\u043c \u0441\u043e\u043f\u0440\u043e\u0442\u0438\u0432\u043b\u0435\u043d\u0438\u0435<\/li>\n<li>3.5 mm female connectors<\/li>\n<li>Suitable for RF and microwave DUTs<\/li>\n<\/ul>\n<h4>Automatic Precision Calibration<\/h4>\n<p>\nThe PXIe-S5090 supports multiple precision calibration methods and automatic calibration capabilities.\n<\/p>\n<p>\nVNA calibration compensates for systematic measurement errors introduced by the analyzer, cables, adapters, and test fixture.\n<\/p>\n<p>\nProper calibration improves:\n<\/p>\n<ul>\n<li>Directivity<\/li>\n<li>Source match<\/li>\n<li>Load match<\/li>\n<li>Reflection tracking<\/li>\n<li>Transmission tracking<\/li>\n<\/ul>\n<h4>Reference Plane Extension<\/h4>\n<p>\nThe PXIe-S5090 supports reference plane extension, allowing the effective measurement reference plane to be shifted electrically.\n<\/p>\n<p>\nThis can help compensate for electrical delay introduced by cables, adapters, fixtures, and other elements between the analyzer and DUT.\n<\/p>\n<h4>Time-Domain Analysis<\/h4>\n<p>\nIn addition to conventional frequency-domain measurements, the PXIe-S5090 supports <strong>time-domain analysis<\/strong>.\n<\/p>\n<p>\nFrequency-domain measurement data can be mathematically transformed into the time domain to help locate impedance discontinuities and other physical characteristics.\n<\/p>\n<p>\n\u0422\u0438\u043f\u0438\u0447\u043d\u044b\u0435 \u043f\u0440\u0438\u043c\u0435\u043d\u0435\u043d\u0438\u044f \u0432\u043a\u043b\u044e\u0447\u0430\u044e\u0442:\n<\/p>\n<ul>\n<li>Cable fault location<\/li>\n<li>Connector discontinuity analysis<\/li>\n<li>Fixture characterization<\/li>\n<li>RF path troubleshooting<\/li>\n<li>Filter time-delay analysis<\/li>\n<\/ul>\n<h4>Time-Domain Gating<\/h4>\n<p>\nTime-domain gating can mathematically remove unwanted responses from selected portions of the measurement.\n<\/p>\n<p>\nAfter unwanted responses are removed in the time domain, the measurement can be transformed back into the frequency domain.\n<\/p>\n<p>\nThis capability can help reduce the influence of:\n<\/p>\n<ul>\n<li>Adapters<\/li>\n<li>Connectors<\/li>\n<li>Test fixtures<\/li>\n<li>Unwanted reflections<\/li>\n<li>Specific discontinuities<\/li>\n<\/ul>\n<h3>Technical Specifications<\/h3>\n<table>\n<tr>\n<th>\u041f\u0430\u0440\u0430\u043c\u0435\u0442\u0440<\/th>\n<th>\u041e\u043f\u0438\u0441\u0430\u043d\u0438\u0435<\/th>\n<\/tr>\n<tr>\n<td width=\"230\">Product Type<\/td>\n<td>PXI Express Vector Network Analyzer<\/td>\n<\/tr>\n<tr>\n<td>\u041c\u043e\u0434\u0435\u043b\u044c<\/td>\n<td>NI PXIe-S5090<\/td>\n<\/tr>\n<tr>\n<td>Part Number<\/td>\n<td>787251-01<\/td>\n<\/tr>\n<tr>\n<td>\u0428\u0438\u043d\u043d\u044b\u0439 \u0438\u043d\u0442\u0435\u0440\u0444\u0435\u0439\u0441<\/td>\n<td>PXI Express<\/td>\n<\/tr>\n<tr>\n<td>Number of VNA Ports<\/td>\n<td>2<\/td>\n<\/tr>\n<tr>\n<td>\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u0447\u0430\u0441\u0442\u043e\u0442<\/td>\n<td>300 kHz to 9 GHz<\/td>\n<\/tr>\n<tr>\n<td>Frequency Resolution<\/td>\n<td>1 Hz<\/td>\n<\/tr>\n<tr>\n<td>Frequency Accuracy<\/td>\n<td>\u00b15 \u00d7 10\u207b\u2076<\/td>\n<\/tr>\n<tr>\n<td>Maximum Dynamic Range<\/td>\n<td>138 dB<\/td>\n<\/tr>\n<tr>\n<td>Maximum Output Power<\/td>\n<td>+13 dBm<\/td>\n<\/tr>\n<tr>\n<td>Minimum Output Power<\/td>\n<td>-45 dBm<\/td>\n<\/tr>\n<tr>\n<td>Measurement Bandwidth<\/td>\n<td>1 Hz to 1 MHz<\/td>\n<\/tr>\n<tr>\n<td>Measurement Points<\/td>\n<td>2 to 500,001<\/td>\n<\/tr>\n<tr>\n<td>Typical Minimum Measurement Time<\/td>\n<td>16 \u03bcs per Point<\/td>\n<\/tr>\n<tr>\n<td>Test Port Impedance<\/td>\n<td>50 \u03a9<\/td>\n<\/tr>\n<tr>\n<td>Test Port Connector<\/td>\n<td>3.5 mm Female<\/td>\n<\/tr>\n<tr>\n<td>S-Parameters<\/td>\n<td>S11, S21, S12, S22<\/td>\n<\/tr>\n<tr>\n<td>Time-Domain Analysis<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Time-Domain Gating<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Automatic Calibration<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Reference Plane Extension<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Primary Applications<\/td>\n<td>RF Component Characterization, S-Parameter Measurement, Design Validation and Production Test<\/td>\n<\/tr>\n<\/table>\n<h3>What Is a Vector Network Analyzer?<\/h3>\n<p>\nA Vector Network Analyzer is an RF measurement instrument used to characterize how a device responds to RF signals over frequency.\n<\/p>\n<p>\nUnlike a spectrum analyzer, which primarily measures the spectral content of signals, a VNA generates a controlled stimulus and measures both the magnitude and phase of reflected and transmitted signals.\n<\/p>\n<p>\nThis enables engineers to determine parameters including:\n<\/p>\n<ul>\n<li>Return loss<\/li>\n<li>Insertion loss<\/li>\n<li>Gain<\/li>\n<li>\u0418\u0437\u043e\u043b\u044f\u0446\u0438\u044f<\/li>\n<li>VSWR<\/li>\n<li>Impedance<\/li>\n<li>Phase<\/li>\n<li>Group delay<\/li>\n<li>S-parameters<\/li>\n<\/ul>\n<h3>Understanding S11<\/h3>\n<p>\n<strong>S11<\/strong> describes how much of the RF signal applied to Port 1 is reflected back toward Port 1.\n<\/p>\n<p>\nS11 measurements are commonly used to evaluate:\n<\/p>\n<ul>\n<li>Input return loss<\/li>\n<li>Input impedance matching<\/li>\n<li>VSWR<\/li>\n<li>Antenna matching<\/li>\n<li>Filter input matching<\/li>\n<\/ul>\n<h3>Understanding S21<\/h3>\n<p>\n<strong>S21<\/strong> describes signal transmission from Port 1 to Port 2.\n<\/p>\n<p>\nDepending on the DUT, S21 can be used to determine:\n<\/p>\n<ul>\n<li>Insertion loss<\/li>\n<li>Forward gain<\/li>\n<li>Filter transmission response<\/li>\n<li>Cable loss<\/li>\n<li>Amplifier gain<\/li>\n<\/ul>\n<h3>Understanding S12<\/h3>\n<p>\n<strong>S12<\/strong> measures reverse transmission from Port 2 to Port 1.\n<\/p>\n<p>\nIt is particularly useful for evaluating:\n<\/p>\n<ul>\n<li>Reverse isolation<\/li>\n<li>Amplifier reverse transmission<\/li>\n<li>Directional device behavior<\/li>\n<li>Two-port network reciprocity<\/li>\n<\/ul>\n<h3>Understanding S22<\/h3>\n<p>\n<strong>S22<\/strong> represents the reflection measured at Port 2.\n<\/p>\n<p>\n\u0422\u0438\u043f\u0438\u0447\u043d\u044b\u0435 \u043f\u0440\u0438\u043c\u0435\u043d\u0435\u043d\u0438\u044f \u0432\u043a\u043b\u044e\u0447\u0430\u044e\u0442:\n<\/p>\n<ul>\n<li>Output return loss<\/li>\n<li>Output impedance matching<\/li>\n<li>Output VSWR<\/li>\n<li>Amplifier output characterization<\/li>\n<\/ul>\n<h3>RF Filter Testing<\/h3>\n<p>\nRF filters are one of the most common devices characterized using the PXIe-S5090.\n<\/p>\n<p>\nA complete filter measurement can evaluate:\n<\/p>\n<ul>\n<li>Insertion loss<\/li>\n<li>Passband response<\/li>\n<li>Stopband rejection<\/li>\n<li>Return loss<\/li>\n<li>\u041f\u0440\u043e\u043f\u0443\u0441\u043a\u043d\u0430\u044f \u0441\u043f\u043e\u0441\u043e\u0431\u043d\u043e\u0441\u0442\u044c<\/li>\n<li>Center frequency<\/li>\n<li>Phase response<\/li>\n<li>Group delay<\/li>\n<\/ul>\n<p>\nThe PXIe-S5090&#8217;s wide dynamic range is particularly useful for measuring the high attenuation levels present in filter stopbands.\n<\/p>\n<h3>Amplifier Characterization<\/h3>\n<p>\nThe PXIe-S5090 can characterize compatible RF amplifiers using forward and reverse S-parameter measurements.\n<\/p>\n<p>\nTypical measurements include:\n<\/p>\n<ul>\n<li>Forward gain<\/li>\n<li>Input return loss<\/li>\n<li>Output return loss<\/li>\n<li>Reverse isolation<\/li>\n<li>Phase response<\/li>\n<li>Frequency response<\/li>\n<\/ul>\n<h3>Antenna Measurements<\/h3>\n<p>\nThe PXIe-S5090 can perform reflection measurements for compatible antenna systems.\n<\/p>\n<p>\nTypical antenna measurements include:\n<\/p>\n<ul>\n<li>S11<\/li>\n<li>Return loss<\/li>\n<li>VSWR<\/li>\n<li>Resonant frequency<\/li>\n<li>Impedance<\/li>\n<li>Smith chart analysis<\/li>\n<\/ul>\n<h3>Cable and Connector Testing<\/h3>\n<p>\nThe PXIe-S5090 can characterize RF cables, connectors, adapters, and transmission paths.\n<\/p>\n<ul>\n<li>Insertion loss<\/li>\n<li>Return loss<\/li>\n<li>VSWR<\/li>\n<li>Phase<\/li>\n<li>Group delay<\/li>\n<li>Impedance discontinuities<\/li>\n<\/ul>\n<p>\nTime-domain analysis can provide additional insight into the physical location of reflections and discontinuities along a transmission path.\n<\/p>\n<h3>Smith Chart Measurements<\/h3>\n<p>\nThe PXIe-S5090 software supports Smith chart display for visualizing complex reflection coefficients and impedance.\n<\/p>\n<p>\nSmith charts are commonly used for:\n<\/p>\n<ul>\n<li>Impedance matching<\/li>\n<li>Antenna tuning<\/li>\n<li>RF circuit design<\/li>\n<li>Matching-network optimization<\/li>\n<li>Reflection analysis<\/li>\n<\/ul>\n<h3>Group Delay Measurements<\/h3>\n<p>\nGroup delay describes the time delay experienced by different frequency components as they pass through a device.\n<\/p>\n<p>\nIt is particularly important when characterizing:\n<\/p>\n<ul>\n<li>RF filters<\/li>\n<li>Communication components<\/li>\n<li>Transmission networks<\/li>\n<li>Wideband RF devices<\/li>\n<\/ul>\n<h3>Automated Production Testing<\/h3>\n<p>\nThe PXIe-S5090 is particularly suitable for automated RF production test systems.\n<\/p>\n<p>\nA typical automated test sequence can operate as follows:\n<\/p>\n<ol>\n<li>Connect or switch the DUT into the RF test path.<\/li>\n<li>Configure the required VNA frequency sweep.<\/li>\n<li>Set source power and measurement bandwidth.<\/li>\n<li>Acquire S-parameter measurements.<\/li>\n<li>Calculate RF performance parameters.<\/li>\n<li>Compare measurements against test limits.<\/li>\n<li>Generate a pass\/fail result.<\/li>\n<li>Store the measurement data.<\/li>\n<\/ol>\n<p>\nFast measurement speed and PXI integration can reduce overall test time in high-volume manufacturing environments.\n<\/p>\n<h3>Automated Design Validation<\/h3>\n<p>\nDuring RF product development, engineers often need to characterize devices across many frequencies, power levels, temperatures, and operating conditions.\n<\/p>\n<p>\nThe PXIe-S5090 can automate these measurement sequences and collect large quantities of RF characterization data.\n<\/p>\n<ul>\n<li>Frequency sweeps<\/li>\n<li>Power sweeps<\/li>\n<li>Temperature characterization<\/li>\n<li>Component comparison<\/li>\n<li>Design verification<\/li>\n<li>Regression testing<\/li>\n<\/ul>\n<h3>PXIe-S5090 in a PXI RF Test System<\/h3>\n<p>\nThe PXIe-S5090 can operate as the vector network analysis instrument within a larger PXI RF test platform.\n<\/p>\n<p>\nA complete system may include:\n<\/p>\n<ul>\n<li>PXI Express chassis<\/li>\n<li>PXI embedded or remote controller<\/li>\n<li>PXIe-S5090 Vector Network Analyzer<\/li>\n<li>PXI RF switch modules<\/li>\n<li>RF signal generators<\/li>\n<li>RF signal analyzers<\/li>\n<li>Programmable power supplies<\/li>\n<li>Digital I\/O modules<\/li>\n<li>Automated DUT fixtures<\/li>\n<\/ul>\n<p>\nThe modular architecture allows VNA measurements to be integrated with DUT control, switching, power, and additional RF measurements.\n<\/p>\n<h3>PXIe-S5090 vs Benchtop VNA<\/h3>\n<table>\n<tr>\n<th>\u0424\u0443\u043d\u043a\u0446\u0438\u044f<\/th>\n<th>PXIe-S5090<\/th>\n<th>Traditional Benchtop VNA<\/th>\n<\/tr>\n<tr>\n<td>Form Factor<\/td>\n<td>PXI Express Module<\/td>\n<td>Standalone Instrument<\/td>\n<\/tr>\n<tr>\n<td>\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u0447\u0430\u0441\u0442\u043e\u0442<\/td>\n<td>300 kHz to 9 GHz<\/td>\n<td>Model Dependent<\/td>\n<\/tr>\n<tr>\n<td>Number of Ports<\/td>\n<td>2<\/td>\n<td>Model Dependent<\/td>\n<\/tr>\n<tr>\n<td>Automation<\/td>\n<td>Designed for Automated Test<\/td>\n<td>Supported, Model Dependent<\/td>\n<\/tr>\n<tr>\n<td>PXI Integration<\/td>\n<td>Native<\/td>\n<td>External Interface Required<\/td>\n<\/tr>\n<tr>\n<td>System Expansion<\/td>\n<td>Modular<\/td>\n<td>Requires Additional Instruments<\/td>\n<\/tr>\n<tr>\n<td>Production Integration<\/td>\n<td>Highly Suitable<\/td>\n<td>Application Dependent<\/td>\n<\/tr>\n<tr>\n<td>Best Application<\/td>\n<td>Automated Modular RF Test<\/td>\n<td>Interactive Bench Measurements<\/td>\n<\/tr>\n<\/table>\n<h3>PXIe-S5090 vs Spectrum Analyzer<\/h3>\n<table>\n<tr>\n<th>\u0424\u0443\u043d\u043a\u0446\u0438\u044f<\/th>\n<th>PXIe-S5090 VNA<\/th>\n<th>\u0410\u043d\u0430\u043b\u0438\u0437\u0430\u0442\u043e\u0440 \u0441\u043f\u0435\u043a\u0442\u0440\u0430<\/th>\n<\/tr>\n<tr>\n<td>Primary Measurement<\/td>\n<td>Network Response<\/td>\n<td>Signal Spectrum<\/td>\n<\/tr>\n<tr>\n<td>Generates Test Stimulus<\/td>\n<td>\u0414\u0430<\/td>\n<td>Typically No<\/td>\n<\/tr>\n<tr>\n<td>Measures Magnitude<\/td>\n<td>\u0414\u0430<\/td>\n<td>\u0414\u0430<\/td>\n<\/tr>\n<tr>\n<td>Measures Phase<\/td>\n<td>\u0414\u0430<\/td>\n<td>Application Dependent<\/td>\n<\/tr>\n<tr>\n<td>S11 \/ S21 \/ S12 \/ S22<\/td>\n<td>\u0414\u0430<\/td>\n<td>No<\/td>\n<\/tr>\n<tr>\n<td>Return Loss<\/td>\n<td>\u0414\u0430<\/td>\n<td>Requires Additional Setup<\/td>\n<\/tr>\n<tr>\n<td>Insertion Loss<\/td>\n<td>\u0414\u0430<\/td>\n<td>Requires Additional Stimulus<\/td>\n<\/tr>\n<tr>\n<td>Best Application<\/td>\n<td>RF Component Characterization<\/td>\n<td>RF Signal Analysis<\/td>\n<\/tr>\n<\/table>\n<h3>Calibration Considerations<\/h3>\n<p>\nCalibration is essential for accurate vector network analysis.\n<\/p>\n<p>\nBefore performing precision measurements, the measurement reference plane should be calibrated according to the required test configuration.\n<\/p>\n<p>\nCalibration compensates for systematic errors associated with:\n<\/p>\n<ul>\n<li>VNA test ports<\/li>\n<li>RF cables<\/li>\n<li>Adapters<\/li>\n<li>Connectors<\/li>\n<li>Test fixtures<\/li>\n<\/ul>\n<p>\nCalibration requirements should be considered when designing both laboratory and automated production test systems.\n<\/p>\n<h3>Software and Automation<\/h3>\n<p>\nThe PXIe-S5090 is designed for software-controlled RF measurements and can be incorporated into automated measurement systems.\n<\/p>\n<p>\nThe VNA software provides multiple measurement and display capabilities including:\n<\/p>\n<ul>\n<li>Logarithmic magnitude<\/li>\n<li>Linear magnitude<\/li>\n<li>Phase<\/li>\n<li>Expanded phase<\/li>\n<li>Group delay<\/li>\n<li>SWR<\/li>\n<li>Real and imaginary components<\/li>\n<li>Smith chart<\/li>\n<li>Polar display<\/li>\n<li>Time-domain measurements<\/li>\n<\/ul>\n<p>\nAutomation capabilities are available for integration into custom RF test applications.\n<\/p>\n<h3>LabVIEW Integration<\/h3>\n<p>\nThe PXIe-S5090 can be integrated into <strong>\u041b\u0430\u0431\u0412\u044c\u044e<\/strong> applications for automated RF measurements.\n<\/p>\n<p>\nEngineers can use software control to:\n<\/p>\n<ul>\n<li>Configure frequency sweeps<\/li>\n<li>Set output power<\/li>\n<li>Configure measurement bandwidth<\/li>\n<li>Select S-parameters<\/li>\n<li>Trigger measurements<\/li>\n<li>Retrieve measurement data<\/li>\n<li>Perform automated analysis<\/li>\n<li>Generate pass\/fail results<\/li>\n<\/ul>\n<h3>Industries<\/h3>\n<ul>\n<li>Wireless Communications<\/li>\n<li>RF Component Manufacturing<\/li>\n<li>\u0422\u0435\u0441\u0442\u0438\u0440\u043e\u0432\u0430\u043d\u0438\u0435 \u043f\u043e\u043b\u0443\u043f\u0440\u043e\u0432\u043e\u0434\u043d\u0438\u043a\u043e\u0432<\/li>\n<li>\u0410\u044d\u0440\u043e\u043a\u043e\u0441\u043c\u0438\u0447\u0435\u0441\u043a\u0430\u044f \u0438 \u043e\u0431\u043e\u0440\u043e\u043d\u043d\u0430\u044f \u043f\u0440\u043e\u043c\u044b\u0448\u043b\u0435\u043d\u043d\u043e\u0441\u0442\u044c<\/li>\n<li>Automotive Electronics<\/li>\n<li>Consumer Electronics<\/li>\n<li>Electronic Manufacturing<\/li>\n<li>Research and Development<\/li>\n<li>Production Test<\/li>\n<li>Automated Test Equipment<\/li>\n<\/ul>\n<h3>Applications<\/h3>\n<h4>S-Parameter Measurement<\/h4>\n<p>\nThe PXIe-S5090 provides complete two-port S-parameter measurements including S11, S21, S12, and S22 for comprehensive RF device characterization.\n<\/p>\n<h4>RF Filter Testing<\/h4>\n<p>\nWide frequency coverage and high dynamic range make the PXIe-S5090 suitable for measuring insertion loss, return loss, passband response, and stopband rejection of RF filters.\n<\/p>\n<h4>Amplifier Characterization<\/h4>\n<p>\nThe instrument can measure amplifier forward gain, reverse isolation, input return loss, output return loss, phase response, and frequency response.\n<\/p>\n<h4>Antenna Testing<\/h4>\n<p>\nReflection measurements can be used to characterize antenna return loss, VSWR, impedance, resonance, and matching performance.\n<\/p>\n<h4>Cable and Connector Testing<\/h4>\n<p>\nThe PXIe-S5090 can characterize insertion loss, return loss, phase, group delay, and impedance discontinuities in RF cables and interconnects.\n<\/p>\n<h4>Automated Production Test<\/h4>\n<p>\nFast sweep capability, PXI integration, and software automation make the PXIe-S5090 suitable for high-volume RF manufacturing and production test applications.\n<\/p>\n<h3>Recommended Related Products<\/h3>\n<table>\n<tr>\n<td width=\"180\">\n<strong>NI PXIe-S5090<\/strong>\n<\/td>\n<td>\n2-port, 300 kHz to 9 GHz PXI Express Vector Network Analyzer for S-parameter and RF component characterization.\n<\/td>\n<\/tr>\n<tr>\n<td>\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-5668\/\"><strong>NI PXIe-5668<\/strong><\/a>\n<\/td>\n<td>\nPXI RF signal analyzer suitable for spectrum analysis and RF signal measurements alongside vector network analysis.\n<\/td>\n<\/tr>\n<tr>\n<td>\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxi-5652\/\"><strong>NI PXI-5652<\/strong><\/a>\n<\/td>\n<td>\nRF signal generator suitable for generating RF stimulus in modular automated test systems.\n<\/td>\n<\/tr>\n<tr>\n<td>\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-8267\/\"><strong>NI PXIe-8267<\/strong><\/a>\n<\/td>\n<td>\nHigh-speed PXI Express storage module for test systems requiring high-throughput measurement data storage.\n<\/td>\n<\/tr>\n<\/table>\n<h3>Why Choose NI PXIe-S5090?<\/h3>\n<ul>\n<li>300 kHz to 9 GHz frequency range<\/li>\n<li>2-port Vector Network Analyzer<\/li>\n<li>Complete S11, S21, S12, and S22 measurements<\/li>\n<li>Up to 138 dB dynamic range<\/li>\n<li>Up to +13 dBm output power<\/li>\n<li>Output power adjustable down to -45 dBm<\/li>\n<li>1 Hz frequency resolution<\/li>\n<li>Up to 500,001 measurement points<\/li>\n<li>1 Hz to 1 MHz measurement bandwidth<\/li>\n<li>50 \u03a9 RF test ports<\/li>\n<li>3.5 mm female connectors<\/li>\n<li>Automatic precision calibration support<\/li>\n<li>Time-domain analysis<\/li>\n<li>Time-domain gating<\/li>\n<li>Designed for automated RF test<\/li>\n<\/ul>\n<h3>Frequently Asked Questions<\/h3>\n<h4>What is the NI PXIe-S5090?<\/h4>\n<p>\nThe NI PXIe-S5090 is a 2-port PXI Express Vector Network Analyzer designed for RF and microwave component characterization, S-parameter measurements, automated design validation, and production testing.\n<\/p>\n<h4>What is the part number of the PXIe-S5090?<\/h4>\n<p>\nThe NI PXIe-S5090 part number is <strong>787251-01<\/strong>.\n<\/p>\n<h4>What is the frequency range of the PXIe-S5090?<\/h4>\n<p>\nThe PXIe-S5090 provides a frequency range from <strong>300 kHz to 9 GHz<\/strong>.\n<\/p>\n<h4>How many ports does the PXIe-S5090 have?<\/h4>\n<p>\nThe PXIe-S5090 is a <strong>2-port Vector Network Analyzer<\/strong> with two 50 \u03a9 RF test ports.\n<\/p>\n<h4>What S-parameters can the PXIe-S5090 measure?<\/h4>\n<p>\nThe PXIe-S5090 can measure the complete set of two-port S-parameters: <strong>S11, S21, S12, and S22<\/strong>.\n<\/p>\n<h4>What is the dynamic range of the PXIe-S5090?<\/h4>\n<p>\nThe PXIe-S5090 provides dynamic range up to <strong>138 dB<\/strong> over a significant portion of its operating frequency range under specified measurement conditions.\n<\/p>\n<h4>What is the maximum output power of the PXIe-S5090?<\/h4>\n<p>\nThe maximum specified output power is <strong>+13 dBm from 300 kHz to 6.5 GHz<\/strong>. Maximum output power decreases at higher frequencies, reaching +10 dBm from 6.5 GHz to 8 GHz and +5 dBm from 8 GHz to 9 GHz.\n<\/p>\n<h4>What is the frequency resolution of the PXIe-S5090?<\/h4>\n<p>\nThe PXIe-S5090 provides <strong>1 Hz frequency resolution<\/strong>.\n<\/p>\n<h4>How many measurement points does the PXIe-S5090 support?<\/h4>\n<p>\nThe analyzer supports from <strong>2 to 500,001 measurement points<\/strong>.\n<\/p>\n<h4>What connectors does the PXIe-S5090 use?<\/h4>\n<p>\nThe PXIe-S5090 uses two <strong>50 \u03a9 3.5 mm female RF test-port connectors<\/strong>.\n<\/p>\n<h4>Can the PXIe-S5090 measure VSWR?<\/h4>\n<p>\nYes. The PXIe-S5090 can perform reflection measurements and display SWR\/VSWR-related results for compatible RF devices such as antennas, filters, cables, and amplifiers.\n<\/p>\n<h4>Can the PXIe-S5090 measure insertion loss?<\/h4>\n<p>\nYes. S21 transmission measurements can be used to determine insertion loss for passive RF components such as filters, cables, attenuators, and other two-port networks.\n<\/p>\n<h4>Can the PXIe-S5090 measure amplifier gain?<\/h4>\n<p>\nYes. S21 can be used to characterize the forward gain of compatible RF amplifiers, provided the DUT signal levels remain within the analyzer&#8217;s operating limits.\n<\/p>\n<h4>Does the PXIe-S5090 support time-domain measurements?<\/h4>\n<p>\nYes. The PXIe-S5090 provides time-domain analysis and time-domain gating capabilities for applications such as cable fault analysis, fixture characterization, and unwanted reflection removal.\n<\/p>\n<h4>Can the PXIe-S5090 be controlled with LabVIEW?<\/h4>\n<p>\nYes. The PXIe-S5090 can be integrated into LabVIEW-based automated test applications. The required PXIe_S2 VNA software and associated drivers must be installed according to the supported hardware and software configuration.\n<\/p>\n<h4>What applications are suitable for the PXIe-S5090?<\/h4>\n<p>\nTypical applications include S-parameter measurements, RF filter testing, amplifier characterization, antenna measurements, cable and connector testing, impedance measurements, RF component design validation, automated production test, and research applications.\n<\/p>\n<h4>What should I check before purchasing a PXIe-S5090?<\/h4>\n<p>\nBefore purchasing a PXIe-S5090, verify the required 300 kHz to 9 GHz frequency coverage, two-port configuration, dynamic range, output power requirements, DUT power levels, connector compatibility, calibration requirements, PXI Express chassis compatibility, RF cables and calibration accessories, and required software environment.\n<\/p>\n<h3>\u0417\u0430\u043a\u043b\u044e\u0447\u0435\u043d\u0438\u0435<\/h3>\n<p>\n\u0417\u0435\u043c\u043b\u044f <strong>NI PXIe-S5090 9 GHz 2-Port PXI Express Vector Network Analyzer<\/strong> provides 300 kHz to 9 GHz frequency coverage, complete S11\/S21\/S12\/S22 measurements, up to 138 dB dynamic range, fine 1 Hz frequency resolution, and up to 500,001 measurement points. Its combination of RF measurement performance, time-domain analysis, calibration capabilities, and PXI Express integration makes it particularly suitable for RF filter testing, amplifier characterization, antenna measurements, cable and connector testing, automated design validation, and high-volume production test systems.<\/p>","protected":false},"excerpt":{"rendered":"<p>VNA Frequency Range: 300 kHz to 9 GHz<br \/>\nMaximum Source Power: 13 dBm<br \/>\nNumber of VNA Ports: 2<br \/>\nMultiport Capable: No<br \/>\nActive Connector Slot Location: 1<br \/>\nVNA Dynamic Range: 138 dB<\/p>","protected":false},"featured_media":31880,"template":"","meta":{"_acf_changed":false},"product_brand":[18],"product_cat":[667],"product_tag":[],"class_list":["post-32693","product","type-product","status-publish","has-post-thumbnail","product_brand-national-instruments","product_cat-pxi-modules","first","instock","shipping-taxable","purchasable","product-type-simple"],"acf":[],"yoast_head":"<!-- This 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