{"id":32437,"date":"2026-04-30T09:11:41","date_gmt":"2026-04-30T01:11:41","guid":{"rendered":"https:\/\/pxisource.com\/?post_type=product&#038;p=32437"},"modified":"2026-07-28T21:35:10","modified_gmt":"2026-07-28T13:35:10","slug":"pxie-4139","status":"publish","type":"product","link":"https:\/\/pxisource.com\/ru\/product\/pxie-4139\/","title":{"rendered":"PXIe-4139"},"content":{"rendered":"<h3>NI PXIe-4139 Precision PXI Express SMU Module<\/h3>\n<p>\n\u0417\u0435\u043c\u043b\u044f <strong>NI PXIe-4139<\/strong> is a high-precision PXI Express Source Measure Unit (SMU) designed for semiconductor testing, electronic device characterization, power validation, and automated measurement applications. Developed by National Instruments, the PXIe-4139 combines precision voltage sourcing, current sourcing, voltage measurement, and current measurement capabilities in a compact PXI Express module.\n<\/p>\n<p>\nThe PXIe-4139 provides engineers with accurate and flexible SMU functionality for testing semiconductor devices, power components, sensors, and electronic circuits. With high-resolution measurements, low-noise performance, and advanced software support, it is suitable for demanding research and production test environments.\n<\/p>\n<p>\nSupporting NI-DCPower drivers, LabVIEW integration, and PXI Express communication, the PXIe-4139 enables scalable automated test systems for precision electrical measurements.\n<\/p>\n<h3>Key Features of NI PXIe-4139<\/h3>\n<h4>Precision Source Measure Unit Capability<\/h4>\n<p>\nThe PXIe-4139 integrates source and measurement functions into a single PXI Express instrument.\n<\/p>\n<ul>\n<li>Voltage sourcing<\/li>\n<li>Current sourcing<\/li>\n<li>Voltage measurement<\/li>\n<li>Current measurement<\/li>\n<li>Precision electrical characterization<\/li>\n<\/ul>\n<h4>High-Accuracy Electrical Measurement<\/h4>\n<p>\nThe PXIe-4139 provides accurate and repeatable measurements for sensitive electronic devices.\n<\/p>\n<ul>\n<li>Low-noise measurement<\/li>\n<li>High-resolution acquisition<\/li>\n<li>Stable DC measurement<\/li>\n<li>Device characterization capability<\/li>\n<\/ul>\n<h4>DC and Pulsed Testing Capability<\/h4>\n<p>\nThe PXIe-4139 supports flexible testing modes for different semiconductor and electronic applications.\n<\/p>\n<ul>\n<li>DC source measurement<\/li>\n<li>Pulsed output testing<\/li>\n<li>Transient device testing<\/li>\n<li>Power characterization<\/li>\n<\/ul>\n<h4>PXI Express High-Speed Integration<\/h4>\n<p>\nThe PXIe-4139 uses PXI Express architecture for fast communication and synchronization with other PXI instruments.\n<\/p>\n<ul>\n<li>High-speed PCI Express communication<\/li>\n<li>Synchronized multi-instrument testing<\/li>\n<li>Modular system integration<\/li>\n<li>Automated test deployment<\/li>\n<\/ul>\n<h4>NI Software Support<\/h4>\n<p>\nThe PXIe-4139 integrates with NI software platforms for precision measurement development.\n<\/p>\n<ul>\n<li>NI-DCPower driver<\/li>\n<li>LabVIEW support<\/li>\n<li>NI TestStand integration<\/li>\n<li>Automated measurement programming<\/li>\n<\/ul>\n<h3>Applications of NI PXIe-4139<\/h3>\n<h4>Semiconductor Device Testing<\/h4>\n<p>\nThe PXIe-4139 provides precision electrical measurement capability for semiconductor characterization.\n<\/p>\n<ul>\n<li>IC testing<\/li>\n<li>Device characterization<\/li>\n<li>Wafer-level measurement<\/li>\n<li>Production semiconductor testing<\/li>\n<\/ul>\n<h4>Power Electronics Testing<\/h4>\n<p>\nThe PXIe-4139 supports validation of power components and electronic circuits.\n<\/p>\n<ul>\n<li>Power device analysis<\/li>\n<li>DC power testing<\/li>\n<li>Component validation<\/li>\n<li>Electrical performance evaluation<\/li>\n<\/ul>\n<h4>\u0410\u0432\u0442\u043e\u043c\u0430\u0442\u0438\u0437\u0438\u0440\u043e\u0432\u0430\u043d\u043d\u043e\u0435 \u0438\u0441\u043f\u044b\u0442\u0430\u0442\u0435\u043b\u044c\u043d\u043e\u0435 \u043e\u0431\u043e\u0440\u0443\u0434\u043e\u0432\u0430\u043d\u0438\u0435 (\u0410\u0418\u041e)<\/h4>\n<p>\nThe PXIe-4139 can be integrated into automated test systems requiring precision source and measurement functions.\n<\/p>\n<ul>\n<li>Production testing<\/li>\n<li>Functional verification<\/li>\n<li>Electronic testing<\/li>\n<li>Research test platforms<\/li>\n<\/ul>\n<h4>Electronic Component Characterization<\/h4>\n<p>\nThe PXIe-4139 enables engineers to analyze electrical characteristics of various electronic components.\n<\/p>\n<ul>\n<li>Sensor testing<\/li>\n<li>LED testing<\/li>\n<li>Battery research<\/li>\n<li>Material characterization<\/li>\n<\/ul>\n<h3>\u041f\u043e\u0434\u0434\u0435\u0440\u0436\u043a\u0430 \u043f\u0440\u043e\u0433\u0440\u0430\u043c\u043c\u043d\u043e\u0433\u043e \u043e\u0431\u0435\u0441\u043f\u0435\u0447\u0435\u043d\u0438\u044f<\/h3>\n<p>\nThe NI PXIe-4139 supports National Instruments software tools for SMU programming and automated test development.\n<\/p>\n<ul>\n<li>NI-DCPower<\/li>\n<li>\u041b\u0430\u0431\u0412\u044c\u044e<\/li>\n<li>NI TestStand<\/li>\n<li>Measurement Studio<\/li>\n<\/ul>\n<h3>Technical Specifications of PXIe-4139<\/h3>\n<table>\n<tr>\n<th>\u0424\u0443\u043d\u043a\u0446\u0438\u044f<\/th>\n<th>\u041e\u043f\u0438\u0441\u0430\u043d\u0438\u0435<\/th>\n<\/tr>\n<tr>\n<td width=\"180\">Product Type<\/td>\n<td>PXI Express Source Measure Unit (SMU)<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">Platform<\/td>\n<td>PXI Express<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">Functions<\/td>\n<td>Source Voltage, Source Current, Measure Voltage, Measure Current<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">\u0422\u0438\u043f \u0438\u0437\u043c\u0435\u0440\u0435\u043d\u0438\u044f<\/td>\n<td>Precision DC and Pulsed Measurement<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">Software<\/td>\n<td>NI-DCPower, LabVIEW<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">Applications<\/td>\n<td>Semiconductor testing, power validation, device characterization<\/td>\n<\/tr>\n<\/table>\n<h3>Comparison with Similar PXI Express SMU Modules<\/h3>\n<table>\n<tr>\n<th>\u041c\u043e\u0434\u0435\u043b\u044c<\/th>\n<th>\u041e\u0441\u043d\u043e\u0432\u043d\u043e\u0435 \u0440\u0430\u0437\u043b\u0438\u0447\u0438\u0435<\/th>\n<th>Best Application<\/th>\n<\/tr>\n<tr>\n<td width=\"180\">\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4139\/\"><br \/>\n<strong>NI PXIe-4139<\/strong><br \/>\n<\/a>\n<\/td>\n<td>\nPrecision PXI Express SMU module designed for accurate source and measurement applications.\n<\/td>\n<td>\nSemiconductor and precision device testing\n<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4141\/\"><br \/>\n<strong>NI PXIe-4141<\/strong><br \/>\n<\/a>\n<\/td>\n<td>\nMulti-channel SMU module for scalable automated semiconductor testing.\n<\/td>\n<td>\nMulti-device test systems\n<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4143\/\"><br \/>\n<strong>NI PXIe-4143<\/strong><br \/>\n<\/a>\n<\/td>\n<td>\nHigh-performance SMU optimized for precision electrical measurements.\n<\/td>\n<td>\nAdvanced semiconductor characterization\n<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4154\/\"><br \/>\n<strong>NI PXIe-4154<\/strong><br \/>\n<\/a>\n<\/td>\n<td>\nHigh-speed power supply and measurement module for dynamic testing.\n<\/td>\n<td>\nPower electronics testing\n<\/td>\n<\/tr>\n<\/table>\n<h3>Recommended Related Products<\/h3>\n<p>\nThe following products are commonly used with the PXIe-4139 to build complete semiconductor and automated test systems.\n<\/p>\n<table>\n<tr>\n<td width=\"180\">\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4141\/\"><br \/>\n<strong>NI PXIe-4141<\/strong><br \/>\n<\/a>\n<\/td>\n<td>\nMulti-channel PXI Express SMU module for semiconductor production testing.\n<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4143\/\"><br \/>\n<strong>NI PXIe-4143<\/strong><br \/>\n<\/a>\n<\/td>\n<td>\nPrecision SMU module for advanced electronic device characterization.\n<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4154\/\"><br \/>\n<strong>NI PXIe-4154<\/strong><br \/>\n<\/a>\n<\/td>\n<td>\nPXI Express power supply and measurement module for power validation.\n<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-5162\/\"><br \/>\n<strong>NI PXIe-5162<\/strong><br \/>\n<\/a>\n<\/td>\n<td>\nHigh-speed PXI Express digitizer for electronic signal analysis.\n<\/td>\n<\/tr>\n<tr>\n<td width=\"180\">\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-1085\/\"><br \/>\n<strong>NI PXIe-1085<\/strong><br \/>\n<\/a>\n<\/td>\n<td>\nHigh-performance PXI Express chassis for modular semiconductor test systems.\n<\/td>\n<\/tr>\n<\/table>\n<h3>Why Choose NI PXIe-4139<\/h3>\n<ul>\n<li>High-precision PXI Express SMU capability<\/li>\n<li>Accurate voltage and current sourcing<\/li>\n<li>Low-noise electrical measurement<\/li>\n<li>Supports NI-DCPower and LabVIEW<\/li>\n<li>Ideal for semiconductor and power testing<\/li>\n<li>Suitable for automated production test systems<\/li>\n<\/ul>\n<h3>\u0417\u0430\u043a\u043b\u044e\u0447\u0435\u043d\u0438\u0435<\/h3>\n<p>\n\u0417\u0435\u043c\u043b\u044f <strong>NI PXIe-4139 Precision PXI Express SMU Module<\/strong> provides a powerful and flexible solution for engineers requiring accurate source and measurement capabilities in automated test environments.\n<\/p>\n<p>\nWith precision electrical measurement, PXI Express performance, and NI software integration, the PXIe-4139 is an excellent choice for semiconductor testing, electronic characterization, power validation, and advanced research applications.<\/p>","protected":false},"excerpt":{"rendered":"<p>\u0422\u0435\u043a\u0443\u0449\u0430\u044f \u0447\u0443\u0432\u0441\u0442\u0432\u0438\u0442\u0435\u043b\u044c\u043d\u043e\u0441\u0442\u044c: 100 \u0444\u0410<br \/>\n\u0412\u043a\u043b\u044e\u0447\u0430\u0435\u0442 \u0432\u0441\u043f\u043e\u043c\u043e\u0433\u0430\u0442\u0435\u043b\u044c\u043d\u0443\u044e \u043c\u043e\u0449\u043d\u043e\u0441\u0442\u044c: \u2013<br \/>\n\u041a\u043e\u043b\u0438\u0447\u0435\u0441\u0442\u0432\u043e \u043a\u0430\u043d\u0430\u043b\u043e\u0432 SMU: 1<br \/>\n\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u043d\u0430\u043f\u0440\u044f\u0436\u0435\u043d\u0438\u044f: \u043e\u0442 -60 \u0412 \u0434\u043e 60 \u0412<br \/>\n\u0410\u0434\u0430\u043f\u0442\u0430\u0446\u0438\u044f \u0438\u0441\u0442\u043e\u0447\u043d\u0438\u043a\u0430: \u0414\u0430<br \/>\n\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u043f\u043e\u0441\u0442\u043e\u044f\u043d\u043d\u043e\u0433\u043e \u0442\u043e\u043a\u0430: \u043e\u0442 -3 \u0410 \u0434\u043e 3 \u0410<br \/>\n\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u0438\u043c\u043f\u0443\u043b\u044c\u0441\u043d\u043e\u0433\u043e \u0442\u043e\u043a\u0430: \u043e\u0442 -10 \u0410 \u0434\u043e 10 \u0410<br \/>\n\u0428\u0438\u043d\u043d\u044b\u0439 \u0441\u043e\u0435\u0434\u0438\u043d\u0438\u0442\u0435\u043b\u044c: PXI Express<\/p>","protected":false},"featured_media":31707,"template":"","meta":{"_acf_changed":false},"product_brand":[18],"product_cat":[744],"product_tag":[],"class_list":["post-32437","product","type-product","status-publish","has-post-thumbnail","product_brand-national-instruments","product_cat-pxi-programmable-power-supplies-smu","first","instock","shipping-taxable","purchasable","product-type-simple"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v25.0 (Yoast SEO v28.1) - https:\/\/yoast.com\/product\/yoast-seo-premium-wordpress\/ -->\n<title>NI PXIe-4139 PXI Source Measure Unit 782856-02 - Special Price<\/title>\n<meta name=\"description\" content=\"NI PXIe-4139 PXI Express SMU provides precision source and measurement capability for semiconductor testing, device characterization, power validation, 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