{"id":29039,"date":"2025-09-16T14:03:32","date_gmt":"2025-09-16T06:03:32","guid":{"rendered":"https:\/\/pxisource.com\/?post_type=product&p=29039"},"modified":"2026-08-05T22:42:05","modified_gmt":"2026-08-05T14:42:05","slug":"pxie-6537","status":"publish","type":"product","link":"https:\/\/pxisource.com\/ru\/product\/pxie-6537\/","title":{"rendered":"PXIe-6537"},"content":{"rendered":"

Product Introduction<\/h3>\n

\n\u0417\u0435\u043c\u043b\u044f NI PXIe-6537<\/strong> is a high-speed digital I\/O module designed for PXI Express-based automated test systems, semiconductor testing, embedded validation, and digital signal applications. It provides flexible digital pattern generation and acquisition capabilities for testing high-speed digital devices and electronic systems.\n<\/p>\n

\nFeaturing 32 bidirectional digital channels, hardware-timed digital waveform generation and acquisition, programmable timing control, and NI-HSDIO software support, the PXIe-6537 enables engineers to build scalable digital test platforms with precise synchronization and high-speed data transfer.\n<\/p>\n

Product Overview<\/h3>\n

\n\u0417\u0435\u043c\u043b\u044f PXIe-6537<\/strong> belongs to the NI High-Speed Digital I\/O (HSDIO) product family and provides advanced digital pattern testing capabilities in a PXI Express modular platform.\n<\/p>\n

\nThe module is designed for applications requiring deterministic digital stimulus generation, digital response capture, and high-speed communication testing. It can be integrated with PXI controllers, FPGA modules, signal generators, and other test instruments to create complete automated validation systems.\n<\/p>\n

\nWith PXI Express high-bandwidth architecture, flexible timing resources, and NI-HSDIO driver support, the PXIe-6537 is suitable for semiconductor validation, digital interface testing, and research applications.\n<\/p>\n

Key Features<\/h3>\n

32 Bidirectional Digital Channels<\/h4>\n

\nThe PXIe-6537 provides flexible digital input and output capability.\n<\/p>\n

    \n
  • 32 digital I\/O channels<\/li>\n
  • Programmable input\/output direction<\/li>\n
  • Digital pattern generation<\/li>\n
  • Digital data acquisition<\/li>\n
  • Parallel device testing<\/li>\n<\/ul>\n

    \nAdvantage:<\/strong> Enables testing of complex digital interfaces with a single PXI Express module.\n<\/p>\n

    High-Speed Digital Pattern Generation<\/h4>\n

    \nThe module provides precise digital stimulus generation for device testing.\n<\/p>\n

      \n
    • Hardware-timed pattern output<\/li>\n
    • Programmable digital waveforms<\/li>\n
    • Deterministic timing control<\/li>\n
    • Repeatable test sequences<\/li>\n
    • Automated digital stimulation<\/li>\n<\/ul>\n

      \nAdvantage:<\/strong> Provides accurate and repeatable digital testing for electronic devices.\n<\/p>\n

      High-Speed Digital Data Acquisition<\/h4>\n

      \nThe PXIe-6537 supports high-speed capture of digital signals.\n<\/p>\n

        \n
      • Digital waveform acquisition<\/li>\n
      • High-speed data capture<\/li>\n
      • Logic signal monitoring<\/li>\n
      • Protocol validation<\/li>\n
      • Digital debugging<\/li>\n<\/ul>\n

        \nAdvantage:<\/strong> Allows engineers to analyze and validate fast digital communication signals.\n<\/p>\n

        Hardware Timing and Synchronization<\/h4>\n

        \nThe PXIe-6537 provides accurate timing control for advanced digital testing.\n<\/p>\n

          \n
        • Hardware clocking<\/li>\n
        • External triggering<\/li>\n
        • PXI synchronization<\/li>\n
        • Deterministic operation<\/li>\n
        • Multi-module coordination<\/li>\n<\/ul>\n

          \nAdvantage:<\/strong> Supports synchronized testing with other PXI instruments.\n<\/p>\n

          PXI Express High-Bandwidth Interface<\/h4>\n

          \nThe PXIe-6537 uses PXI Express technology for high-speed communication.\n<\/p>\n

            \n
          • High-speed PCI Express communication<\/li>\n
          • Fast digital data transfer<\/li>\n
          • Low-latency operation<\/li>\n
          • Scalable PXI architecture<\/li>\n
          • Multi-instrument integration<\/li>\n<\/ul>\n

            \nAdvantage:<\/strong> Handles demanding digital test applications requiring high throughput.\n<\/p>\n

            NI-HSDIO Software Support<\/h4>\n

            \nThe PXIe-6537 integrates with NI high-speed digital I\/O software tools.\n<\/p>\n

              \n
            • NI-HSDIO driver support<\/li>\n
            • \u0418\u043d\u0442\u0435\u0433\u0440\u0430\u0446\u0438\u044f LabVIEW<\/li>\n
            • TestStand compatibility<\/li>\n
            • Digital waveform editing<\/li>\n
            • Automated test development<\/li>\n<\/ul>\n

              \nAdvantage:<\/strong> Simplifies programming and deployment of digital test systems.\n<\/p>\n

              Technical Specifications<\/h3>\n\n\n\n\n\n\n\n\n\n\n
              \u041f\u0430\u0440\u0430\u043c\u0435\u0442\u0440<\/th>\n\u041e\u043f\u0438\u0441\u0430\u043d\u0438\u0435<\/th>\n<\/tr>\n
              Product Type<\/td>\nPXI Express High-Speed Digital I\/O Module<\/td>\n<\/tr>\n
              Digital Channels<\/td>\n32 Bidirectional Channels<\/td>\n<\/tr>\n
              Channel Direction<\/td>\nProgrammable Input\/Output<\/td>\n<\/tr>\n
              Digital Function<\/td>\nPattern Generation and Acquisition<\/td>\n<\/tr>\n
              Timing Control<\/td>\nHardware-Timed Digital I\/O<\/td>\n<\/tr>\n
              Interface<\/td>\nPXI Express<\/td>\n<\/tr>\n
              Driver<\/td>\nNI-HSDIO<\/td>\n<\/tr>\n
              Programming Support<\/td>\nLabVIEW, TestStand, C\/C++, C#, .NET<\/td>\n<\/tr>\n<\/table>\n

              Software Ecosystem<\/h3>\n

              \nThe PXIe-6537 integrates with NI software tools for digital testing and automated measurement systems.\n<\/p>\n

                \n
              • \nNI-HSDIO:<\/strong> Provides digital waveform generation, acquisition, timing configuration, and hardware control.\n<\/li>\n
              • \nLabVIEW:<\/strong> Enables graphical development of digital test applications.\n<\/li>\n
              • \nTestStand:<\/strong> Supports automated production test sequences.\n<\/li>\n
              • \nNI MAX:<\/strong> Provides hardware configuration and diagnostics.\n<\/li>\n
              • \nC\/C++, C#, .NET:<\/strong> Supports custom digital test software development.\n<\/li>\n<\/ul>\n

                Industries<\/h3>\n
                  \n
                • \u0422\u0435\u0441\u0442\u0438\u0440\u043e\u0432\u0430\u043d\u0438\u0435 \u043f\u043e\u043b\u0443\u043f\u0440\u043e\u0432\u043e\u0434\u043d\u0438\u043a\u043e\u0432<\/li>\n
                • Electronics Manufacturing<\/li>\n
                • Embedded Systems<\/li>\n
                • \u0410\u044d\u0440\u043e\u043a\u043e\u0441\u043c\u0438\u0447\u0435\u0441\u043a\u0430\u044f \u0438 \u043e\u0431\u043e\u0440\u043e\u043d\u043d\u0430\u044f \u043f\u0440\u043e\u043c\u044b\u0448\u043b\u0435\u043d\u043d\u043e\u0441\u0442\u044c<\/li>\n
                • Automotive Electronics<\/li>\n
                • Communication Equipment<\/li>\n
                • \u0418\u0441\u0441\u043b\u0435\u0434\u043e\u0432\u0430\u0442\u0435\u043b\u044c\u0441\u043a\u0438\u0435 \u043b\u0430\u0431\u043e\u0440\u0430\u0442\u043e\u0440\u0438\u0438<\/li>\n
                • Automated Test Equipment<\/li>\n<\/ul>\n

                  Applications<\/h3>\n

                  Semiconductor Device Testing<\/h4>\n

                  \nThe PXIe-6537 provides digital pattern testing capability for semiconductor devices.\n<\/p>\n

                    \n
                  • IC functional testing<\/li>\n
                  • Digital interface validation<\/li>\n
                  • Memory testing<\/li>\n
                  • Device characterization<\/li>\n<\/ul>\n

                    Digital Protocol Testing<\/h4>\n

                    \nThe module supports validation of high-speed digital communication interfaces.\n<\/p>\n

                      \n
                    • Protocol verification<\/li>\n
                    • Logic analysis<\/li>\n
                    • Embedded communication testing<\/li>\n
                    • Interface debugging<\/li>\n<\/ul>\n

                      Electronic Product Validation<\/h4>\n

                      \nThe PXIe-6537 helps engineers validate digital electronic designs.\n<\/p>\n

                        \n
                      • Prototype testing<\/li>\n
                      • Hardware verification<\/li>\n
                      • Functional testing<\/li>\n
                      • Design validation<\/li>\n<\/ul>\n

                        \u0410\u0432\u0442\u043e\u043c\u0430\u0442\u0438\u0437\u0438\u0440\u043e\u0432\u0430\u043d\u043d\u044b\u0435 \u0438\u0441\u043f\u044b\u0442\u0430\u0442\u0435\u043b\u044c\u043d\u044b\u0435 \u0441\u0438\u0441\u0442\u0435\u043c\u044b<\/h4>\n

                        \nThe module integrates into PXI-based automated test platforms.\n<\/p>\n

                          \n
                        • Production testing<\/li>\n
                        • Device verification<\/li>\n
                        • Multi-instrument systems<\/li>\n
                        • High-throughput testing<\/li>\n<\/ul>\n

                          Comparison with Similar Products<\/h3>\n\n\n\n\n\n\n
                          \u041c\u043e\u0434\u0435\u043b\u044c<\/th>\n\u041e\u0441\u043d\u043e\u0432\u043d\u043e\u0435 \u0440\u0430\u0437\u043b\u0438\u0447\u0438\u0435<\/th>\nBest Application<\/th>\n<\/tr>\n
                          \nNI PXIe-6537<\/strong><\/a>\n<\/td>\n\n32-channel PXI Express high-speed digital I\/O module.\n<\/td>\n\nDigital pattern testing and validation\n<\/td>\n<\/tr>\n
                          \nNI PXIe-6536<\/strong><\/a>\n<\/td>\n\nHigh-speed digital I\/O module with different performance configuration.\n<\/td>\n\nDigital waveform applications\n<\/td>\n<\/tr>\n
                          \nNI PXIe-6570<\/strong><\/a>\n<\/td>\n\nSemiconductor digital pattern instrument with per-pin measurement capability.\n<\/td>\n\nIC production testing\n<\/td>\n<\/tr>\n
                          \nNI PXIe-7976<\/strong><\/a>\n<\/td>\n\nFPGA-based PXI Express processing module.\n<\/td>\n\nCustom real-time digital processing\n<\/td>\n<\/tr>\n<\/table>\n

                          Recommended Related Products<\/h3>\n\n\n\n\n\n
                          \nNI PXIe-1095<\/strong><\/a>\n<\/td>\n\nHigh-performance PXI Express chassis for digital test systems.\n<\/td>\n<\/tr>\n
                          \nNI PXIe-8880<\/strong><\/a>\n<\/td>\n\nHigh-performance PXI Express controller for automated testing.\n<\/td>\n<\/tr>\n
                          \nNI PXIe-6570<\/strong><\/a>\n<\/td>\n\nDigital pattern instrument for semiconductor testing.\n<\/td>\n<\/tr>\n
                          \nNI PXIe-7976<\/strong><\/a>\n<\/td>\n\nFPGA module for custom digital processing applications.\n<\/td>\n<\/tr>\n<\/table>\n

                          Why Choose PXIe-6537?<\/h3>\n
                            \n
                          • 32-channel high-speed digital I\/O<\/li>\n
                          • Hardware-timed digital pattern generation<\/li>\n
                          • High-speed digital acquisition capability<\/li>\n
                          • PXI Express high-bandwidth architecture<\/li>\n
                          • NI-HSDIO software support<\/li>\n
                          • Flexible input\/output configuration<\/li>\n
                          • Ideal for semiconductor and electronics testing<\/li>\n
                          • Scalable PXI automated test solution<\/li>\n<\/ul>\n

                            Frequently Asked Questions<\/h3>\n

                            What is PXIe-6537 used for?<\/h4>\n

                            \nThe PXIe-6537 is used for high-speed digital testing, semiconductor validation, digital interface verification, embedded system testing, and automated test applications.\n<\/p>\n

                            How many digital channels does PXIe-6537 provide?<\/h4>\n

                            \nThe PXIe-6537 provides 32 programmable digital I\/O channels for pattern generation and acquisition.\n<\/p>\n

                            Does PXIe-6537 support LabVIEW?<\/h4>\n

                            \nYes. The PXIe-6537 supports NI-HSDIO drivers and integrates with LabVIEW, TestStand, NI MAX, and other NI software environments.\n<\/p>\n

                            \u0417\u0430\u043a\u043b\u044e\u0447\u0435\u043d\u0438\u0435<\/h3>\n

                            \n\u0417\u0435\u043c\u043b\u044f NI PXIe-6537 high-speed digital I\/O module<\/strong> provides a flexible PXI Express platform for digital pattern generation, high-speed acquisition, and automated device testing. With 32 programmable channels, precise hardware timing, NI-HSDIO software support, and PXI Express performance, it is an ideal solution for semiconductor testing, electronics validation, and advanced digital measurement systems.<\/p>","protected":false},"excerpt":{"rendered":"

                            \u0428\u0438\u043d\u043d\u044b\u0439 \u0441\u043e\u0435\u0434\u0438\u043d\u0438\u0442\u0435\u043b\u044c: PXI Express
                            \nSingle-Ended Digital I\/O Channel Current Drive: 32 mA
                            \nDigital I\/O Logic Levels: 2.5 V, 3.3 V, 5 V TTL
                            \n\u041a\u043e\u043b\u0438\u0447\u0435\u0441\u0442\u0432\u043e \u043a\u0430\u043d\u0430\u043b\u043e\u0432 \u0442\u043e\u043b\u044c\u043a\u043e \u0446\u0438\u0444\u0440\u043e\u0432\u043e\u0433\u043e \u0432\u0445\u043e\u0434\u0430: \u2013
                            \nNumber of Digital Output Only Channels: –
                            \n\u041a\u043e\u043b\u0438\u0447\u0435\u0441\u0442\u0432\u043e \u0434\u0432\u0443\u043d\u0430\u043f\u0440\u0430\u0432\u043b\u0435\u043d\u043d\u044b\u0445 \u0446\u0438\u0444\u0440\u043e\u0432\u044b\u0445 \u043a\u0430\u043d\u0430\u043b\u043e\u0432: 32
                            \nDigital Input Voltage Range: -1 V to 6 V
                            \n\u0414\u0438\u0430\u043f\u0430\u0437\u043e\u043d \u0432\u044b\u0445\u043e\u0434\u043d\u043e\u0433\u043e \u043d\u0430\u043f\u0440\u044f\u0436\u0435\u043d\u0438\u044f: \u043e\u0442 0 \u0412 \u0434\u043e 5 \u0412
                            \nMaximum Clock Rate: 50 MHz
                            \n\u0422\u0438\u043f \u0441\u0438\u0433\u043d\u0430\u043b\u0438\u0437\u0430\u0446\u0438\u0438: \u041e\u0434\u043d\u043e\u043f\u043e\u043b\u044e\u0441\u043d\u044b\u0439<\/p>","protected":false},"featured_media":31809,"template":"","meta":{"_acf_changed":false},"product_brand":[18],"product_cat":[667],"product_tag":[],"class_list":["post-29039","product","type-product","status-publish","has-post-thumbnail","product_brand-national-instruments","product_cat-pxi-modules","first","instock","shipping-taxable","purchasable","product-type-simple"],"acf":[],"yoast_head":"\nNI PXIe-6537 PXI Digital I\/O Module 779989-01, In Stock | Project Pricing<\/title>\n<meta name=\"description\" content=\"NI PXIe-6537 is a PXI Express high-speed digital I\/O module featuring 32 bidirectional digital channels, hardware-timed pattern generation, high-speed data transfer, and NI-HSDIO support for automated test applications.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/pxisource.com\/ru\/product\/pxie-6537\/\" \/>\n<meta property=\"og:locale\" content=\"ru_RU\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"PXIe-6537\" \/>\n<meta property=\"og:description\" content=\"NI PXIe-6537 is a PXI Express high-speed digital I\/O module featuring 32 bidirectional digital channels, hardware-timed pattern generation, high-speed data transfer, and NI-HSDIO support for automated test applications.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/pxisource.com\/ru\/product\/pxie-6537\/\" \/>\n<meta property=\"og:site_name\" content=\"PXI Source\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/profile.php?id=61582573040385\" \/>\n<meta property=\"article:modified_time\" content=\"2026-08-05T14:42:05+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/pxisource.com\/wp-content\/uploads\/2026\/04\/PXIe-6537.webp\" \/>\n\t<meta property=\"og:image:width\" content=\"800\" \/>\n\t<meta property=\"og:image:height\" content=\"800\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/webp\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"\u0426\u0435\u043d\u0430\" \/>\n\t<meta name=\"twitter:data1\" content=\"$6,295.00\" \/>\n\t<meta name=\"twitter:label2\" content=\"\u0414\u043e\u0441\u0442\u0443\u043f\u043d\u043e\u0441\u0442\u044c\" \/>\n\t<meta name=\"twitter:data2\" content=\"\u0412 \u043d\u0430\u043b\u0438\u0447\u0438\u0438\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/pxisource.com\\\/product\\\/pxie-6537\\\/\",\"url\":\"https:\\\/\\\/pxisource.com\\\/product\\\/pxie-6537\\\/\",\"name\":\"NI PXIe-6537 PXI Digital I\\\/O Module 779989-01, In Stock | Project Pricing\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/pxisource.com\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/pxisource.com\\\/product\\\/pxie-6537\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/pxisource.com\\\/product\\\/pxie-6537\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/pxisource.com\\\/wp-content\\\/uploads\\\/2026\\\/04\\\/PXIe-6537.webp\",\"datePublished\":\"2025-09-16T06:03:32+00:00\",\"dateModified\":\"2026-08-05T14:42:05+00:00\",\"description\":\"NI PXIe-6537 is a PXI Express high-speed digital I\\\/O module featuring 32 bidirectional digital channels, hardware-timed pattern generation, high-speed data transfer, and NI-HSDIO support for automated test applications.\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/pxisource.com\\\/product\\\/pxie-6537\\\/#breadcrumb\"},\"inLanguage\":\"ru-RU\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/pxisource.com\\\/product\\\/pxie-6537\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"ru-RU\",\"@id\":\"https:\\\/\\\/pxisource.com\\\/product\\\/pxie-6537\\\/#primaryimage\",\"url\":\"https:\\\/\\\/pxisource.com\\\/wp-content\\\/uploads\\\/2026\\\/04\\\/PXIe-6537.webp\",\"contentUrl\":\"https:\\\/\\\/pxisource.com\\\/wp-content\\\/uploads\\\/2026\\\/04\\\/PXIe-6537.webp\",\"width\":800,\"height\":800,\"caption\":\"PXIe-6537\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/pxisource.com\\\/product\\\/pxie-6537\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/pxisource.com\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Shop\",\"item\":\"https:\\\/\\\/pxisource.com\\\/shop\\\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"PXIe-6537\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/pxisource.com\\\/#website\",\"url\":\"https:\\\/\\\/pxisource.com\\\/\",\"name\":\"PXI Systems\",\"description\":\"NI PXI, PXIe Modular Test Instrument Supplier\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/pxisource.com\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"ru-RU\"}]}<\/script>\n<meta property=\"product:brand\" content=\"National Instruments\" \/>\n<meta property=\"product:price:amount\" content=\"6295.00\" \/>\n<meta property=\"product:price:currency\" content=\"USD\" \/>\n<meta property=\"og:availability\" content=\"instock\" \/>\n<meta property=\"product:availability\" content=\"instock\" \/>\n<meta property=\"product:condition\" content=\"new\" \/>\n<!-- \/ Yoast SEO Premium plugin. -->","yoast_head_json":{"title":"NI PXIe-6537 PXI Digital I\/O Module 779989-01, In Stock | Project Pricing","description":"NI PXIe-6537 is a PXI Express high-speed digital I\/O module featuring 32 bidirectional digital channels, hardware-timed pattern generation, high-speed data transfer, and NI-HSDIO support for automated test applications.","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/pxisource.com\/ru\/product\/pxie-6537\/","og_locale":"ru_RU","og_type":"article","og_title":"PXIe-6537","og_description":"NI PXIe-6537 is a PXI Express high-speed digital I\/O module featuring 32 bidirectional digital channels, hardware-timed pattern generation, high-speed data transfer, and NI-HSDIO support for automated test applications.","og_url":"https:\/\/pxisource.com\/ru\/product\/pxie-6537\/","og_site_name":"PXI Source","article_publisher":"https:\/\/www.facebook.com\/profile.php?id=61582573040385","article_modified_time":"2026-08-05T14:42:05+00:00","og_image":[{"width":800,"height":800,"url":"https:\/\/pxisource.com\/wp-content\/uploads\/2026\/04\/PXIe-6537.webp","type":"image\/webp"}],"twitter_card":"summary_large_image","twitter_misc":{"\u0426\u0435\u043d\u0430":"$6,295.00","\u0414\u043e\u0441\u0442\u0443\u043f\u043d\u043e\u0441\u0442\u044c":"\u0412 \u043d\u0430\u043b\u0438\u0447\u0438\u0438"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/pxisource.com\/product\/pxie-6537\/","url":"https:\/\/pxisource.com\/product\/pxie-6537\/","name":"NI PXIe-6537 PXI Digital I\/O Module 779989-01, In Stock | Project Pricing","isPartOf":{"@id":"https:\/\/pxisource.com\/#website"},"primaryImageOfPage":{"@id":"https:\/\/pxisource.com\/product\/pxie-6537\/#primaryimage"},"image":{"@id":"https:\/\/pxisource.com\/product\/pxie-6537\/#primaryimage"},"thumbnailUrl":"https:\/\/pxisource.com\/wp-content\/uploads\/2026\/04\/PXIe-6537.webp","datePublished":"2025-09-16T06:03:32+00:00","dateModified":"2026-08-05T14:42:05+00:00","description":"NI PXIe-6537 is a PXI Express high-speed digital I\/O module featuring 32 bidirectional digital channels, hardware-timed pattern generation, high-speed data transfer, and NI-HSDIO support for automated test applications.","breadcrumb":{"@id":"https:\/\/pxisource.com\/product\/pxie-6537\/#breadcrumb"},"inLanguage":"ru-RU","potentialAction":[{"@type":"ReadAction","target":["https:\/\/pxisource.com\/product\/pxie-6537\/"]}]},{"@type":"ImageObject","inLanguage":"ru-RU","@id":"https:\/\/pxisource.com\/product\/pxie-6537\/#primaryimage","url":"https:\/\/pxisource.com\/wp-content\/uploads\/2026\/04\/PXIe-6537.webp","contentUrl":"https:\/\/pxisource.com\/wp-content\/uploads\/2026\/04\/PXIe-6537.webp","width":800,"height":800,"caption":"PXIe-6537"},{"@type":"BreadcrumbList","@id":"https:\/\/pxisource.com\/product\/pxie-6537\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/pxisource.com\/"},{"@type":"ListItem","position":2,"name":"Shop","item":"https:\/\/pxisource.com\/shop\/"},{"@type":"ListItem","position":3,"name":"PXIe-6537"}]},{"@type":"WebSite","@id":"https:\/\/pxisource.com\/#website","url":"https:\/\/pxisource.com\/","name":"\u0421\u0438\u0441\u0442\u0435\u043c\u044b PXI","description":"NI PXI, PXIe Modular Test Instrument Supplier","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/pxisource.com\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"ru-RU"}]},"product_brand":"National Instruments","product_price_amount":"6295.00","product_price_currency":"USD","og_availability":"instock","product_availability":"instock","product_condition":"new"},"_links":{"self":[{"href":"https:\/\/pxisource.com\/ru\/wp-json\/wp\/v2\/product\/29039","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pxisource.com\/ru\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pxisource.com\/ru\/wp-json\/wp\/v2\/types\/product"}],"version-history":[{"count":7,"href":"https:\/\/pxisource.com\/ru\/wp-json\/wp\/v2\/product\/29039\/revisions"}],"predecessor-version":[{"id":34434,"href":"https:\/\/pxisource.com\/ru\/wp-json\/wp\/v2\/product\/29039\/revisions\/34434"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pxisource.com\/ru\/wp-json\/wp\/v2\/media\/31809"}],"wp:attachment":[{"href":"https:\/\/pxisource.com\/ru\/wp-json\/wp\/v2\/media?parent=29039"}],"wp:term":[{"taxonomy":"product_brand","embeddable":true,"href":"https:\/\/pxisource.com\/ru\/wp-json\/wp\/v2\/product_brand?post=29039"},{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pxisource.com\/ru\/wp-json\/wp\/v2\/product_cat?post=29039"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pxisource.com\/ru\/wp-json\/wp\/v2\/product_tag?post=29039"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}