{"id":32428,"date":"2026-04-29T09:22:38","date_gmt":"2026-04-29T01:22:38","guid":{"rendered":"https:\/\/pxisource.com\/?post_type=product&#038;p=32428"},"modified":"2026-08-27T12:18:13","modified_gmt":"2026-08-27T04:18:13","slug":"pxie-4143","status":"publish","type":"product","link":"https:\/\/pxisource.com\/ru\/product\/pxie-4143\/","title":{"rendered":"PXIe-4143"},"content":{"rendered":"<h3>Product Introduction<\/h3>\n<p>\n\u0417\u0435\u043c\u043b\u044f <strong>NI PXIe-4143<\/strong> is a 4-channel precision PXI Express Source Measure Unit (SMU) designed for semiconductor characterization, high-pin-count device testing, RF integrated circuit power and measurement, electronic component validation, and automated production test.\n<\/p>\n<p>\nThe PXIe-4143 integrates <strong>four independently programmable SMU channels<\/strong> into a compact PXI Express module. Each channel provides voltage and current sourcing together with precision voltage and current measurement, allowing multiple DUT terminals or multiple devices to be tested within a single modular instrument.\n<\/p>\n<p>\nEach channel provides voltage capability up to <strong>\u00b124 V<\/strong>, current capability up to <strong>\u00b1150 mA<\/strong>, and maximum source or sink power up to <strong>3.6 W<\/strong>. The module also provides <strong>10 pA current sensitivity<\/strong>, four-quadrant operation, remote four-wire sensing, high-speed sequencing, and SourceAdapt technology.\n<\/p>\n<h3>Product Overview<\/h3>\n<p>\n\u0417\u0435\u043c\u043b\u044f <strong>National Instruments PXIe-4143<\/strong> belongs to the NI PXIe-414x family of high-channel-count precision Source Measure Units.\n<\/p>\n<p>\nIts combination of four channels and \u00b124 V voltage capability makes it particularly useful for applications requiring several independent precision DC bias and measurement channels without occupying multiple PXI slots.\n<\/p>\n<p>\n\u0422\u0438\u043f\u0438\u0447\u043d\u044b\u0435 \u043f\u0440\u0438\u043c\u0435\u043d\u0435\u043d\u0438\u044f \u0432\u043a\u043b\u044e\u0447\u0430\u044e\u0442:\n<\/p>\n<ul>\n<li>Semiconductor characterization<\/li>\n<li>High-pin-count device testing<\/li>\n<li>Integrated circuit validation<\/li>\n<li>RF IC power and measurement<\/li>\n<li>MEMS device testing<\/li>\n<li>I-V characterization<\/li>\n<li>Open and short testing<\/li>\n<li>Sensor characterization<\/li>\n<li>Electronic component testing<\/li>\n<li>Automated production test<\/li>\n<\/ul>\n<h3>Key Features<\/h3>\n<h4>Four Independent SMU Channels<\/h4>\n<p>\nThe PXIe-4143 provides <strong>four independently programmable Source Measure Unit channels<\/strong>.\n<\/p>\n<p>\nEach channel can provide electrical stimulus while simultaneously measuring the DUT response.\n<\/p>\n<p>\nA typical multi-terminal configuration may be:\n<\/p>\n<p>\n<strong>Channel 0 \u2192 DUT Supply<\/strong><br \/>\n<strong>Channel 1 \u2192 DUT Bias<\/strong><br \/>\n<strong>Channel 2 \u2192 DUT Input<\/strong><br \/>\n<strong>Channel 3 \u2192 DUT Output or Auxiliary Bias<\/strong>\n<\/p>\n<p>\nThis multi-channel architecture reduces the number of individual instruments required for complex device characterization.\n<\/p>\n<h4>\u00b124 V Voltage Capability<\/h4>\n<p>\nEach PXIe-4143 SMU channel provides bipolar voltage capability up to approximately <strong>\u00b124 V<\/strong>.\n<\/p>\n<p>\nThe relatively wide bipolar voltage range makes the PXIe-4143 suitable for devices requiring positive and negative bias conditions.\n<\/p>\n<p>\n\u0422\u0438\u043f\u0438\u0447\u043d\u044b\u0435 \u043f\u0440\u0438\u043c\u0435\u043d\u0435\u043d\u0438\u044f \u0432\u043a\u043b\u044e\u0447\u0430\u044e\u0442:\n<\/p>\n<ul>\n<li>Semiconductor devices<\/li>\n<li>Analog integrated circuits<\/li>\n<li>MEMS devices<\/li>\n<li>Sensors<\/li>\n<li>Diodes<\/li>\n<li>Transistors<\/li>\n<li>Electronic components<\/li>\n<\/ul>\n<h4>\u00b1150 mA Current Capability<\/h4>\n<p>\nEach PXIe-4143 channel provides current capability up to approximately <strong>\u00b1150 mA<\/strong>.\n<\/p>\n<p>\nThis makes the module suitable for precision low-to-moderate-power semiconductor and electronic component applications.\n<\/p>\n<p>\nFor applications requiring substantially higher current per channel, another PXI SMU such as the PXIe-4147 may be more appropriate.\n<\/p>\n<h4>3.6 W Per Channel<\/h4>\n<p>\nThe PXIe-4143 provides up to approximately <strong>3.6 W maximum source or sink power per channel<\/strong> within its specified operating envelope.\n<\/p>\n<p>\nVoltage, current, and power requirements should always be evaluated together when selecting an SMU.\n<\/p>\n<p>\nThe required DUT operating point should be verified against the PXIe-4143 I-V operating boundaries before configuring the test system.\n<\/p>\n<h4>10 pA Current Sensitivity<\/h4>\n<p>\nThe PXIe-4143 provides current sensitivity down to approximately <strong>10 pA<\/strong>.\n<\/p>\n<p>\nThis capability is useful for precision characterization applications involving relatively small DUT currents.\n<\/p>\n<p>\nTypical measurements can include:\n<\/p>\n<ul>\n<li>Device leakage<\/li>\n<li>Standby current<\/li>\n<li>Bias current<\/li>\n<li>Sensor current<\/li>\n<li>Low-power device characterization<\/li>\n<li>Semiconductor parametric measurements<\/li>\n<\/ul>\n<h4>Four-Quadrant Operation<\/h4>\n<p>\nThe PXIe-4143 supports <strong>four-quadrant operation<\/strong>, allowing each channel to source or sink power under positive and negative voltage and current conditions within its specified operating range.\n<\/p>\n<table>\n<tr>\n<th>Quadrant<\/th>\n<th>Voltage<\/th>\n<th>Current<\/th>\n<th>Operation<\/th>\n<\/tr>\n<tr>\n<td>I<\/td>\n<td>Positive<\/td>\n<td>Positive<\/td>\n<td>Source Power<\/td>\n<\/tr>\n<tr>\n<td>II<\/td>\n<td>Positive<\/td>\n<td>Negative<\/td>\n<td>Sink Power<\/td>\n<\/tr>\n<tr>\n<td>III<\/td>\n<td>Negative<\/td>\n<td>Negative<\/td>\n<td>Source Power<\/td>\n<\/tr>\n<tr>\n<td>IV<\/td>\n<td>Negative<\/td>\n<td>Positive<\/td>\n<td>Sink Power<\/td>\n<\/tr>\n<\/table>\n<p>\nFour-quadrant operation provides greater flexibility than a conventional unidirectional programmable power supply.\n<\/p>\n<h4>Precision Voltage Sourcing<\/h4>\n<p>\nEach PXIe-4143 channel can operate as a programmable precision voltage source while simultaneously measuring DUT current.\n<\/p>\n<p>\nA typical configuration is:\n<\/p>\n<p>\n<strong>Program Voltage \u2192 Apply to DUT \u2192 Measure Current<\/strong>\n<\/p>\n<p>\nThis operating mode is commonly used for semiconductor I-V characterization.\n<\/p>\n<h4>Precision Current Sourcing<\/h4>\n<p>\nThe PXIe-4143 can also operate as a programmable current source while measuring DUT voltage.\n<\/p>\n<p>\nA typical configuration is:\n<\/p>\n<p>\n<strong>Program Current \u2192 Apply to DUT \u2192 Measure Voltage<\/strong>\n<\/p>\n<p>\nThis mode can be useful for diode, sensor, resistive device, and electronic component characterization.\n<\/p>\n<h4>Remote Four-Wire Sensing<\/h4>\n<p>\nEach PXIe-4143 channel includes integrated <strong>remote four-wire sensing<\/strong>.\n<\/p>\n<p>\nFour-wire sensing separates the force and sense connections, helping reduce measurement errors caused by cable, connector, fixture, and interconnect resistance.\n<\/p>\n<p>\nA simplified connection is:\n<\/p>\n<p>\n<strong>Force HI \/ Force LO \u2192 Source Voltage or Current<\/strong><br \/>\n<strong>Sense HI \/ Sense LO \u2192 Measure Voltage at DUT<\/strong>\n<\/p>\n<p>\nThis capability is especially useful when precise voltage control at the DUT terminals is required.\n<\/p>\n<h4>SourceAdapt Technology<\/h4>\n<p>\nThe PXIe-4143 supports <strong>NI SourceAdapt technology<\/strong>, which allows the transient response of the SMU to be optimized for different DUT load characteristics.\n<\/p>\n<p>\nDifferent devices may present capacitive, inductive, or dynamically changing loads.\n<\/p>\n<p>\nSourceAdapt can help optimize:\n<\/p>\n<ul>\n<li>Source stability<\/li>\n<li>Settling time<\/li>\n<li>Transient behavior<\/li>\n<li>Measurement speed<\/li>\n<li>Test repeatability<\/li>\n<\/ul>\n<h4>600 kS\/s Maximum Sampling Rate<\/h4>\n<p>\nThe PXIe-4143 provides a maximum sampling rate of approximately <strong>600 kS\/s<\/strong>.\n<\/p>\n<p>\nThe high sampling rate allows the module to capture electrical behavior that may be difficult to observe with slower conventional source-measure instruments.\n<\/p>\n<p>\nThis can be useful for:\n<\/p>\n<ul>\n<li>Transient current measurements<\/li>\n<li>Startup characterization<\/li>\n<li>Power-state transitions<\/li>\n<li>Dynamic DUT behavior<\/li>\n<li>High-speed automated measurements<\/li>\n<\/ul>\n<h4>100 kS\/s Maximum Update Rate<\/h4>\n<p>\nThe PXIe-4143 provides a maximum source update rate of approximately <strong>100 kS\/s<\/strong>.\n<\/p>\n<p>\nFast source updates allow programmed voltage or current levels to be changed rapidly during automated sweeps and test sequences.\n<\/p>\n<h4>High-Speed Sequencing<\/h4>\n<p>\nThe PXIe-4143 includes a high-speed sequencing engine for automated source-measure operations.\n<\/p>\n<p>\nTest sequences can contain multiple source levels, compliance conditions, measurement settings, and timing parameters.\n<\/p>\n<p>\nThis hardware-oriented architecture can improve test throughput by reducing software interaction between individual measurement points.\n<\/p>\n<h4>Hardware Timing and Triggering<\/h4>\n<p>\nThe PXIe-4143 supports hardware-timed operation and PXI triggering.\n<\/p>\n<p>\nThis allows multiple PXI instruments to coordinate their stimulus and measurement operations.\n<\/p>\n<p>\n\u041d\u0430\u043f\u0440\u0438\u043c\u0435\u0440:\n<\/p>\n<p>\n<strong>PXIe-4143 \u2192 Apply DUT Bias<\/strong><br \/>\n<strong>PXI Digital Instrument \u2192 Configure DUT<\/strong><br \/>\n<strong>PXI RF Instrument \u2192 Apply RF Signal<\/strong><br \/>\n<strong>PXIe-4143 \u2192 Measure DUT Current<\/strong>\n<\/p>\n<h3>Technical Specifications<\/h3>\n<table>\n<tr>\n<th>\u041f\u0430\u0440\u0430\u043c\u0435\u0442\u0440<\/th>\n<th>\u0421\u043f\u0435\u0446\u0438\u0444\u0438\u043a\u0430\u0446\u0438\u044f<\/th>\n<\/tr>\n<tr>\n<td width=\"250\">Product Type<\/td>\n<td>Precision PXI Source Measure Unit<\/td>\n<\/tr>\n<tr>\n<td>\u041c\u043e\u0434\u0435\u043b\u044c<\/td>\n<td>NI PXIe-4143<\/td>\n<\/tr>\n<tr>\n<td>Part Number<\/td>\n<td>782431-01<\/td>\n<\/tr>\n<tr>\n<td>Platform<\/td>\n<td>PXI Express<\/td>\n<\/tr>\n<tr>\n<td>Number of SMU Channels<\/td>\n<td>4<\/td>\n<\/tr>\n<tr>\n<td>Voltage Range<\/td>\n<td>\u00b124 V<\/td>\n<\/tr>\n<tr>\n<td>\u041c\u0430\u043a\u0441\u0438\u043c\u0430\u043b\u044c\u043d\u044b\u0439 \u0442\u043e\u043a<\/td>\n<td>\u00b1150 mA<\/td>\n<\/tr>\n<tr>\n<td>Maximum Power<\/td>\n<td>3.6 W Per Channel<\/td>\n<\/tr>\n<tr>\n<td>Current Sensitivity<\/td>\n<td>10 pA<\/td>\n<\/tr>\n<tr>\n<td>Maximum Sampling Rate<\/td>\n<td>600 kS\/s<\/td>\n<\/tr>\n<tr>\n<td>Maximum Update Rate<\/td>\n<td>100 kS\/s<\/td>\n<\/tr>\n<tr>\n<td>Operation<\/td>\n<td>4-Quadrant<\/td>\n<\/tr>\n<tr>\n<td>Remote Sense<\/td>\n<td>Integrated 4-Wire Sense Per Channel<\/td>\n<\/tr>\n<tr>\n<td>SourceAdapt<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Hardware Timing<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Voltage Source<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Current Source<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Voltage Measurement<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Current Measurement<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Source and Sink<\/td>\n<td>Supported<\/td>\n<\/tr>\n<tr>\n<td>Module Format<\/td>\n<td>3U, 1-Slot PXI Express<\/td>\n<\/tr>\n<tr>\n<td>Front Panel Connector<\/td>\n<td>25-Position D-SUB<\/td>\n<\/tr>\n<tr>\n<td>Recommended Calibration Interval<\/td>\n<td>1 Year<\/td>\n<\/tr>\n<tr>\n<td>Primary Applications<\/td>\n<td>Semiconductor Characterization, I-V Measurement, RF IC Power and Automated Parametric Test<\/td>\n<\/tr>\n<\/table>\n<h3>What Is a PXI Source Measure Unit?<\/h3>\n<p>\nA PXI Source Measure Unit combines programmable electrical sourcing with precision voltage and current measurement in a modular PXI instrument.\n<\/p>\n<p>\nAn SMU can perform several functions:\n<\/p>\n<ul>\n<li>Programmable voltage source<\/li>\n<li>Programmable current source<\/li>\n<li>Precision voltmeter<\/li>\n<li>Precision ammeter<\/li>\n<li>Electronic load<\/li>\n<\/ul>\n<p>\nThis integrated architecture makes SMUs particularly useful for semiconductor characterization and automated parametric test.\n<\/p>\n<h3>PXIe-4143 for Semiconductor Characterization<\/h3>\n<p>\nSemiconductor characterization is one of the primary applications for the PXIe-4143.\n<\/p>\n<p>\nThe combination of four channels, bipolar voltage sourcing, precision current measurement, fast sampling, and hardware synchronization makes the module suitable for testing devices with multiple electrical terminals.\n<\/p>\n<p>\nTypical DUTs can include:\n<\/p>\n<ul>\n<li>Integrated circuits<\/li>\n<li>Analog ICs<\/li>\n<li>Diodes<\/li>\n<li>Transistors<\/li>\n<li>MOSFETs<\/li>\n<li>MEMS devices<\/li>\n<li>Sensors<\/li>\n<li>RF integrated circuits<\/li>\n<\/ul>\n<h3>I-V Characterization<\/h3>\n<p>\nThe PXIe-4143 can perform automated current-voltage characterization by applying a programmed electrical stimulus and measuring the corresponding DUT response.\n<\/p>\n<p>\nA voltage sweep can be represented as:\n<\/p>\n<p>\n<strong>V1 \u2192 Measure I1<\/strong><br \/>\n<strong>V2 \u2192 Measure I2<\/strong><br \/>\n<strong>V3 \u2192 Measure I3<\/strong><br \/>\n<strong>V4 \u2192 Measure I4<\/strong><br \/>\n<strong>&#8230; \u2192 Generate I-V Curve<\/strong>\n<\/p>\n<p>\nThis process can be automated across multiple SMU channels.\n<\/p>\n<h3>Voltage Sweep Measurements<\/h3>\n<p>\nWhen operating as a voltage source, the PXIe-4143 can automatically step through a programmed sequence of voltage levels while measuring current.\n<\/p>\n<p>\nA typical test procedure includes:\n<\/p>\n<ol>\n<li>Configure the voltage range.<\/li>\n<li>Configure current compliance.<\/li>\n<li>Apply the first voltage level.<\/li>\n<li>Measure DUT current.<\/li>\n<li>Change the source voltage.<\/li>\n<li>Repeat the measurement.<\/li>\n<li>Continue through the required sweep.<\/li>\n<li>Analyze the resulting I-V data.<\/li>\n<\/ol>\n<h3>Current Sweep Measurements<\/h3>\n<p>\nThe PXIe-4143 can also source a programmed sequence of current levels while measuring DUT voltage.\n<\/p>\n<p>\nA simplified sequence is:\n<\/p>\n<p>\n<strong>I1 \u2192 Measure V1<\/strong><br \/>\n<strong>I2 \u2192 Measure V2<\/strong><br \/>\n<strong>I3 \u2192 Measure V3<\/strong><br \/>\n<strong>I4 \u2192 Measure V4<\/strong>\n<\/p>\n<p>\nThis mode can be useful for diodes, sensors, resistive devices, and other electronic components.\n<\/p>\n<h3>High-Pin-Count Device Testing<\/h3>\n<p>\nThe four-channel architecture makes the PXIe-4143 particularly suitable for high-pin-count devices requiring multiple programmable DC connections.\n<\/p>\n<p>\nMultiple PXIe-4143 modules can also be installed in a PXI chassis when additional source-measure channels are required.\n<\/p>\n<p>\nThis allows engineers to build scalable semiconductor test systems with many independently programmable DC channels.\n<\/p>\n<h3>MEMS Device Testing<\/h3>\n<p>\nThe PXIe-4143 is suitable for precision MEMS device characterization where several DC stimulus and measurement channels may be required.\n<\/p>\n<p>\nTypical applications can include:\n<\/p>\n<ul>\n<li>Device biasing<\/li>\n<li>Leakage measurements<\/li>\n<li>I-V characterization<\/li>\n<li>Open and short testing<\/li>\n<li>Multi-terminal electrical characterization<\/li>\n<\/ul>\n<h3>RF Integrated Circuit Testing<\/h3>\n<p>\nRF integrated circuits often require multiple programmable DC supply and bias connections while RF stimulus and measurement are performed by separate instrumentation.\n<\/p>\n<p>\nA typical architecture can include:\n<\/p>\n<p>\n<strong>PXIe-4143 \u2192 DUT DC Bias and Current Measurement<\/strong><br \/>\n<strong>PXI RF Instrument \u2192 RF Generation and Analysis<\/strong><br \/>\n<strong>PXI Digital Instrument \u2192 DUT Control<\/strong>\n<\/p>\n<p>\nThis configuration allows engineers to correlate DC power consumption with RF performance.\n<\/p>\n<h3>Powering RF Integrated Circuits<\/h3>\n<p>\nThe PXIe-414x family is well suited for applications such as powering RF integrated circuits.\n<\/p>\n<p>\nThe PXIe-4143 can provide several independently programmable supply or bias channels while simultaneously measuring the current consumed by the RF device.\n<\/p>\n<p>\nTypical devices may include:\n<\/p>\n<ul>\n<li>RF transceivers<\/li>\n<li>Low-noise amplifiers<\/li>\n<li>RF switches<\/li>\n<li>Wireless ICs<\/li>\n<li>RF front-end components<\/li>\n<\/ul>\n<h3>Open and Short Testing<\/h3>\n<p>\nThe PXIe-4143 can be used in automated open and short test applications where programmable source-measure channels verify electrical connectivity.\n<\/p>\n<p>\n\u0422\u0438\u043f\u0438\u0447\u043d\u044b\u0435 \u043f\u0440\u0438\u043c\u0435\u043d\u0435\u043d\u0438\u044f \u0432\u043a\u043b\u044e\u0447\u0430\u044e\u0442:\n<\/p>\n<ul>\n<li>Semiconductor pin testing<\/li>\n<li>PCB connectivity verification<\/li>\n<li>Device interface validation<\/li>\n<li>Production test<\/li>\n<li>Fixture verification<\/li>\n<\/ul>\n<h3>Leakage Current Measurements<\/h3>\n<p>\nWith current sensitivity down to approximately 10 pA, the PXIe-4143 can be used for compatible low-current and leakage measurements.\n<\/p>\n<p>\nTypical applications can include:\n<\/p>\n<ul>\n<li>Semiconductor leakage characterization<\/li>\n<li>Reverse-biased device measurements<\/li>\n<li>Standby current testing<\/li>\n<li>Sensor current measurements<\/li>\n<li>Low-power electronic device validation<\/li>\n<\/ul>\n<p>\nActual achievable measurement performance depends on range selection, cabling, fixtures, environmental conditions, settling time, and DUT characteristics.\n<\/p>\n<h3>Transient Device Characterization<\/h3>\n<p>\nThe PXIe-4143 provides a maximum sampling rate of approximately 600 kS\/s, allowing it to capture relatively fast changes in DUT electrical behavior.\n<\/p>\n<p>\nThis capability can be useful for analyzing:\n<\/p>\n<ul>\n<li>Startup current<\/li>\n<li>Shutdown behavior<\/li>\n<li>Power-state transitions<\/li>\n<li>Dynamic bias conditions<\/li>\n<li>Transient device response<\/li>\n<\/ul>\n<h3>PXIe-4143 vs PXIe-4147<\/h3>\n<p>\nThe PXIe-4143 and PXIe-4147 are both four-channel PXI Source Measure Units, but their electrical capabilities target different applications.\n<\/p>\n<table>\n<tr>\n<th>\u0424\u0443\u043d\u043a\u0446\u0438\u044f<\/th>\n<th>PXIe-4143<\/th>\n<th>PXIe-4147<\/th>\n<\/tr>\n<tr>\n<td>SMU Channels<\/td>\n<td>4<\/td>\n<td>4<\/td>\n<\/tr>\n<tr>\n<td>Maximum Voltage<\/td>\n<td><strong>\u00b124 V<\/strong><\/td>\n<td>\u00b18 V<\/td>\n<\/tr>\n<tr>\n<td>\u041c\u0430\u043a\u0441\u0438\u043c\u0430\u043b\u044c\u043d\u044b\u0439 \u0442\u043e\u043a<\/td>\n<td>\u00b1150 mA<\/td>\n<td><strong>\u00b13 A<\/strong><\/td>\n<\/tr>\n<tr>\n<td>Primary Strength<\/td>\n<td><strong>Higher Voltage Range<\/strong><\/td>\n<td><strong>Higher Current Capability<\/strong><\/td>\n<\/tr>\n<tr>\n<td>Typical Application<\/td>\n<td>Precision Semiconductor Characterization<\/td>\n<td>High-Current Semiconductor and RF Test<\/td>\n<\/tr>\n<\/table>\n<h3>PXIe-4143 vs PXIe-4162<\/h3>\n<p>\nThe PXIe-4143 and PXIe-4162 target different channel-density and electrical-range requirements.\n<\/p>\n<table>\n<tr>\n<th>\u0424\u0443\u043d\u043a\u0446\u0438\u044f<\/th>\n<th>PXIe-4143<\/th>\n<th>PXIe-4162<\/th>\n<\/tr>\n<tr>\n<td>SMU Channels<\/td>\n<td>4<\/td>\n<td><strong>12<\/strong><\/td>\n<\/tr>\n<tr>\n<td>PXIe-4143 Voltage Capability<\/td>\n<td><strong>\u00b124 V<\/strong><\/td>\n<td>Different Operating Architecture<\/td>\n<\/tr>\n<tr>\n<td>Primary Advantage<\/td>\n<td>Four-Channel Precision Source-Measure<\/td>\n<td>High Channel Density<\/td>\n<\/tr>\n<tr>\n<td>Typical Application<\/td>\n<td>Precision Semiconductor Characterization<\/td>\n<td>High-Density \/ Multi-Site Test<\/td>\n<\/tr>\n<\/table>\n<h3>PXIe-4143 vs Programmable Power Supply<\/h3>\n<table>\n<tr>\n<th>\u0424\u0443\u043d\u043a\u0446\u0438\u044f<\/th>\n<th>PXIe-4143<\/th>\n<th>Programmable Power Supply<\/th>\n<\/tr>\n<tr>\n<td>Primary Function<\/td>\n<td>Precision Source and Measurement<\/td>\n<td>DUT Power<\/td>\n<\/tr>\n<tr>\n<td>Voltage Source<\/td>\n<td>\u0414\u0430<\/td>\n<td>\u0414\u0430<\/td>\n<\/tr>\n<tr>\n<td>Current Source<\/td>\n<td>\u0414\u0430<\/td>\n<td>Model Dependent<\/td>\n<\/tr>\n<tr>\n<td>Precision Current Measurement<\/td>\n<td><strong>\u0414\u0430<\/strong><\/td>\n<td>Generally More Limited<\/td>\n<\/tr>\n<tr>\n<td>4-Quadrant Operation<\/td>\n<td><strong>\u0414\u0430<\/strong><\/td>\n<td>Usually No<\/td>\n<\/tr>\n<tr>\n<td>I-V Characterization<\/td>\n<td><strong>Primary Application<\/strong><\/td>\n<td>Not Primary Application<\/td>\n<\/tr>\n<tr>\n<td>Typical Application<\/td>\n<td>Parametric Test<\/td>\n<td>General DUT Power<\/td>\n<\/tr>\n<\/table>\n<h3>PXIe-4143 with PXI Switching<\/h3>\n<p>\nPXI switching modules can route PXIe-4143 channels to multiple DUT terminals or devices.\n<\/p>\n<p>\nA simplified architecture is:\n<\/p>\n<p>\n<strong>PXIe-4143 \u2192 PXI Switch \u2192 Multiple DUT Test Points<\/strong>\n<\/p>\n<p>\nFor precision source-measure applications, switching hardware should be selected carefully according to:\n<\/p>\n<ul>\n<li>Maximum voltage<\/li>\n<li>Maximum current<\/li>\n<li>Leakage current<\/li>\n<li>Contact resistance<\/li>\n<li>Thermal EMF<\/li>\n<li>\u0418\u0437\u043e\u043b\u044f\u0446\u0438\u044f<\/li>\n<li>Switch topology<\/li>\n<\/ul>\n<h3>PXIe-4143 in a Complete PXI System<\/h3>\n<p>\nThe PXIe-4143 can operate as the precision DC source-measure instrument within a complete <a href=\"https:\/\/pxisource.com\/ru\/product-category\/%d0%bd%d0%b8\/pxi-%d1%81%d0%b8%d1%81%d1%82%d0%b5%d0%bc%d1%81\/\">PXI system<\/a>.\n<\/p>\n<p>\nA typical automated test platform may include:\n<\/p>\n<ul>\n<li><a href=\"https:\/\/pxisource.com\/ru\/product-category\/%d0%bd%d0%b8\/pxi-%d1%81%d0%b8%d1%81%d1%82%d0%b5%d0%bc%d1%81\/pxi-chassis\/\">PXI \u0428\u0430\u0441\u0441\u0438<\/a><\/li>\n<li><a href=\"https:\/\/pxisource.com\/ru\/product-category\/%d0%bd%d0%b8\/pxi-%d1%81%d0%b8%d1%81%d1%82%d0%b5%d0%bc%d1%81\/pxi-controller\/\">PXI \u041a\u043e\u043d\u0442\u0440\u043e\u043b\u043b\u0435\u0440<\/a><\/li>\n<li>PXIe-4143 Source Measure Unit<\/li>\n<li><a href=\"https:\/\/pxisource.com\/ru\/product-category\/%d0%bd%d0%b8\/pxi-%d1%81%d0%b8%d1%81%d1%82%d0%b5%d0%bc%d1%81\/%d0%bc%d0%be%d0%b4%d1%83%d0%bb%d0%b8-pxi\/\">\u041c\u043e\u0434\u0443\u043b\u0438 PXI<\/a><\/li>\n<li>PXI switching modules<\/li>\n<li>PXI digital pattern instruments<\/li>\n<li>PXI oscilloscopes and digitizers<\/li>\n<li>PXI RF instruments<\/li>\n<li>Additional PXI SMUs<\/li>\n<\/ul>\n<p>\nThis modular architecture allows DC parametric, digital, waveform, RF, and functional testing to be integrated into one automated platform.\n<\/p>\n<h3>Software and Driver Support<\/h3>\n<p>\nThe PXIe-4143 is supported by the <strong>NI-DCPower<\/strong> instrument driver for software-controlled source and measurement applications.\n<\/p>\n<p>\nSoftware can be used to configure:\n<\/p>\n<ul>\n<li>Source voltage<\/li>\n<li>Source current<\/li>\n<li>Voltage limits<\/li>\n<li>Current compliance<\/li>\n<li>Measurement ranges<\/li>\n<li>Source sequences<\/li>\n<li>Voltage sweeps<\/li>\n<li>Current sweeps<\/li>\n<li>\u0417\u0430\u043f\u0443\u0441\u043a<\/li>\n<li>Measurement timing<\/li>\n<li>SourceAdapt settings<\/li>\n<\/ul>\n<h3>PXI Chassis Integration<\/h3>\n<p>\nThe PXIe-4143 uses a <strong>3U, one-slot PXI Express<\/strong> module format, allowing multiple SMUs and other PXI instruments to be installed in a compatible chassis.\n<\/p>\n<p>\nWhen configuring a system, verify:\n<\/p>\n<ul>\n<li>PXI Express slot compatibility<\/li>\n<li>Available chassis power<\/li>\n<li>Cooling capacity<\/li>\n<li>Number of required SMU channels<\/li>\n<li>Other installed instrumentation<\/li>\n<li>System synchronization requirements<\/li>\n<\/ul>\n<h3>SMU Selection Considerations<\/h3>\n<p>\nBefore selecting the PXIe-4143, engineers should evaluate the complete DUT and measurement requirements.\n<\/p>\n<p>\nImportant considerations include:\n<\/p>\n<ul>\n<li>Required number of SMU channels<\/li>\n<li>Maximum source voltage<\/li>\n<li>Maximum source current<\/li>\n<li>Source and sink power requirements<\/li>\n<li>Minimum current measurement requirements<\/li>\n<li>Measurement accuracy<\/li>\n<li>Sampling rate<\/li>\n<li>Source update rate<\/li>\n<li>Transient response<\/li>\n<li>Remote sensing requirements<\/li>\n<li>Compliance requirements<\/li>\n<li>DUT connection architecture<\/li>\n<li>PXI chassis compatibility<\/li>\n<\/ul>\n<h3>Industries<\/h3>\n<ul>\n<li>\u0422\u0435\u0441\u0442\u0438\u0440\u043e\u0432\u0430\u043d\u0438\u0435 \u043f\u043e\u043b\u0443\u043f\u0440\u043e\u0432\u043e\u0434\u043d\u0438\u043a\u043e\u0432<\/li>\n<li>Electronic Manufacturing<\/li>\n<li>RF and Wireless Test<\/li>\n<li>Automated Test Equipment<\/li>\n<li>MEMS Development<\/li>\n<li>Sensor Development<\/li>\n<li>Consumer Electronics<\/li>\n<li>Automotive Electronics<\/li>\n<li>\u0410\u044d\u0440\u043e\u043a\u043e\u0441\u043c\u0438\u0447\u0435\u0441\u043a\u0430\u044f \u0438 \u043e\u0431\u043e\u0440\u043e\u043d\u043d\u0430\u044f \u043f\u0440\u043e\u043c\u044b\u0448\u043b\u0435\u043d\u043d\u043e\u0441\u0442\u044c<\/li>\n<li>Research and Development<\/li>\n<\/ul>\n<h3>Applications<\/h3>\n<h4>\u0425\u0430\u0440\u0430\u043a\u0442\u0435\u0440\u0438\u0441\u0442\u0438\u043a\u0430 \u043f\u043e\u043b\u0443\u043f\u0440\u043e\u0432\u043e\u0434\u043d\u0438\u043a\u043e\u0432<\/h4>\n<p>\nFour precision source-measure channels provide programmable DC bias and electrical measurement for compatible semiconductor devices.\n<\/p>\n<h4>I-V Characterization<\/h4>\n<p>\nThe PXIe-4143 can perform automated voltage and current sweeps while measuring DUT response to generate I-V characteristics.\n<\/p>\n<h4>RF IC Power and Measurement<\/h4>\n<p>\nMultiple programmable SMU channels can supply RF integrated circuits while measuring their DC current consumption.\n<\/p>\n<h4>MEMS Testing<\/h4>\n<p>\nThe combination of channel density, precision measurement, and programmable sourcing makes the PXIe-4143 suitable for compatible MEMS characterization.\n<\/p>\n<h4>Open and Short Testing<\/h4>\n<p>\nProgrammable source-measure channels can verify electrical connectivity in semiconductor, PCB, and automated production test applications.\n<\/p>\n<h4>Leakage Current Measurement<\/h4>\n<p>\nThe 10 pA current sensitivity supports compatible low-current semiconductor, sensor, and electronic component measurements.\n<\/p>\n<h4>Automated Production Test<\/h4>\n<p>\nHardware timing, high-speed sequencing, and PXI synchronization make the PXIe-4143 suitable for repeatable automated test systems.\n<\/p>\n<h3>Recommended Related Products<\/h3>\n<table>\n<tr>\n<td width=\"190\">\n<strong>NI PXIe-4143<\/strong>\n<\/td>\n<td>\n4-channel, \u00b124 V, \u00b1150 mA precision PXI Source Measure Unit for semiconductor characterization and automated parametric test.\n<\/td>\n<\/tr>\n<tr>\n<td>\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4147\/\"><strong>NI PXIe-4147<\/strong><\/a>\n<\/td>\n<td>\n4-channel high-current PXI SMU for applications requiring substantially greater current per channel.\n<\/td>\n<\/tr>\n<tr>\n<td>\n<a href=\"https:\/\/pxisource.com\/ru\/product\/%d0%bf%d0%ba%d1%81%d0%b8%d0%b5-4162\/\"><strong>NI PXIe-4162<\/strong><\/a>\n<\/td>\n<td>\n12-channel high-density PXI Source Measure Unit for applications requiring more independent source-measure channels.\n<\/td>\n<\/tr>\n<tr>\n<td>\n<a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4151\/\"><strong>NI PXIe-4151<\/strong><\/a>\n<\/td>\n<td>\nSingle-channel precision PXI Source Measure Unit for applications requiring a different voltage, current, and power architecture.\n<\/td>\n<\/tr>\n<tr>\n<td>\n<a href=\"https:\/\/pxisource.com\/ru\/product-category\/%d0%bd%d0%b8\/pxi-%d1%81%d0%b8%d1%81%d1%82%d0%b5%d0%bc%d1%81\/%d0%bc%d0%be%d0%b4%d1%83%d0%bb%d0%b8-pxi\/\"><strong>NI PXI Modules<\/strong><\/a>\n<\/td>\n<td>\nPXI and PXI Express modules for source measurement, semiconductor test, RF measurement, switching, data acquisition, and automated testing.\n<\/td>\n<\/tr>\n<\/table>\n<h3>Why Choose NI PXIe-4143?<\/h3>\n<ul>\n<li>4 independent precision SMU channels<\/li>\n<li>\u00b124 V voltage capability<\/li>\n<li>\u00b1150 mA maximum current<\/li>\n<li>3.6 W maximum power per channel<\/li>\n<li>10 pA current sensitivity<\/li>\n<li>600 kS\/s maximum sampling rate<\/li>\n<li>100 kS\/s maximum update rate<\/li>\n<li>4-quadrant operation<\/li>\n<li>Integrated remote four-wire sensing<\/li>\n<li>SourceAdapt technology<\/li>\n<li>Hardware timing and triggering<\/li>\n<li>High-speed sequencing<\/li>\n<li>Suitable for I-V characterization<\/li>\n<li>Suitable for semiconductor testing<\/li>\n<li>Compact one-slot PXI Express architecture<\/li>\n<\/ul>\n<h3>Frequently Asked Questions<\/h3>\n<h4>What is the NI PXIe-4143?<\/h4>\n<p>\nThe NI PXIe-4143 is a four-channel precision PXI Express Source Measure Unit designed for programmable voltage and current sourcing together with precision voltage and current measurement.\n<\/p>\n<h4>How many channels does the PXIe-4143 have?<\/h4>\n<p>\nThe PXIe-4143 provides <strong>four independent SMU channels<\/strong>.\n<\/p>\n<h4>What is the voltage range of the PXIe-4143?<\/h4>\n<p>\nThe PXIe-4143 provides bipolar voltage capability up to approximately <strong>\u00b124 V<\/strong>.\n<\/p>\n<h4>What is the maximum current of the PXIe-4143?<\/h4>\n<p>\nEach PXIe-4143 channel provides current capability up to approximately <strong>\u00b1150 mA<\/strong> within the specified operating envelope.\n<\/p>\n<h4>What is the maximum power of the PXIe-4143?<\/h4>\n<p>\nThe PXIe-4143 provides up to approximately <strong>3.6 W per channel<\/strong> within its specified source and sink operating limits.\n<\/p>\n<h4>What is the current sensitivity of the PXIe-4143?<\/h4>\n<p>\nThe PXIe-4143 provides current sensitivity down to approximately <strong>10 pA<\/strong>.\n<\/p>\n<h4>What is the maximum sampling rate of the PXIe-4143?<\/h4>\n<p>\nThe PXIe-4143 provides a maximum sampling rate of approximately <strong>600 kS\/s<\/strong>.\n<\/p>\n<h4>Does the PXIe-4143 support four-quadrant operation?<\/h4>\n<p>\nYes. The PXIe-4143 supports four-quadrant source and sink operation within its specified electrical limits.\n<\/p>\n<h4>Does the PXIe-4143 support remote sensing?<\/h4>\n<p>\nYes. Each channel includes integrated remote four-wire sensing for improved voltage accuracy at the DUT.\n<\/p>\n<h4>Does the PXIe-4143 support SourceAdapt?<\/h4>\n<p>\nYes. SourceAdapt allows engineers to customize the transient response of the SMU for different DUT load characteristics.\n<\/p>\n<h4>Can the PXIe-4143 perform I-V characterization?<\/h4>\n<p>\nYes. Programmable voltage\/current sourcing and precision measurement make the PXIe-4143 suitable for automated I-V characterization.\n<\/p>\n<h4>Can the PXIe-4143 measure leakage current?<\/h4>\n<p>\nYes, for compatible applications. Its 10 pA current sensitivity makes it suitable for a range of low-current measurements, although actual system performance also depends on cabling, fixtures, environmental conditions, range selection, and DUT characteristics.\n<\/p>\n<h4>Can the PXIe-4143 be used for semiconductor testing?<\/h4>\n<p>\nYes. Semiconductor characterization, high-pin-count device testing, I-V measurement, open-short testing, and automated parametric testing are important applications for the PXIe-4143.\n<\/p>\n<h4>Can the PXIe-4143 be used for RF IC testing?<\/h4>\n<p>\nYes. The PXIe-4143 can provide programmable DC power and bias while measuring current consumption in compatible RF integrated circuits.\n<\/p>\n<h4>What is the difference between PXIe-4143 and PXIe-4147?<\/h4>\n<p>\nBoth are four-channel PXI SMUs. The PXIe-4143 provides a wider \u00b124 V voltage range with up to \u00b1150 mA current, while the PXIe-4147 is optimized for substantially higher current with a lower voltage range. The appropriate model depends primarily on the DUT voltage and current requirements.\n<\/p>\n<h4>What is the difference between PXIe-4143 and PXIe-4162?<\/h4>\n<p>\nThe PXIe-4143 provides four SMU channels and emphasizes precision source-measure capability across its \u00b124 V range, while the PXIe-4162 provides twelve channels for applications where higher channel density is a primary requirement.\n<\/p>\n<h4>What is the part number of the PXIe-4143?<\/h4>\n<p>\nThe NI ordering part number for the PXIe-4143 is <strong>782431-01<\/strong>.\n<\/p>\n<h4>What should I check before purchasing a PXIe-4143?<\/h4>\n<p>\nBefore purchasing a PXIe-4143, verify the required voltage range, current range, source and sink power, number of SMU channels, current sensitivity, measurement accuracy, sampling speed, remote sensing requirements, DUT cabling, PXI Express chassis compatibility, software requirements, and ordering part number.\n<\/p>\n<h3>\u0417\u0430\u043a\u043b\u044e\u0447\u0435\u043d\u0438\u0435<\/h3>\n<p>\n\u0417\u0435\u043c\u043b\u044f <strong>NI PXIe-4143 4-Channel Precision PXI Source Measure Unit<\/strong> combines \u00b124 V voltage capability, \u00b1150 mA current capability, 3.6 W per-channel power, 10 pA current sensitivity, 600 kS\/s sampling, four-quadrant operation, remote four-wire sensing, high-speed sequencing, and SourceAdapt technology. Its combination of precision, channel density, and PXI integration makes it particularly suitable for semiconductor characterization, I-V measurements, RF IC power and measurement, MEMS testing, leakage measurements, open-short testing, and automated production test systems.<\/p>","protected":false},"excerpt":{"rendered":"<p>\u0422\u0435\u043a\u0443\u0449\u0430\u044f \u0447\u0443\u0432\u0441\u0442\u0432\u0438\u0442\u0435\u043b\u044c\u043d\u043e\u0441\u0442\u044c: 10 \u043f\u0410<br \/>\n\u0412\u043a\u043b\u044e\u0447\u0430\u0435\u0442 \u0432\u0441\u043f\u043e\u043c\u043e\u0433\u0430\u0442\u0435\u043b\u044c\u043d\u0443\u044e \u043c\u043e\u0449\u043d\u043e\u0441\u0442\u044c: \u2013<br \/>\n\u041a\u043e\u043b\u0438\u0447\u0435\u0441\u0442\u0432\u043e \u043a\u0430\u043d\u0430\u043b\u043e\u0432 SMU: 4<br \/>\n\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u043d\u0430\u043f\u0440\u044f\u0436\u0435\u043d\u0438\u044f: \u043e\u0442 -24 \u0412 \u0434\u043e 24 \u0412<br \/>\n\u0410\u0434\u0430\u043f\u0442\u0430\u0446\u0438\u044f \u0438\u0441\u0442\u043e\u0447\u043d\u0438\u043a\u0430: \u0414\u0430<br \/>\n\u041c\u0430\u043a\u0441\u0438\u043c\u0430\u043b\u044c\u043d\u0430\u044f \u043c\u043e\u0449\u043d\u043e\u0441\u0442\u044c \u0440\u0430\u0441\u0441\u0435\u0438\u0432\u0430\u043d\u0438\u044f \u043f\u043e\u0441\u0442\u043e\u044f\u043d\u043d\u043e\u0433\u043e \u0442\u043e\u043a\u0430: 3,6 \u0412\u0442<br \/>\n\u041c\u0430\u043a\u0441\u0438\u043c\u0430\u043b\u044c\u043d\u0430\u044f \u043c\u043e\u0449\u043d\u043e\u0441\u0442\u044c \u0438\u0441\u0442\u043e\u0447\u043d\u0438\u043a\u0430 \u043f\u043e\u0441\u0442\u043e\u044f\u043d\u043d\u043e\u0433\u043e \u0442\u043e\u043a\u0430: 3,6 \u0412\u0442<br \/>\n\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u043f\u043e\u0441\u0442\u043e\u044f\u043d\u043d\u043e\u0433\u043e \u0442\u043e\u043a\u0430: \u043e\u0442 -150 \u043c\u0410 \u0434\u043e 150 \u043c\u0410<br \/>\n\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u0438\u043c\u043f\u0443\u043b\u044c\u0441\u043d\u043e\u0433\u043e \u0442\u043e\u043a\u0430: \u2013<br \/>\n\u0428\u0438\u043d\u043d\u044b\u0439 \u0441\u043e\u0435\u0434\u0438\u043d\u0438\u0442\u0435\u043b\u044c: PXI Express<\/p>","protected":false},"featured_media":31711,"template":"","meta":{"_acf_changed":false},"product_brand":[18],"product_cat":[744],"product_tag":[],"class_list":["post-32428","product","type-product","status-publish","has-post-thumbnail","product_brand-national-instruments","product_cat-pxi-programmable-power-supplies-smu","first","instock","shipping-taxable","purchasable","product-type-simple"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v25.0 (Yoast SEO v28.4) - https:\/\/yoast.com\/product\/yoast-seo-premium-wordpress\/ -->\n<title>NI PXIe-4143 PXI Source Measure Unit 782431-01, In Stock | Project Pricing<\/title>\n<meta name=\"description\" content=\"NI PXIe-4143 is a 4-channel precision PXI SMU with \u00b124 V, \u00b1150 mA, 3.6 W per channel, 10 pA sensitivity and SourceAdapt for semiconductor testing.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4143\/\" \/>\n<meta property=\"og:locale\" content=\"ru_RU\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"PXIe-4143\" \/>\n<meta property=\"og:description\" content=\"NI PXIe-4143 is a 4-channel precision PXI SMU with \u00b124 V, \u00b1150 mA, 3.6 W per channel, 10 pA sensitivity and SourceAdapt for semiconductor testing.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/pxisource.com\/ru\/product\/pxie-4143\/\" \/>\n<meta property=\"og:site_name\" content=\"PXI Source\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/profile.php?id=61582573040385\" \/>\n<meta property=\"article:modified_time\" 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