{"id":32426,"date":"2026-04-29T09:19:38","date_gmt":"2026-04-29T01:19:38","guid":{"rendered":"https:\/\/pxisource.com\/?post_type=product&#038;p=32426"},"modified":"2026-08-28T17:23:48","modified_gmt":"2026-08-28T09:23:48","slug":"pxie-4144","status":"publish","type":"product","link":"https:\/\/pxisource.com\/ru\/product\/pxie-4144\/","title":{"rendered":"PXIe-4144"},"content":{"rendered":"<p>\u0417\u0435\u043c\u043b\u044f <strong>PXIe-4144<\/strong> is a four-channel source measure unit designed for high-pin-count electronic and semiconductor test applications. Each channel combines programmable voltage and current sourcing with precision voltage and current measurements in a single-slot <a href=\"https:\/\/pxisource.com\/ru\/product-category\/%d0%bd%d0%b8\/pxi-%d1%81%d0%b8%d1%81%d1%82%d0%b5%d0%bc%d1%81\/%d0%bc%d0%be%d0%b4%d1%83%d0%bb%d0%b8-pxi\/\">PXI Express module<\/a>.<\/p>\n<p>With a \u00b16 V voltage range, current ranges up to \u00b1500 mA, four-quadrant operation and continuous measurement rates up to 600 kS\/s per channel, the PXIe-4144 can perform rapid I-V characterization, power electronic devices and capture transient electrical behavior.<\/p>\n<h3>Key Features of the PXIe-4144<\/h3>\n<ul>\n<li>Four source measure unit channels<\/li>\n<li>Four-quadrant source and sink operation<\/li>\n<li>\u00b16 V voltage range per channel<\/li>\n<li>Up to \u00b1500 mA per channel<\/li>\n<li>Up to 3 W source or sink power per channel<\/li>\n<li>Current ranges from \u00b110 \u00b5A to \u00b1500 mA<\/li>\n<li>Current sensitivity down to 150 pA<\/li>\n<li>Maximum continuous measurement rate of 600 kS\/s per channel<\/li>\n<li>Maximum source update rate of 100 kS\/s per channel<\/li>\n<li>Integrated four-wire remote sensing<\/li>\n<li>Slow, normal and fast transient-response settings<\/li>\n<li>Hardware sequencing and PXI triggering<\/li>\n<li>Channels isolated from earth ground<\/li>\n<li>Single-slot 3U PXI Express form factor<\/li>\n<\/ul>\n<h3>PXIe-4144 Technical Specifications<\/h3>\n<table>\n<tbody>\n<tr>\n<th>Product Model<\/th>\n<td>PXIe-4144<\/td>\n<\/tr>\n<tr>\n<th>Part Number<\/th>\n<td>782432-01<\/td>\n<\/tr>\n<tr>\n<th>Product Type<\/th>\n<td>PXI Source Measure Unit<\/td>\n<\/tr>\n<tr>\n<th>Number of SMU Channels<\/th>\n<td>4<\/td>\n<\/tr>\n<tr>\n<th>Operating Quadrants<\/th>\n<td>Four-quadrant source and sink operation<\/td>\n<\/tr>\n<tr>\n<th>Voltage Range<\/th>\n<td>-6 V to +6 V<\/td>\n<\/tr>\n<tr>\n<th>\u041c\u0430\u043a\u0441\u0438\u043c\u0430\u043b\u044c\u043d\u044b\u0439 \u0442\u043e\u043a<\/th>\n<td>\u00b1500 mA per channel<\/td>\n<\/tr>\n<tr>\n<th>Available Current Ranges<\/th>\n<td>10 \u00b5A, 100 \u00b5A, 1 mA, 10 mA, 100 mA and 500 mA<\/td>\n<\/tr>\n<tr>\n<th>Current Sensitivity<\/th>\n<td>150 pA<\/td>\n<\/tr>\n<tr>\n<th>Maximum DC Power<\/th>\n<td>3 W per channel<\/td>\n<\/tr>\n<tr>\n<th>Maximum Module Sinking Power<\/th>\n<td>7 W, with temperature derating above 45\u00b0C<\/td>\n<\/tr>\n<tr>\n<th>Voltage Resolution and Noise<\/th>\n<td>60 \u00b5V on the 6 V range<\/td>\n<\/tr>\n<tr>\n<th>Voltage Accuracy<\/th>\n<td>\u00b1(0.1% of reading + 10 mV)<\/td>\n<\/tr>\n<tr>\n<th>10 \u00b5A Range Resolution and Noise<\/th>\n<td>150 pA<\/td>\n<\/tr>\n<tr>\n<th>500 mA Range Resolution and Noise<\/th>\n<td>5 \u00b5A<\/td>\n<\/tr>\n<tr>\n<th>Maximum Continuous Measurement Rate<\/th>\n<td>600,000 samples\/s per channel<\/td>\n<\/tr>\n<tr>\n<th>Maximum Source Update Rate<\/th>\n<td>100,000 updates\/s per channel for supported sequences<\/td>\n<\/tr>\n<tr>\n<th>Remote Sense<\/th>\n<td>Four-wire remote sensing on every channel<\/td>\n<\/tr>\n<tr>\n<th>Maximum Sense Lead Drop<\/th>\n<td>Up to 1 V per lead under specified output conditions<\/td>\n<\/tr>\n<tr>\n<th>Typical Settling Time<\/th>\n<td>Less than 100 \u00b5s<\/td>\n<\/tr>\n<tr>\n<th>Typical Transient Response<\/th>\n<td>Less than 100 \u00b5s<\/td>\n<\/tr>\n<tr>\n<th>SourceAdapt<\/th>\n<td>No<\/td>\n<\/tr>\n<tr>\n<th>Transient Response Modes<\/th>\n<td>Slow, normal and fast<\/td>\n<\/tr>\n<tr>\n<th>Channel Isolation<\/th>\n<td>Isolated from earth ground; channels share a common LO<\/td>\n<\/tr>\n<tr>\n<th>Channel-to-Ground Isolation<\/th>\n<td>60 VDC, CAT I<\/td>\n<\/tr>\n<tr>\n<th>Front Connector<\/th>\n<td>25-position male D-SUB<\/td>\n<\/tr>\n<tr>\n<th>Form Factor<\/th>\n<td>3U, single-slot PXI Express module<\/td>\n<\/tr>\n<tr>\n<th>Dimensions<\/th>\n<td>2.0 cm \u00d7 13.0 cm \u00d7 21.6 cm<\/td>\n<\/tr>\n<tr>\n<th>Weight<\/th>\n<td>408 g (14.39 oz)<\/td>\n<\/tr>\n<tr>\n<th>Recommended Calibration Interval<\/th>\n<td>1 year<\/td>\n<\/tr>\n<tr>\n<th>Operating Temperature<\/th>\n<td>0\u00b0C to 55\u00b0C<\/td>\n<\/tr>\n<tr>\n<th>Storage Temperature<\/th>\n<td>-40\u00b0C to 70\u00b0C<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<h3>PXIe-4144 Part Number and Configuration<\/h3>\n<table>\n<thead>\n<tr>\n<th>Part Number<\/th>\n<th>\u041a\u0430\u043d\u0430\u043b\u044b<\/th>\n<th>Voltage Range<\/th>\n<th>\u041c\u0430\u043a\u0441\u0438\u043c\u0430\u043b\u044c\u043d\u044b\u0439 \u0442\u043e\u043a<\/th>\n<th>Current Sensitivity<\/th>\n<\/tr>\n<\/thead>\n<tbody>\n<tr>\n<td>782432-01<\/td>\n<td>4<\/td>\n<td>\u00b16 V<\/td>\n<td>\u00b1500 mA<\/td>\n<td>150 pA<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>The standard package includes the PXIe-4144 module, a PXIe-4140 terminal block pinout overlay, a 25-pin female D-SUB to 25-pin spring-terminal connector and safety, environmental and regulatory documentation.<\/p>\n<h3>Four-Channel SMU Architecture<\/h3>\n<p>The PXIe-4144 combines four source measure unit channels in one PXI Express slot. Each channel can program voltage or current, apply a compliance limit and measure the resulting voltage and current at the device under test.<\/p>\n<p>This integration can replace separate power supplies, electronic loads and digital multimeters in many low-voltage component and semiconductor test applications.<\/p>\n<h3>Four-Quadrant Operation<\/h3>\n<p>Each channel supports four-quadrant operation, allowing it to source or sink positive and negative voltage and current. This flexibility enables the module to test devices that both consume and return power.<\/p>\n<p>The PXIe-4144 can perform voltage sourcing with current measurement, current sourcing with voltage measurement and limited electronic load functions within its operating envelope.<\/p>\n<h3>\u00b16 V and \u00b1500 mA Output Capability<\/h3>\n<p>The PXIe-4144 supports voltages from -6 V to +6 V and current ranges up to \u00b1500 mA on every channel. Each channel provides up to 3 W of DC source or sink capability.<\/p>\n<p>The maximum module sinking power is limited to 7 W and requires additional derating when the ambient temperature exceeds 45\u00b0C. All operating points must remain within the channel and module power limits.<\/p>\n<h3>Multiple Current Ranges<\/h3>\n<p>Selectable current ranges include 10 \u00b5A, 100 \u00b5A, 1 mA, 10 mA, 100 mA and 500 mA. This allows the PXIe-4144 to measure both low standby currents and substantially higher active operating currents.<\/p>\n<p>Selecting the smallest current range that safely covers the expected signal generally provides the best measurement resolution and accuracy.<\/p>\n<h3>150 pA Current Sensitivity<\/h3>\n<p>On the 10 \u00b5A current range, the PXIe-4144 provides resolution and noise down to 150 pA under the specified conditions. This makes it suitable for leakage, standby-current and low-power device measurements.<\/p>\n<p>Low-current measurement performance also depends on fixture cleanliness, cable insulation, shielding, grounding, aperture time and environmental conditions.<\/p>\n<h3>600 kS\/s Measurement Rate<\/h3>\n<p>The PXIe-4144 can continuously transfer voltage and current measurements to the host at rates up to 600 kS\/s per channel. The high sampling rate enables detailed analysis of device startup behavior, current pulses and other transient events.<\/p>\n<p>Actual acquisition rate depends on aperture time, source delay, sequence settings, load settling and the number of measurements transferred.<\/p>\n<h3>High-Speed Source Sequencing<\/h3>\n<p>The module supports source updates at rates up to 100 kS\/s per channel for supported hardware sequences. Hardware sequencing reduces software overhead by executing programmed voltage or current steps directly on the instrument.<\/p>\n<p>This capability is useful for rapid I-V sweeps, power sequencing, margin testing and production applications with short test-time requirements.<\/p>\n<h3>Four-Wire Remote Sensing<\/h3>\n<p>Each channel includes four-wire remote sensing to compensate for voltage drop across cables, switches and test fixtures. The sense conductors measure voltage directly at the device under test without carrying the primary load current.<\/p>\n<p>Remote sensing is particularly valuable on the 500 mA range, where cable and connector resistance can create a measurable voltage error at the DUT.<\/p>\n<h3>Shared Common LO Configuration<\/h3>\n<p>The PXIe-4144 channels are isolated from earth ground but share a common LO connection. They are not independently isolated from one another.<\/p>\n<p>This shared-LO architecture must be considered when connecting multiple DUT power rails or floating circuits. Verify that the required channels can safely share the same low reference before finalizing the test fixture.<\/p>\n<h3>Transient Response Settings<\/h3>\n<p>The PXIe-4144 provides slow, normal and fast transient-response modes. These predefined settings allow the response to be adjusted for different load capacitance and stability requirements.<\/p>\n<p>The PXIe-4144 does not provide user-customizable SourceAdapt control. Applications requiring fully programmable transient-response parameters should consider the newer PXIe-4145.<\/p>\n<h3>Hardware Timing and Triggering<\/h3>\n<p>Start, source, sequence-advance and measurement triggers can be routed through the PXI Express trigger lines. Output events include source complete, measurement complete and sequence completion.<\/p>\n<p>This hardware synchronization enables the PXIe-4144 to coordinate with switches, digital pattern instruments, oscilloscopes and other SMUs without relying entirely on software timing.<\/p>\n<h3>\u0422\u0438\u043f\u0438\u0447\u043d\u044b\u0435 \u043f\u0440\u0438\u043c\u0435\u043d\u0435\u043d\u0438\u044f<\/h3>\n<ul>\n<li>Semiconductor component testing<\/li>\n<li>Power management IC characterization<\/li>\n<li>Mixed-signal IC production testing<\/li>\n<li>Mobile and battery-powered device testing<\/li>\n<li>Leakage-current measurement<\/li>\n<li>Standby-current testing<\/li>\n<li>Rapid I-V characterization<\/li>\n<li>Multirail power sequencing<\/li>\n<li>MEMS and sensor testing<\/li>\n<li>High-pin-count automated validation<\/li>\n<\/ul>\n<h3>Software Compatibility<\/h3>\n<p>The PXIe-4144 is controlled using the NI-DCPower instrument driver. NI-DCPower provides functions for configuring output modes, voltage and current levels, compliance limits, measurement ranges, remote sensing, triggering and hardware sequences.<\/p>\n<p>InstrumentStudio can be used for interactive configuration and measurement. Automated systems can be developed using LabVIEW, LabWindows\/CVI, supported .NET environments and NI TestStand.<\/p>\n<h3>PXI Express System Integration<\/h3>\n<p>The PXIe-4144 occupies one 3U PXI Express or compatible CompactPCI Express slot. Its high channel density makes it possible to install many SMU channels in a compact automated test system.<\/p>\n<p>The selected chassis must provide adequate slot cooling and power. When the chassis has adjustable fan settings, the highest fan setting may be required to maintain published specifications.<\/p>\n<h3>PXIe-4144 Connection Guidance<\/h3>\n<ul>\n<li>Power off the PXI chassis before installing the module.<\/li>\n<li>Use the supplied terminal block and pinout overlay.<\/li>\n<li>Verify the shared common LO architecture before wiring the DUT.<\/li>\n<li>Set suitable voltage and current compliance limits.<\/li>\n<li>Use remote sensing for current levels that create significant lead drop.<\/li>\n<li>Keep low-current signal paths clean and properly insulated.<\/li>\n<li>Allow at least 30 minutes of warm-up for accuracy-sensitive testing.<\/li>\n<li>Perform self-calibration within the recommended period.<\/li>\n<\/ul>\n<h3>PXIe-4144 Troubleshooting<\/h3>\n<h4>A channel enters compliance unexpectedly<\/h4>\n<p>Check the programmed voltage or current limit, DUT impedance and fixture wiring. Excessive cable resistance or an incorrect remote-sense connection can also cause unexpected compliance behavior.<\/p>\n<h4>The measured voltage differs from the DUT voltage<\/h4>\n<p>Enable four-wire remote sensing and connect the sense terminals directly to the DUT. Confirm that the total lead drop remains within the supported remote-sense limits.<\/p>\n<h4>Low-current measurements are unstable<\/h4>\n<p>Use the smallest suitable current range, increase the measurement aperture and inspect the fixture for surface contamination or leakage. Shield sensitive connections from electrical noise.<\/p>\n<h4>The output oscillates with a capacitive load<\/h4>\n<p>Select the slow or normal transient-response setting. The fast mode may not provide sufficient stability for every load capacitance.<\/p>\n<h4>Multiple channels interfere with one another<\/h4>\n<p>Remember that all four channels share a common LO. Check for unintended ground paths or incompatible floating references in the test fixture.<\/p>\n<h4>The module reports an overtemperature condition<\/h4>\n<p>Verify chassis airflow and fan speed. Reduce simultaneous channel power or current sinking, particularly when operating above 45\u00b0C ambient temperature.<\/p>\n<h3>PXIe-4144 Compared with Related SMUs<\/h3>\n<table>\n<thead>\n<tr>\n<th>\u041c\u043e\u0434\u0435\u043b\u044c<\/th>\n<th>\u041a\u0430\u043d\u0430\u043b\u044b<\/th>\n<th>Voltage Range<\/th>\n<th>\u041c\u0430\u043a\u0441\u0438\u043c\u0430\u043b\u044c\u043d\u044b\u0439 \u0442\u043e\u043a<\/th>\n<th>SourceAdapt<\/th>\n<\/tr>\n<\/thead>\n<tbody>\n<tr>\n<td>PXIe-4144<\/td>\n<td>4<\/td>\n<td>\u00b16 V<\/td>\n<td>\u00b1500 mA<\/td>\n<td>No<\/td>\n<\/tr>\n<tr>\n<td>PXIe-4145<\/td>\n<td>4<\/td>\n<td>\u00b16 V<\/td>\n<td>\u00b1500 mA<\/td>\n<td>\u0414\u0430<\/td>\n<\/tr>\n<tr>\n<td>PXIe-4143<\/td>\n<td>4<\/td>\n<td>\u00b124 V<\/td>\n<td>\u00b1150 mA<\/td>\n<td>\u0414\u0430<\/td>\n<\/tr>\n<tr>\n<td>PXIe-4141<\/td>\n<td>4<\/td>\n<td>\u00b110 V<\/td>\n<td>\u00b1100 mA<\/td>\n<td>\u0414\u0430<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<h3>Recommended Related Products<\/h3>\n<ul>\n<li><a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4145\/\">NI PXIe-4145 Precision Source Measure Unit<\/a> \u2013 A newer four-channel \u00b16 V, \u00b1500 mA SMU with greater current sensitivity and SourceAdapt support.<\/li>\n<li><a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4143\/\">NI PXIe-4143 Precision Source Measure Unit<\/a> \u2013 Provides a wider \u00b124 V range with up to \u00b1150 mA per channel.<\/li>\n<li><a href=\"https:\/\/pxisource.com\/ru\/product\/pxie-4141\/\">NI PXIe-4141 Precision Source Measure Unit<\/a> \u2013 Suitable for four-channel \u00b110 V applications requiring lower maximum current.<\/li>\n<li><a href=\"https:\/\/pxisource.com\/ru\/product\/%d0%bf%d0%ba%d1%81%d0%b8%d0%b5-6571\/\">NI PXIe-6571 Digital Pattern Instrument<\/a> \u2013 Can be combined with SMUs for mixed-signal and semiconductor production testing.<\/li>\n<\/ul>\n<h3>How to Select the Correct PXI SMU<\/h3>\n<p>Choose the PXIe-4144 when the application requires four \u00b16 V channels with up to \u00b1500 mA and integrated high-speed measurements. It is suitable for low-voltage devices that require more current than many general-purpose precision SMUs provide.<\/p>\n<p>Choose the PXIe-4145 when custom SourceAdapt response control or improved low-current sensitivity is required. Select a \u00b124 V or higher-voltage SMU when the DUT voltage exceeds the PXIe-4144\u2019s \u00b16 V range.<\/p>\n<h3>Why Choose the PXIe-4144?<\/h3>\n<ul>\n<li>Combines four SMUs in one PXI Express slot<\/li>\n<li>Supports four-quadrant source and sink operation<\/li>\n<li>Provides up to \u00b1500 mA per channel<\/li>\n<li>Measures current with sensitivity down to 150 pA<\/li>\n<li>Captures measurements at up to 600 kS\/s per channel<\/li>\n<li>Supports rapid hardware-timed sequences<\/li>\n<li>Includes remote sensing on every channel<\/li>\n<li>Integrates with PXI semiconductor test systems<\/li>\n<\/ul>\n<h3>Frequently Asked Questions<\/h3>\n<h4>What is the PXIe-4144 used for?<\/h4>\n<p>The PXIe-4144 sources and measures voltage and current for semiconductor characterization, mixed-signal IC testing and automated electronic validation.<\/p>\n<h4>What is the PXIe-4144 part number?<\/h4>\n<p>The standard NI part number is <strong>782432-01<\/strong>.<\/p>\n<h4>How many SMU channels does it provide?<\/h4>\n<p>The module provides four independently programmable SMU channels that share a common LO connection.<\/p>\n<h4>What are the maximum voltage and current?<\/h4>\n<p>Each channel supports voltages from -6 V to +6 V and currents up to \u00b1500 mA.<\/p>\n<h4>Can the PXIe-4144 sink current?<\/h4>\n<p>Yes. Its four-quadrant architecture allows each channel to source or sink voltage and current within the applicable power limits.<\/p>\n<h4>Does it support SourceAdapt?<\/h4>\n<p>No. The PXIe-4144 provides predefined slow, normal and fast response modes but does not support custom SourceAdapt tuning.<\/p>\n<h4>Does every channel support remote sensing?<\/h4>\n<p>Yes. All four channels include integrated four-wire remote sensing.<\/p>\n<h4>What is the maximum sampling rate?<\/h4>\n<p>The module supports continuous voltage and current measurements at up to 600 kS\/s per channel.<\/p>\n<h4>Are the four channels isolated from one another?<\/h4>\n<p>No. The channels are isolated from earth ground but share a common LO reference.<\/p>\n<h4>Which software controls the PXIe-4144?<\/h4>\n<p>The module uses NI-DCPower and can be operated with InstrumentStudio or programmed through supported LabVIEW, LabWindows\/CVI, .NET and TestStand environments.<\/p>\n<h3>Request a Quote for the PXIe-4144<\/h3>\n<p>Contact us for current availability, lead time and project pricing for the <strong>PXIe-4144 Four-Channel PXI Source Measure Unit<\/strong>. We can also help identify compatible terminal blocks, cables, PXI chassis and related semiconductor test modules.<\/p>","protected":false},"excerpt":{"rendered":"<p>\u0422\u0435\u043a\u0443\u0449\u0430\u044f \u0447\u0443\u0432\u0441\u0442\u0432\u0438\u0442\u0435\u043b\u044c\u043d\u043e\u0441\u0442\u044c: 150 \u043f\u0410<br \/>\n\u0412\u043a\u043b\u044e\u0447\u0430\u0435\u0442 \u0432\u0441\u043f\u043e\u043c\u043e\u0433\u0430\u0442\u0435\u043b\u044c\u043d\u0443\u044e \u043c\u043e\u0449\u043d\u043e\u0441\u0442\u044c: \u2013<br \/>\n\u041a\u043e\u043b\u0438\u0447\u0435\u0441\u0442\u0432\u043e \u043a\u0430\u043d\u0430\u043b\u043e\u0432 SMU: 4<br \/>\n\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u043d\u0430\u043f\u0440\u044f\u0436\u0435\u043d\u0438\u044f: \u043e\u0442 -6 \u0412 \u0434\u043e 6 \u0412<br \/>\nSourceAdapt: \u041d\u0435\u0442<br \/>\n\u041c\u0430\u043a\u0441. \u043c\u043e\u0449\u043d\u043e\u0441\u0442\u044c \u0440\u0430\u0441\u0441\u0435\u044f\u043d\u0438\u044f DC: 3 \u0412\u0442<br \/>\n\u041c\u0430\u043a\u0441. \u043c\u043e\u0449\u043d\u043e\u0441\u0442\u044c \u0438\u0441\u0442\u043e\u0447\u043d\u0438\u043a\u0430 \u043f\u043e\u0441\u0442\u043e\u044f\u043d\u043d\u043e\u0433\u043e \u0442\u043e\u043a\u0430: 3 \u0412\u0442<br \/>\n\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u043f\u043e\u0441\u0442\u043e\u044f\u043d\u043d\u043e\u0433\u043e \u0442\u043e\u043a\u0430: \u043e\u0442 -500 \u043c\u0410 \u0434\u043e 500 \u043c\u0410<br \/>\n\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u0438\u043c\u043f\u0443\u043b\u044c\u0441\u043d\u043e\u0433\u043e \u0442\u043e\u043a\u0430: \u2013<br \/>\n\u0428\u0438\u043d\u043d\u044b\u0439 \u0441\u043e\u0435\u0434\u0438\u043d\u0438\u0442\u0435\u043b\u044c: PXI 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