{"id":29004,"date":"2025-09-16T13:15:25","date_gmt":"2025-09-16T05:15:25","guid":{"rendered":"https:\/\/pxisource.com\/?post_type=product&p=29004"},"modified":"2026-08-05T22:23:33","modified_gmt":"2026-08-05T14:23:33","slug":"pxie-6570","status":"publish","type":"product","link":"https:\/\/pxisource.com\/ru\/product\/pxie-6570\/","title":{"rendered":"PXIe-6570"},"content":{"rendered":"

Product Introduction<\/h3>\n

\n\u0417\u0435\u043c\u043b\u044f NI PXIe-6570<\/strong> is a high-performance digital pattern instrument designed for semiconductor automated test equipment (ATE), IC validation, production testing, and digital device characterization applications. It provides a flexible PXI Express-based platform for generating digital patterns, performing parametric measurements, and validating semiconductor devices.\n<\/p>\n

\nFeaturing 32 high-speed digital channels, per-pin programmable voltage levels, timing control, and hardware-based pattern execution, the PXIe-6570 enables engineers to replace traditional semiconductor testers with a compact and scalable PXI architecture.\n<\/p>\n

Product Overview<\/h3>\n

\n\u0417\u0435\u043c\u043b\u044f PXIe-6570<\/strong> belongs to the NI Semiconductor Test System (STS) and PXI Digital Pattern Instrument family. It combines digital pattern generation, measurement, and device control capabilities in a PXI Express modular instrument.\n<\/p>\n

\nThe module is designed for testing digital semiconductor devices including microcontrollers, processors, memory devices, ASICs, and other integrated circuits. It supports industry-standard digital test workflows and integrates with NI Semiconductor Test solutions for scalable production environments.\n<\/p>\n

\nWith PXI Express high-speed communication, synchronized timing resources, and flexible software support, the PXIe-6570 is suitable for both engineering validation and manufacturing test applications.\n<\/p>\n

Key Features<\/h3>\n

32 High-Speed Digital Channels<\/h4>\n

\nThe PXIe-6570 provides 32 programmable digital channels for semiconductor testing.\n<\/p>\n

    \n
  • 32 digital pattern channels<\/li>\n
  • High-speed digital I\/O<\/li>\n
  • Independent channel control<\/li>\n
  • Parallel device testing<\/li>\n
  • Digital pattern execution<\/li>\n<\/ul>\n

    \nAdvantage:<\/strong> Enables efficient testing of complex digital semiconductor devices.\n<\/p>\n

    Hardware-Timed Digital Pattern Generation<\/h4>\n

    \nThe module provides precise timing control for semiconductor test sequences.\n<\/p>\n

      \n
    • Hardware-based pattern execution<\/li>\n
    • \u0414\u0435\u0442\u0435\u0440\u043c\u0438\u043d\u0438\u0440\u043e\u0432\u0430\u043d\u043d\u043e\u0435 \u0432\u0440\u0435\u043c\u044f<\/li>\n
    • High-speed waveform generation<\/li>\n
    • Programmable timing parameters<\/li>\n
    • Accurate digital stimulation<\/li>\n<\/ul>\n

      \nAdvantage:<\/strong> Provides repeatable and reliable semiconductor test results.\n<\/p>\n

      Per-Pin Parametric Measurement Unit (PPMU)<\/h4>\n

      \nThe PXIe-6570 integrates per-pin measurement capability for device characterization.\n<\/p>\n

        \n
      • Voltage measurement<\/li>\n
      • Current measurement<\/li>\n
      • Programmable drive levels<\/li>\n
      • Threshold adjustment<\/li>\n
      • Digital pin characterization<\/li>\n<\/ul>\n

        \nAdvantage:<\/strong> Allows detailed electrical validation without additional measurement hardware.\n<\/p>\n

        Programmable Digital Voltage Levels<\/h4>\n

        \nThe module supports flexible voltage configuration for different semiconductor technologies.\n<\/p>\n

          \n
        • Programmable output voltage<\/li>\n
        • Adjustable input thresholds<\/li>\n
        • Multiple logic families support<\/li>\n
        • Device interface flexibility<\/li>\n
        • Digital signal validation<\/li>\n<\/ul>\n

          \nAdvantage:<\/strong> Supports testing of various digital IC architectures.\n<\/p>\n

          PXI Express High-Speed Architecture<\/h4>\n

          \nThe PXIe-6570 uses PXI Express technology for advanced semiconductor test systems.\n<\/p>\n

            \n
          • High-bandwidth PXI Express interface<\/li>\n
          • Fast pattern transfer<\/li>\n
          • Multi-instrument synchronization<\/li>\n
          • Shared timing resources<\/li>\n
          • Scalable test architecture<\/li>\n<\/ul>\n

            \nAdvantage:<\/strong> Enables integration with other PXI instruments for complete test solutions.\n<\/p>\n

            Semiconductor Test Software Integration<\/h4>\n

            \nThe PXIe-6570 integrates with NI semiconductor testing software environments.\n<\/p>\n

              \n
            • NI Digital Pattern Driver support<\/li>\n
            • \u0418\u043d\u0442\u0435\u0433\u0440\u0430\u0446\u0438\u044f LabVIEW<\/li>\n
            • TestStand Semiconductor Module compatibility<\/li>\n
            • Digital pattern development tools<\/li>\n
            • Automated production test support<\/li>\n<\/ul>\n

              \nAdvantage:<\/strong> Simplifies development from device validation to production testing.\n<\/p>\n

              Technical Specifications<\/h3>\n\n\n\n\n\n\n\n\n\n\n\n\n
              \u041f\u0430\u0440\u0430\u043c\u0435\u0442\u0440<\/th>\n\u041e\u043f\u0438\u0441\u0430\u043d\u0438\u0435<\/th>\n<\/tr>\n
              Product Type<\/td>\nPXI Express Digital Pattern Instrument<\/td>\n<\/tr>\n
              Digital Channels<\/td>\n32 Channels<\/td>\n<\/tr>\n
              \u041f\u0440\u0438\u043b\u043e\u0436\u0435\u043d\u0438\u0435<\/td>\nSemiconductor Automated Test<\/td>\n<\/tr>\n
              Pattern Generation<\/td>\nHardware-Timed Digital Patterns<\/td>\n<\/tr>\n
              Measurement Capability<\/td>\nPer-Pin Parametric Measurement<\/td>\n<\/tr>\n
              Voltage Levels<\/td>\nProgrammable Digital Levels<\/td>\n<\/tr>\n
              Interface<\/td>\nPXI Express<\/td>\n<\/tr>\n
              \u0421\u0438\u043d\u0445\u0440\u043e\u043d\u0438\u0437\u0430\u0446\u0438\u044f<\/td>\nPXI Timing and Triggering<\/td>\n<\/tr>\n
              \u041f\u043e\u0434\u0434\u0435\u0440\u0436\u043a\u0430 \u043f\u0440\u043e\u0433\u0440\u0430\u043c\u043c\u043d\u043e\u0433\u043e \u043e\u0431\u0435\u0441\u043f\u0435\u0447\u0435\u043d\u0438\u044f<\/td>\nLabVIEW, TestStand, Digital Pattern Tools<\/td>\n<\/tr>\n
              Driver<\/td>\nNI Digital Pattern Driver<\/td>\n<\/tr>\n<\/table>\n

              Software Ecosystem<\/h3>\n

              \nThe PXIe-6570 works with NI semiconductor test software tools for digital device validation and production testing.\n<\/p>\n

                \n
              • \nNI Digital Pattern Driver:<\/strong> Provides digital pattern configuration, execution, and measurement functions.\n<\/li>\n
              • \nLabVIEW:<\/strong> Enables custom semiconductor test application development.\n<\/li>\n
              • \nTestStand Semiconductor Module:<\/strong> Supports automated production test workflows.\n<\/li>\n
              • \nNI STS Software:<\/strong> Provides semiconductor test system integration.\n<\/li>\n
              • \nNI MAX:<\/strong> Supports hardware configuration and diagnostics.\n<\/li>\n<\/ul>\n

                Industries<\/h3>\n
                  \n
                • Semiconductor Manufacturing<\/li>\n
                • Integrated Circuit Testing<\/li>\n
                • Automotive Electronics<\/li>\n
                • Consumer Electronics<\/li>\n
                • Aerospace and Defense Electronics<\/li>\n
                • Embedded System Development<\/li>\n
                • Research and Development<\/li>\n
                • Automated Test Equipment<\/li>\n<\/ul>\n

                  Applications<\/h3>\n

                  IC Functional Testing<\/h4>\n

                  \nThe PXIe-6570 provides digital pattern testing for semiconductor devices.\n<\/p>\n

                    \n
                  • Microcontroller testing<\/li>\n
                  • ASIC validation<\/li>\n
                  • Digital IC verification<\/li>\n
                  • Device characterization<\/li>\n<\/ul>\n

                    Production Semiconductor Test<\/h4>\n

                    \nThe module supports scalable manufacturing test solutions.\n<\/p>\n

                      \n
                    • High-volume production testing<\/li>\n
                    • Automated device testing<\/li>\n
                    • Yield improvement<\/li>\n
                    • Quality verification<\/li>\n<\/ul>\n

                      Engineering Validation<\/h4>\n

                      \nThe PXIe-6570 enables engineers to validate new semiconductor designs.\n<\/p>\n

                        \n
                      • Prototype testing<\/li>\n
                      • Debug analysis<\/li>\n
                      • Electrical characterization<\/li>\n
                      • Design verification<\/li>\n<\/ul>\n

                        Embedded Device Testing<\/h4>\n

                        \nThe module supports testing of digital embedded components.\n<\/p>\n

                          \n
                        • Processor testing<\/li>\n
                        • Memory validation<\/li>\n
                        • Communication IC testing<\/li>\n
                        • Digital interface verification<\/li>\n<\/ul>\n

                          Comparison with Similar Products<\/h3>\n\n\n\n\n\n\n
                          \u041c\u043e\u0434\u0435\u043b\u044c<\/th>\n\u041e\u0441\u043d\u043e\u0432\u043d\u043e\u0435 \u0440\u0430\u0437\u043b\u0438\u0447\u0438\u0435<\/th>\nBest Application<\/th>\n<\/tr>\n
                          \nNI PXIe-6570<\/strong><\/a>\n<\/td>\n\n32-channel PXI Express digital pattern instrument for semiconductor testing.\n<\/td>\n\nDigital IC validation and production test\n<\/td>\n<\/tr>\n
                          \nNI PXIe-6571<\/strong><\/a>\n<\/td>\n\nDigital pattern instrument with different channel configuration and performance.\n<\/td>\n\nAdvanced semiconductor testing\n<\/td>\n<\/tr>\n
                          \n\u041d\u0418 PXIe-6545<\/strong><\/a>\n<\/td>\n\nHigh-speed digital waveform generator\/analyzer for digital applications.\n<\/td>\n\nDigital signal analysis\n<\/td>\n<\/tr>\n
                          \nNI PXIe-5164<\/strong><\/a>\n<\/td>\n\nHigh-speed digitizer for analog waveform measurement.\n<\/td>\n\nAnalog signal testing\n<\/td>\n<\/tr>\n<\/table>\n

                          Recommended Related Products<\/h3>\n\n\n\n\n\n
                          \nNI PXIe-1095<\/strong><\/a>\n<\/td>\n\nHigh-performance PXI Express chassis for semiconductor test systems.\n<\/td>\n<\/tr>\n
                          \nNI PXIe-8880<\/strong><\/a>\n<\/td>\n\nHigh-performance PXI Express controller for automated testing.\n<\/td>\n<\/tr>\n
                          \nNI PXIe-6571<\/strong><\/a>\n<\/td>\n\nDigital pattern instrument for semiconductor applications.\n<\/td>\n<\/tr>\n
                          \nNI PXIe-4082<\/strong><\/a>\n<\/td>\n\nPrecision measurement module for electronic validation systems.\n<\/td>\n<\/tr>\n<\/table>\n

                          Why Choose PXIe-6570?<\/h3>\n
                            \n
                          • 32-channel semiconductor digital pattern testing<\/li>\n
                          • Per-pin parametric measurement capability<\/li>\n
                          • Hardware-timed digital pattern execution<\/li>\n
                          • Programmable voltage levels<\/li>\n
                          • PXI Express high-speed architecture<\/li>\n
                          • NI semiconductor test software support<\/li>\n
                          • Suitable for IC validation and production testing<\/li>\n
                          • Scalable PXI-based ATE solution<\/li>\n<\/ul>\n

                            Frequently Asked Questions<\/h3>\n

                            What is PXIe-6570 used for?<\/h4>\n

                            \nThe PXIe-6570 is used for semiconductor automated testing, digital IC validation, device characterization, and production test applications.\n<\/p>\n

                            How many channels does PXIe-6570 provide?<\/h4>\n

                            \nThe PXIe-6570 provides 32 programmable digital pattern channels for semiconductor testing.\n<\/p>\n

                            Does PXIe-6570 support TestStand?<\/h4>\n

                            \nYes. The PXIe-6570 integrates with NI TestStand Semiconductor Module and NI digital pattern software for automated test development.\n<\/p>\n

                            \u0417\u0430\u043a\u043b\u044e\u0447\u0435\u043d\u0438\u0435<\/h3>\n

                            \n\u0417\u0435\u043c\u043b\u044f NI PXIe-6570 digital pattern instrument<\/strong> provides a scalable PXI Express solution for semiconductor testing, combining digital pattern generation, per-pin measurement, programmable voltage levels, and high-speed synchronization. It is an ideal platform for IC validation, production testing, and advanced automated test equipment applications.<\/p>","protected":false},"excerpt":{"rendered":"

                            \u041c\u0430\u043a\u0441\u0438\u043c\u0430\u043b\u044c\u043d\u0430\u044f \u0430\u043a\u0442\u0438\u0432\u043d\u0430\u044f \u043d\u0430\u0433\u0440\u0443\u0437\u043a\u0430: 24 \u043c\u0410
                            \nModule Width: 2
                            \n\u041a\u043e\u043b\u0438\u0447\u0435\u0441\u0442\u0432\u043e \u0434\u0432\u0443\u043d\u0430\u043f\u0440\u0430\u0432\u043b\u0435\u043d\u043d\u044b\u0445 \u0446\u0438\u0444\u0440\u043e\u0432\u044b\u0445 \u043a\u0430\u043d\u0430\u043b\u043e\u0432: 32<\/p>","protected":false},"featured_media":31815,"template":"","meta":{"_acf_changed":false},"product_brand":[18],"product_cat":[667],"product_tag":[],"class_list":["post-29004","product","type-product","status-publish","has-post-thumbnail","product_brand-national-instruments","product_cat-pxi-modules","first","instock","shipping-taxable","purchasable","product-type-simple"],"acf":[],"yoast_head":"\nNI PXIe-6570 PXI Digital Pattern Instrument 785283-01, In Stock | Project Pricing<\/title>\n<meta name=\"description\" content=\"NI PXIe-6570 is a high-speed PXI Express digital pattern instrument featuring 32 digital channels, per-pin parametric measurement, hardware-timed pattern generation, and semiconductor ATE 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